Device for the contactless and nondestructive testing of surfaces
A device for the contactless and nondestructive testing of a surface by measuring the infrared radiation thereof has one or more incoherent electromagnetic radiation sources ( 1 ) and a detector ( 14 ) arranged on a detection axis ( 9 ), wherein the radiation sources ( 1 ) are arranged at a radial distance from the detection axis ( 9 ), at a distance from a testing area ( 7 ). In this arrangement, a pulsed or intensity-modulated excitation radiation ( 2 ) can be generated by these radiation sources ( 1 ) and applied to the surface ( 6 ) to be tested in the testing area ( 7 ) at an inclination to the detection axis ( 9 ) in the testing area ( 7 ). The detection radiation emitted by a measuring area ( 8 ) of the surface ( 6 ) to be tested can be fed to the detector ( 14 ), wherein the detector ( 14 ) is arranged on the detection axis ( 9 ) further away spatially from the testing area ( 7 ) than the radiation sources ( 1 ). Furthermore, an imaging device ( 10, 12 ) is provided on the detection axis ( 9 ) for creating an image of the testing area ( 7 ) on the measuring area of the detector ( 14 ) that is arranged between the radiation sources ( 1 ).
1. A device for the contactless and non-destructive testing of a test surface by measuring the infrared radiation thereof, comprising:
one or more incoherent electromagnetic radiation sources;
a detector providing and arranged on a detection axis and comprising a measuring area;
a testing area defining an area to be measured of the test surface; and
an imaging device arranged on the detection axis for mapping the testing area onto the measuring area of the detector,
wherein the radiation sources are arranged at a radial distance from the detection axis at a distance from the testing area,
wherein these radiation sources are adapted to generate a pulse-like or intensity-modulated excitation radiation which can be directed onto the surface to be tested in the testing area,
wherein, in response to radiation impinging onto the surface to be tested in the testing area, detection radiation is emitted by the measuring area of the surface to be tested and fed to the detector,
wherein the excitation radiation from the radiation sources is fed to the testing area at an inclination to the detection axis,
wherein the detector on the detection axis is arranged spatially further away from the testing area than the radiation sources,
wherein the imaging device is arranged between the radiation sources, and
wherein a reflection device is provided which comprises reflection surfaces that comprise a truncated-cone-shaped structure which comprises an opening narrowing towards the testing area and determining the testing area.
2. The device according to claim 1 , wherein the opening determining the testing area comprises an aperture of between 0.1 and 10 centimeters.
3. The device according to claim 1 , wherein the imaging device directs the detection radiation passing through the opening of the reflection device and emitted by the testing area to the detector in the measuring area defined by the imaging device.
4. The device according to claim 1 , wherein the imaging device comprises a collecting lens which collects the detection radiation emitted by the measuring area and converts it into a parallel bundle of rays.
5. The device according to claim 1 , wherein the imaging device comprises a focussing lens which maps the detection radiation onto the detector.
6. The device according to claim 1 , wherein a reflection device or a wave guide is provided with which the detection radiation emitted from the measuring area can be directed to the detector.
7. A device for the contactless and non-destructive testing of a test surface by measuring the infrared radiation thereof, comprising:
one or more incoherent electromagnetic radiation sources,
a detector providing and arranged on a detection axis and comprising a measuring area,
a testing area defining an area to be measured of the test surface, and
an imaging device arranged on the detection axis for mapping the testing area onto the measuring area of the detector,
wherein the radiation sources are arranged at a radial distance from the detection axis at a distance from the testing area,
wherein the radiation sources are adapted to generate a pulse-like or intensity-modulated excitation radiation which can be directed onto the surface to be tested in the testing area,
wherein, in response to radiation impinging onto the surface to be tested in the testing area, detection radiation is emitted by the measuring area of the surface to be tested and fed to the detector,
wherein the excitation radiation from the radiation sources is fed to the testing area at an inclination to the detection axis,
wherein the detector on the detection axis is arranged spatially further away from the testing area than the radiation sources,
wherein the imaging device is arranged between the radiation sources,
wherein one or more optical filter devices are arranged between the radiation sources and the testing area, through which the excitation radiation is guidable to the testing area,
wherein the filter devices are designed to absorb one or more spectral ranges of the generated excitation radiation, and
wherein a side of the filter devices facing the testing area comprises a curved surface or additional lenses in order to direct the filtered excitation radiation onto the testing area.
