Manufacturing method of oxide semiconductor device
The contact resistance between an oxide semiconductor film and a metal film is reduced. A transistor that uses an oxide semiconductor film and has excellent on-state characteristics is provided. A semiconductor device capable of high-speed operation is provided. In a transistor that uses an oxide semiconductor film, the oxide semiconductor film is subjected to nitrogen plasma treatment. Thus, part of oxygen included in the oxide semiconductor film is replaced with nitrogen, so that an oxynitride region is formed. A metal film is formed in contact with the oxynitride region. The oxynitride region has lower resistance than the other region of the oxide semiconductor film. In addition, the oxynitride region is unlikely to form high-resistance metal oxide at the interface with the contacting metal film.
1. A manufacturing method of a semiconductor device, comprising the steps of:
forming an oxide semiconductor film on an insulating surface;
forming a gate insulating film over the oxide semiconductor film;
forming a gate electrode over the gate insulating film;
forming an interlayer insulating film covering the oxide semiconductor film, the gate insulating film, and the gate electrode;
forming an opening in the interlayer insulating film reaching the oxide semiconductor film;
performing nitrogen plasma treatment on the oxide semiconductor film through the opening in the interlayer insulating film; and
forming a metal film in the opening and over the interlayer insulating film.
2. The manufacturing method of the semiconductor device according to claim 1 , wherein the nitrogen plasma treatment is microwave discharge nitrogen plasma treatment.
3. The manufacturing method of the semiconductor device according to claim 1 , wherein the oxide semiconductor film comprises a crystalline region having a c-axis aligned in a direction perpendicular to a surface of the oxide semiconductor film.
4. The manufacturing method of the semiconductor device according to claim 1 , wherein the oxide semiconductor film comprises at least one element selected from In, Ga, Sn, and Zn.
5. The manufacturing method of the semiconductor device according to claim 1 , wherein the nitrogen plasma treatment is performed at a temperature of 300° C. or higher.
6. The manufacturing method of the semiconductor device according to claim 1 , further comprising the step of reducing a resistance of part of the oxide semiconductor film to form a low-resistance region after the step of forming the gate electrode.
7. The manufacturing method of the semiconductor device according to claim 6 , wherein the low-resistance region comprises at least one kind of element selected from hydrogen, helium, boron, nitrogen, fluorine, neon, aluminum, phosphorus, argon, arsenic, krypton, indium, tin, antimony, and xenon.
8. The manufacturing method of the semiconductor device according to claim 6 , wherein a sheet resistance in the low-resistance region is reduced to be 30 kΩ/sq or less.
9. A manufacturing method of a semiconductor device, comprising the steps of:
forming a source electrode and a drain electrode on an insulating surface;
forming an oxide semiconductor film over the source electrode and the drain electrode;
forming a gate insulating film over the oxide semiconductor film;
forming a gate electrode over the gate insulating film;
reducing a resistance of part of the oxide semiconductor film to form a low-resistance region;
forming an interlayer insulating film covering the oxide semiconductor film, the gate insulating film, and the gate electrode;
forming an opening in the interlayer insulating film reaching the oxide semiconductor film;
performing nitrogen plasma treatment on the oxide semiconductor film through the opening in the interlayer insulating film; and
forming a metal film in the opening and over the interlayer insulating film.
10. The manufacturing method of the semiconductor device according to claim 9 , wherein the nitrogen plasma treatment is microwave discharge nitrogen plasma treatment.
11. The manufacturing method of the semiconductor device according to claim 9 , wherein the oxide semiconductor film comprises a crystalline region having a c-axis aligned in a direction perpendicular to a surface of the oxide semiconductor film.
12. The manufacturing method of the semiconductor device according to claim 9 , wherein the oxide semiconductor film comprises at least one element selected from In, Ga, Sn, and Zn.
13. The manufacturing method of the semiconductor device according to claim 9 , wherein the low-resistance region comprises at least one kind of element selected from hydrogen, helium, boron, nitrogen, fluorine, neon, aluminum, phosphorus, argon, arsenic, krypton, indium, tin, antimony, and xenon.
14. The manufacturing method of the semiconductor device according to claim 9 , wherein a sheet resistance in the low-resistance region is reduced to be 30 kΩ/sq or less.
15. The manufacturing method of the semiconductor device according to claim 9 , wherein the nitrogen plasma treatment is performed at a temperature of 300° C. or higher.
16. The manufacturing method of the semiconductor device according to claim 9 , wherein the source electrode and the drain electrode are formed by planarizing a conductive film on an insulating film with depressions so that the source electrode and the drain electrode are formed in the depressions.