IP Library Granted Patent US 8,673,767
Granted Patent B2
US 8,673,767 · App. 13/624,324 · Granted Mar 18, 2014

Manufacturing method for semiconductor device

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Quick Facts
Patent No.
US 8,673,767
App. No.
13/624,324
Granted
Mar 18, 2014
Kind
B2
Abstract

A semiconductor device includes: a semiconductor substrate including a first face and a second face on a side opposite to the first face; an external connection terminal formed on the first face of the semiconductor substrate; a first electrode formed on the first face of the semiconductor substrate and electrically connected to the external connection terminal; an electronic element formed on or above the second face of the semiconductor substrate; a second electrode electrically connected to the electronic element and having a top face and a rear face; a groove portion formed on the second face of the semiconductor substrate and having a bottom face including at least part of the rear face of the second electrode; and a conductive portion formed in the groove portion and electrically connected to the rear face of the second electrode.

Claims (14)

1. A manufacturing method for a semiconductor device, comprising:

forming a first electrode on a first face of a semiconductor substrate, the semiconductor substrate having a second face on a side opposite to the first face;

forming a second electrode having a top face and a rear face on the first face of the semiconductor substrate;

forming a through hole in the semiconductor substrate;

forming, in the through hole, a conductive portion having an end face electrically connected to the rear face of the second electrode;

forming, on the first face of the semiconductor substrate, an external connection terminal electrically connected to the first electrode; and

forming an insulating film on a side wall of the through hole.

2. The manufacturing method for a semiconductor device according to claim 1 , wherein the end face of the conductive portion is directly connected to the rear face of the second electrode.

3. The manufacturing method for a semiconductor device according to claim 1 , further comprising:

forming an insulating layer between the semiconductor substrate and the external connection terminal; and

forming on the first face of the semiconductor substrate an interconnection electrically connected to the first electrode and the external connection terminal.

4. The manufacturing method for a semiconductor device according to claim 1 , further comprising:

forming, on the second face of the semiconductor substrate, a connection electrode electrically connected to the conductive portion, wherein

the connection electrode and the conductive portion are formed in one operation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2017
From: SEIKO EPSON CORPORATION
To: ADVANCED INTERCONNECT SYSTEMS LIMITED
Reel/Frame 044938/0869 →