8. The device according to claim 7 , wherein the imaging device directs the detection radiation passing through the opening of the reflection device and emitted by the testing area to the detector in the measuring area defined by the imaging device.
9. The device according to claim 7 , wherein the imaging device comprises a collecting lens which collects the detection radiation emitted by the measuring area and converts it into a parallel bundle of rays.
10. The device according to claim 7 , wherein the imaging device comprises a focussing lens which maps the detection radiation onto the detector.
11. The device according to claim 7 , wherein a reflection device or a wave guide is provided with which the detection radiation emitted from the measuring area can be directed to the detector.
12. A device for the contactless and non-destructive testing of a test surface by measuring the infrared radiation thereof, comprising:
one or more incoherent electromagnetic radiation sources,
a detector providing and arranged on a detection axis and comprising a measuring area, a testing area defining an area to be measured of the test surface, and
an imaging device arranged on the detection axis for mapping the testing area onto the measuring area of the detector,
wherein the radiation sources are arranged at a radial distance from the detection axis at a distance from the testing area,
wherein the radiation sources are adapted to generate a pulse-like or intensity-modulated excitation radiation which can be directed onto the surface to be tested in the testing area,
wherein, in response to radiation impinging onto the surface to be tested in the testing area, detection radiation is emitted by the measuring area of the surface to be tested and fed to the detector,
wherein the excitation radiation from the radiation sources is fed to the testing area at an inclination to the detection axis,
wherein the detector on the detection axis is arranged spatially further away from the testing area than the radiation sources,
wherein the imaging device is arranged between the radiation sources,
wherein one or more optical filter devices are arranged between the radiation sources and the testing area, through which the excitation radiation is guidable to the testing area,
wherein the filter devices are designed to absorb one or more spectral ranges of the generated excitation radiation, and
wherein one or more electromagnetic radiation sources are embedded into one or more of the filter devices formed by filter media.
13. The device according to claim 12 , wherein the imaging device directs the detection radiation passing through the opening of the reflection device and emitted by the testing area to the detector in the measuring area defined by the imaging device.
14. The device according to claim 12 , wherein the imaging device comprises a collecting lens which collects the detection radiation emitted by the measuring area and converts the detection radiation into a parallel bundle of rays.
15. The device according to claim 12 , wherein the imaging device comprises a focussing lens which maps the detection radiation onto the detector.
16. The device according to claim 12 , wherein a reflection device or a wave guide is provided with which the detection radiation emitted from the measuring area can be directed to the detector.
17. A device for the contactless and non-destructive testing of a test surface by measuring the infrared radiation thereof, comprising:
one or more incoherent electromagnetic radiation sources,
a detector providing and arranged on a detection axis and comprising a measuring area,
a testing area defining an area to be measured of the test surface, and an imaging device arranged on the detection axis for mapping the testing area onto the measuring area of the detector,
wherein the radiation sources are arranged at a radial distance from the detection axis at a distance from the testing area,
wherein the radiation sources are adapted to generate a pulse-like or intensity-modulated excitation radiation which can be directed onto the surface to be tested in the testing area,
wherein, in response to radiation impinging onto the surface to be tested in the testing area, detection radiation is emitted by the measuring area of the surface to be tested and fed to the detector,
wherein the excitation radiation from the radiation sources is fed to the testing area at an inclination to the detection axis,
wherein the detector on the detection axis is arranged spatially further away from the testing area than the radiation sources,
wherein the imaging device is arranged between the radiation sources,
wherein one or more optical filter devices are arranged between the radiation sources and the testing area, through which the excitation radiation is guidable to the testing area,
wherein the filter devices are designed to absorb one or more spectral ranges of the generated excitation radiation, and
wherein one or more of the filter devices formed by filter media are used for the dissipation of heat from one or more radiation sources.
18. The device according to claim 17 , wherein the imaging device directs the detection radiation passing through the opening of the reflection device and emitted by the testing area to the detector in the measuring area defined by the imaging device.
19. The device according to claim 17 , wherein the imaging device comprises a collecting lens which collects the detection radiation emitted by the measuring area and converts the detection radiation into a parallel bundle of rays.
20. The device according to claim 17 , wherein the imaging device comprises a focussing lens which maps the detection radiation onto the detector.
21. The device according to claim 17 , wherein a reflection device or a wave guide is provided with which the detection radiation emitted from the measuring area can be directed to the detector.