IP Library Granted Patent US 8,772,810
Granted Patent B2
US 8,772,810 · App. 13/601,487 · Granted Jul 8, 2014

Semiconductor light emitting device and method for manufacturing the same

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Quick Facts
Patent No.
US 8,772,810
App. No.
13/601,487
Granted
Jul 8, 2014
Kind
B2
Abstract

According to one embodiment, a semiconductor light emitting device includes: a semiconductor layer including a first face, a second face, a side face, and a light emitting layer; a p-side electrode provided on the second face; an n-side electrode provided on the side face; a first p-side metal layer provided on the p-side electrode; a first n-side metal layer provided on the periphery of the n-side electrode; a first insulating layer provided on a face on the second face side in the first n-side metal layer; a second p-side metal layer connected with the first p-side metal layer on the first p-side metal layer, and provided, extending from on the first p-side metal layer to on the first insulating layer; and a second n-side metal layer provided on a face on the second face side in the first n-side metal layer in a peripheral region of the semiconductor layer.

Claims (29)

1. A semiconductor light emitting device, comprising:

a semiconductor layer including a first face, a second face opposite to the first face, a side face, and a light emitting layer;

a p-side electrode provided on the second face;

an n-side electrode provided on the side face;

a first p-side metal layer provided on the p-side electrode and connected electrically with the p-side electrode;

a first n-side metal layer provided in a region peripheral to the semiconductor layer and connected electrically with the n-side electrode, the first n-side metal layer having a first portion and a second portion that are at opposite sides of the first p-side metal layer;

a first insulating layer provided on the first portion of the first n-side metal layer;

a second p-side metal layer provided on the first p-side metal layer and connected electrically with the first p-side metal layer, the second p-side metal layer overlapping the first portion of the first n-side metal layer via the first insulating layer in a direction perpendicular to the first face; and

a second n-side metal layer provided on the second portion of the first n-side metal layer, the second n-side metal layer connected electrically to the first n-side metal layer.

2. The device according to claim 1 , further comprising:

a third p-side metal layer provided on the second p-side metal layer and being thicker than the second p-side metal layer; and

a third n-side metal layer provided on the second n-side metal layer and being thicker than the second n-side metal layer.

3. The device according to claim 2 , further comprising a second insulating layer provided on a side face of the third p-side metal layer and a side face of the third n-side metal layer.

4. The device according to claim 1 , further comprising a phosphor layer provided on the first face.

5. The device according to claim 4 , wherein the phosphor layer extends into the region peripheral to the semiconductor layer.

6. The device according to claim 4 , wherein a part of the n-side electrode protrudes from the side face beyond the first face, and surrounds a periphery of the phosphor layer on the first face.

7. The device according to claim 6 , wherein the first n-side metal layer connected electrically with the n-side electrode is also provided on a periphery of the part of the n-side electrode.

8. The device according to claim 1 , wherein the first p-side metal layer covers the whole region of a light emitting region including the light emitting layer.

9. The device according to claim 1 , wherein:

the device includes a plurality of the semiconductor layers separated from each other; and

the n-side electrodes provided on the side faces between the plurality of semiconductor layers are connected electrically with each other.

10. The device according to claim 9 , wherein the first n-side metal layer is provided between adjacent side faces of the plurality of semiconductor layers.

11. The device according to claim 10 , wherein the first n-side metal layer surrounds continuously a periphery of each of the semiconductor layers.

12. The device according to claim 9 , wherein a surface of the n-side electrode provided between adjacent side faces of the plurality of semiconductor layers is covered with an insulating film and, on the insulating film, the first p-side metal layer is provided.

13. The device according to claim 9 , wherein the first p-side metal layer is provided continuously between the plurality of semiconductor layers.

14. The device according to claim 9 , wherein the second p-side metal layer is provided continuously between the plurality of semiconductor layers.

15. The device according to claim 1 , further comprising a varistor provided between the first n-side metal layer and the second p-side metal layer in the peripheral region, the varistor having a first electrode connected electrically with the first n-side metal layer and a second electrode connected electrically with the second p-side metal layer.

16. The device according to claim 1 , wherein the first n-side metal layer surrounds continuously a periphery of the n-side electrode.

17. The device according to claim 1 , wherein the first n-side metal layer is thicker than the semiconductor layer.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 30, 2018
From: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 046986/0159 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 046364/0164 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 19, 2012
From: SUGIZAKI, YOSHIAKI; KOJIMA, AKIHIRO; FURUYAMA, HIDETO; AKIMOTO, YOSUKE
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 029324/0651 →