IP Library Granted Patent US 9,054,497
Granted Patent B2
US 9,054,497 · App. 13/624,330 · Granted Jun 9, 2015

Quantum cascade lasers with improved performance using interface roughness scattering

Inventors: Claire Gmachl (Princeton, NJ); YenTing Chiu (Princeton, NJ); Yamac Dikmelik (Baltimore, MD); Jacob B. Khurgin (Baltimore, MD)
Assignees: The Trustees of Princeton University; The Johns Hopkins University
H01S5/2231H01S5/2004H01S5/3402H01S5/3401H01S5/32316
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,054,497
App. No.
13/624,330
Granted
Jun 9, 2015
Kind
B2
Abstract

A quantum cascade laser and method of making are disclosed. The quantum cascade laser includes a plurality stages configured in a cascade structure, each stage having a quantum well emission layer and an injection layer, each stage having an upper laser level and a lower laser level. A scattering barrier is located in the quantum well emission layer, the scattering barrier being positioned such that interface roughness (IFR) scattering at the lower laser level is greater than IFR scattering at the upper laser level. The scattering barrier may be located to maximize IFR scattering for the lower laser level and/or minimize IFR scattering for the upper laser level.

Claims (22)

1. A quantum cascade laser comprising:

a plurality stages configured in a cascade structure, each stage having a quantum well emission layer and an injection layer, each stage having an upper laser level and a lower laser level; and

a scattering barrier located in the quantum well emission layer, the scattering barrier being positioned such that interface roughness (IFR) scattering at the lower laser level is greater than IFR scattering at the upper laser level, the scattering barrier being located to maximize IFR scattering for the lower laser level.

2. The quantum cascade laser of claim 1 , wherein the scattering barrier located to minimize IFR scattering for the upper laser level.

3. The quantum cascade laser of claim 1 , wherein the scattering barrier is located to maximize IFR scattering for the lower laser level and minimize scattering for the upper laser level.

4. The quantum cascade laser of claim 1 , wherein the quantum well emission layer is dimensioned with a spacing between the energy levels larger than LO-phonon spacing.

5. The quantum cascade laser of claim 1 , wherein scattering barrier has a thickness configured to set laser parameters.

6. The quantum cascade laser of claim 1 , wherein each stage is configured with a plurality of quantum wells.

7. The quantum cascade laser of claim 1 , wherein the quantum well emission layer has two quantum wells, each quantum well having a scattering barrier positioned such that IFR scattering at the lower laser level is greater than IFR scattering at the upper laser level.

8. The quantum cascade laser of claim 1 , wherein the scattering barrier has an interface roughness configured to increase laser performance.

9. The quantum cascade laser of claim 8 , wherein the interface roughness is modified using growth interrupts.

10. A method of making a quantum cascade laser, the method comprising:

forming a plurality stages configured in a cascade structure, each stage having a quantum well emission layer and an injection layer, each stage having an upper laser level and a lower laser level; and

forming a scattering barrier located in the quantum well emission layer, the scattering barrier being positioned such that interface roughness (IFR) scattering at the lower laser level is greater than IFR scattering at the upper laser level, the scattering barrier being located to maximize IFR scattering for the lower laser level.

11. The method of claim 10 , further comprising locating the scattering barrier to minimize IFR scattering for the upper laser level.

12. The method of claim 10 , further comprising locating the scattering barrier to maximize IFR scattering for the lower laser level and minimize scattering for the upper laser level.

13. The method of claim 10 , further comprising dimensioning the quantum well emission layer with a spacing between the energy levels larger than LO-phonon spacing.

14. The method of claim 10 , wherein scattering barrier has a thickness configured to set laser parameters.

15. The method of claim 10 , wherein each stage is configured with a plurality of quantum wells.

16. The method of claim 10 , further comprising forming the quantum well emission layer with two quantum wells, each quantum well having a scattering barrier positioned such that IFR scattering at the lower laser level is greater than IFR scattering at the upper laser level.

17. The method of claim 10 , further comprising forming the scattering barrier with an interface roughness configured to increase laser performance.

18. The method of claim 17 , further comprising forming the scattering barrier using growth interrupts.

Assignments (3)
CONFIRMATORY LICENSE Recorded Jun 15, 2015
From: PRINCETON UNIVERSITY
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 035905/0515 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2014
From: GMACHL, CLAIRE; CHIU, YENTING
To: THE TRUSTEES OF PRINCETON UNIVERSITY
Reel/Frame 032684/0842 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2014
From: DIKMELIK, YAMAC; KHURGIN, JACOB B
To: THE JOHN HOPKINS UNIVERSITY
Reel/Frame 032684/0946 →
Continuity (2)
Provisional Application 61537409 · Sep 21, 2011
Related Publication 20150131689A1 · May 14, 2015