IP Library Granted Patent US 9,417,457
Granted Patent B2
US 9,417,457 · App. 13/640,453 · Granted Aug 16, 2016

Optical eigenmode imaging

Inventors: Kishan Dholakia (Fife, GB); Jorg Baumgartl (Fife, GB); Michael Mazilu (Fife, GB); Anna Chiara De Luca (Fife, GB)
Assignee: UNIVERSITY COURT OF THE UNIVERSITY OF ST ANDREWS
G02B27/58G02B2207/125
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Quick Facts
Patent No.
US 9,417,457
App. No.
13/640,453
Granted
Aug 16, 2016
Kind
B2
Abstract

A method of optimising at least one measure that is a quadratic function of a wavefunction, such as the spot size of a laser, the method comprising: superimposing a plurality of wavefunctions; determining a relationship between the superimposed wavefunctions and the quadratic measure, and using the determined relationship to identify the superimposed wavefunctions that provide a desired or optimised quadratic measure.

Claims (66)

1. A method of optimizing in an optical system that has a laser, at least one optical measure of an optical output from the laser that is a quadratic function of a wavefunction, the method comprising:

superimposing a plurality of wavefunctions;

determining a relationship between the superimposed wavefunctions and the quadratic measure;

identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and

generating, using the laser, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure.

2. A method as claimed in claim 1 wherein each superposition of wavefunctions has an amplitude and/or phase, and the method involves using the amplitude and/or phase to determine a relationship or function between superimposed wavefunctions and the quadratic measure.

3. A method as claimed in claim 2 wherein the relationship or function is a linear relationship or function of the wavefunction.

4. A method as claimed in claim 3 , wherein the linear relationship is decomposed or transformed to be represented by a series of eigenvectors/eigenvalues.

5. A method as claimed in claim 4 , wherein the optimized or desired measure is selected by choosing the maximum or minimum magnitude eigenvalue.

6. A method as claimed in claim 3 wherein the linear function is a linear operator of the wavefunction.

7. A method as claimed in claim 6 wherein the linear operator comprises a square matrix where each element is given by the quadratic measure corresponding to all the superpostions of the wavefunctions considered, to form a n by n matrix where n is the number of wavefunctions considered.

8. A method as claimed in claim 1 where constraints and/or symmetries are applied.

9. A method as claimed in claim 8 wherein one parameter is constrained to be constant and another optimized within that constraint.

10. A method as claimed in claim 9 , wherein intensity is constrained to be constant and spot size is minimized within that constraint.

11. A method as claimed in claim 1 comprising defining a region of interest and determining the relationship between the superimposed wavefunctions and the quadratic measure within the region of interest.

12. A method as claimed in claim 11 wherein the region of interest is user defined.

13. A method as claimed in claim 1 wherein the quadratic measure is selected from: spot size; energy; intensity; power; momentum; circular spin.

14. A method as claimed in claim 1 wherein the wavefunctions are orthogonal.

15. A method as claimed in claim 1 wherein the wavefunctions are electromagnetic wavefunctions.

16. A method as claimed in claim 1 wherein the method is carried out computationally to identify the superimposed wavefunctions that provide a desired or optimized quadratic measure.

17. A method as claimed in claim 1 wherein the method is carried out experimentally to identify the superimposed wavefunctions that provide a desired or optimized quadratic measure.

18. A computer program product for optimizing in an optical system that has a laser, located on a non-transitory computer readable medium comprising instructions for operation by a computing device, said instructions comprising:

instructions configured for superimposing a plurality of wavefunctions;

instructions configured for determining a relationship between the superimposed wavefunctions and the quadratic measure;

instructions configured for identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and

instructions configured for generating, using a laser, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure.

19. A device adapted to cause superposition of a plurality of wavefunctions, so as to optimize a quadratic measure, the plurality of wavefunctions being determined using the following operations by said device:

superimposing a plurality of wavefunctions;

determining a relationship between the superimposed wavefunctions and the quadratic measure;

identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and

generating, using a laser, the identified superimposed wavefunctions that provide the desired or optimized quadratic optical measure.

20. A device as claimed in claim 19 comprising a diffractive optical element adapted to create the optimized plurality of wavefunctions.

21. A device as claimed in claim 19 adapted to create a sub-diffraction limit spot size.

22. A method for forming an image in an optical system that has a laser, the method comprising:

illuminating a target with a plurality of wavefunctions;

capturing light that has interacted with the target;

decomposing the captured light into a plurality of wavefunctions that together describe the target;

determining a relationship between the superimposed wavefunctions and a quadratic measure;

identifying the superimposed wavefunctions that provide a desired or optimized quadratic optical measure using the determined relationship; and

using the identified superimposed wavefunctions to create an image of the target.

23. A method as claimed in claim 22 wherein the light captured is transmitted through or reflected from or scattered from the target.

24. A method as claimed in claim 22 , wherein the wavefunctions are electromagnetic wavefunctions.

25. A computer-implemented method of optimizing a spot size of an optical beam, the method comprising:

superimposing a plurality of wavefunctions;

determining, using a computer processor, a relationship between the superimposed wavefunctions and the spot size;

identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized spot size using the determined relationship; and

generating, using a laser, the identified superimposed wavefunctions that provide the desired or optimized spot size.

26. The computer-implemented method as claimed in claim 25 , wherein the optimized spot size is below a diffraction limit.

27. The computer-implemented method as claimed in claim 25 , wherein the optimized spot size is a focal point spot size and the focal point spot size is below a diffraction limit.

28. A computer-implemented method of optimizing, in an optical trapping system, at least one measure that is a quadratic function of a wavefunction, the method comprising:

superimposing a plurality of wavefunctions;

determining, using a computer processor, a relationship between the superimposed wavefunctions and the quadratic measure;

identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized quadratic using the determined relationship; and

generating, using a laser, an optical trap for trapping at least one particle, wherein the optical trap generates the identified superimposed wavefunctions that provide the desired or optimized quadratic measure.

29. A device adapted to optimizing a spot size of an optical beam using the following operations:

superimposing a plurality of wavefunctions;

determining, using a computer processor, a relationship between the superimposed wavefunctions and the spot size;

identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized spot size using the determined relationship; and

generating, using a laser, the identified superimposed wavefunctions that provide the desired or optimized spot size.

30. A device as claimed in claim 29 , wherein the optimized spot size is below a diffraction limit.

31. A device as claimed in claim 29 , wherein the optimized spot size is a focal point spot size and the focal point spot size is below a diffraction limit.

32. A device for optimizing, in an optical trapping system, at least one measure that is a quadratic function of a wavefunction using the following operations:

superimposing a plurality of wavefunctions;

determining, using a computer processor, a relationship between the superimposed wavefunctions and the quadratic measure;

identifying, using a computer processor, the superimposed wavefunctions that provide a desired or optimized quadratic using the determined relationship; and

generating, using a laser, an optical trap for trapping at least one particle, wherein the optical trap generates the identified superimposed wavefunctions that provide the desired or optimized quadratic measure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 7, 2013
From: DHOLAKIA, KISHAN; MAZILU, MICHAEL; BAUMGARTL, JORG; DE LUCA, ANNA CHIARA
To: UNIVERSITY COURT OF THE UNIVERSITY OF ST ANDREWS
Reel/Frame 029944/0337 →
Continuity (1)
Related Publication 20130173194A1 · Jul 4, 2013