Semiconductor memory device
According to one embodiment, a semiconductor memory device includes a memory cell array including memory cells, word lines connected to the memory cell array to select rows of the memory cell array, first bit lines connected to the memory cell array to select columns of the memory cell array, a replica cell array including replica cells respectively connected to the word lines, and storing information on characteristics of the rows of the memory cell array, and a second bit line connected to the replica cells. An operation is changed for each row of the memory cell array based on the information in the replica cells.
1. A semiconductor memory device comprising:
a memory cell array including memory cells;
word lines connected to the memory cell array to select rows of the memory cell array;
first bit lines connected to the memory cell array to select columns of the memory cell array;
a replica cell array including replica cells respectively connected to the word lines, and storing information on characteristics of the rows of the memory cell array; and
a second bit line connected to the replica cells,
wherein an operation is changed for each row of the memory cell array based on the information in the replica cells.
2. The device of claim 1 , wherein the information to be stored in the replica cells is information for controlling a cell current.
3. The device of claim 1 , wherein
the replica cell array includes columns equal in number to column addresses, and
replica cells in a column corresponding to a column address are used in a read.
4. The device of claim 3 , wherein
the memory cell array includes groups,
each of the groups includes columns equal in number to the column addresses, and
data is read from a memory cell in a column corresponding to a column address in a read.
5. The device of claim 1 , further comprising:
a logic gate configured to perform a logic operation on data read from the memory cell array to the first bit lines; and
a write circuit configured to write data to the replica cells based on an output from the logic gate.
6. The device of claim 1 , further comprising a power supply circuit configured to supply power to the memory cell array, and to change the level of the power in accordance with a voltage of the second bit line.
7. The device of claim 1 , further comprising:
a row decoder connected to the word lines; and
a power supply circuit configured to supply power to the row decoder,
wherein the power supply circuit changes the level of the power in accordance with a voltage of the second bit line.
8. The device of claim 1 , wherein the replica cell has the same arrangement as that of the memory cell.
9. The device of claim 1 , wherein the memory cell comprises an SRAM cell.
10. A semiconductor memory device comprising:
a memory cell array including memory cells;
word lines connected to the memory cell array to select rows of the memory cell array;
first bit lines connected to the memory cell array to select columns of the memory cell array;
a replica cell array including first replica cells respectively connected to the word lines, and storing information on operating speeds of the rows of the memory cell array;
a second bit line connected to the first replica cells;
a second replica cell having fixed data;
a replica bit line connected to the second replica cell and the second bit line; and
sense amplifiers respectively connected to the first bit lines, and configured to be activated based on a voltage of the replica bit line.
11. The device of claim 10 , wherein
the replica cell array includes columns equal in number to column addresses, and
first replica cells in a column corresponding to a column address is used in a read.
12. The device of claim 11 , wherein
the memory cell array includes groups,
each of the groups includes columns equal in number to the column addresses, and
data is read from a memory cell in a column corresponding to a column address in a read.
13. The device of claim 10 , further comprising:
a logic gate configured to perform a logic operation on data read from the memory cell array to the first bit lines; and
a write circuit configured to write data to the first replica cells based on an output from the logic gate.
14. The device of claim 10 , further comprising a row decoder connected to the word lines,
wherein the row decoder negates a word line based on a voltage of the replica bit line.
15. The device of claim 10 , further comprising a replica word line connected to the second replica cell,
wherein the replica word line is asserted simultaneously with a selected word line in a read.
16. The device of claim 10 , wherein the first replica cell has the same arrangement as that of the memory cell.
17. The device of claim 10 , wherein the memory cell comprises an SRAM cell.