IP Library Granted Patent US 8,810,278
Granted Patent B2
US 8,810,278 · App. 13/654,415 · Granted Aug 19, 2014

Semiconductor integrated circuit device

Inventors: Kazuo Sakamoto (Kanagawa, JP); Naozumi Morino (Kanagawa, JP); Kazuo Tanaka (Kanagawa, JP); Hiroyasu Ishizuka (Kanagawa, JP)
Assignee: Renesas Electronics Corporation
H03K19/0175
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Quick Facts
Patent No.
US 8,810,278
App. No.
13/654,415
Granted
Aug 19, 2014
Kind
B2
Abstract

A semiconductor integrated circuit device comprises I/O cells arranged around a core region. Each of the I/O cells comprises a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit. An I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlap with a region in which a pad for the I/O cell is arranged. The I/O logic region and the I/O buffer region are arranged side by side in a direction parallel to a side of the core region.

Claims (26)

1. A semiconductor integrated circuit device, comprising:

I/O cells arranged around a core region, each of said I/O cells comprising a level shifter circuit, an I/O logic circuit, and an I/O buffer circuit, wherein

an I/O logic region in which the I/O logic circuit is arranged and an I/O buffer region in which the I/O buffer circuit is arranged overlapping with a region in which a pad for the I/O cell is arranged, said I/O logic region and said I/O buffer region being arranged side by side in a direction parallel to a side of the core region.

2. The semiconductor integrated circuit device according to claim 1 , wherein

a deep N-well included in the I/O logic region and a deep N-well included in the I/O buffer region are separated from each other.

3. The semiconductor integrated circuit device according to claim 1 , wherein

the I/O logic circuit and the I/O buffer circuit share a first wiring supplying a first voltage and a second wiring supplying a second voltage.

4. The semiconductor integrated circuit device according to claim 2 , wherein

the I/O logic circuit and the I/O buffer circuit share a first wiring supplying a first voltage and a second wiring supplying a second voltage.

5. The semiconductor integrated circuit device according to claim 3 , wherein

the first voltage and the second voltage are a power supply voltage and a ground voltage, respectively, for the I/O buffer circuit and the I/O logic circuit.

6. The semiconductor integrated circuit device according to claim 3 , wherein

the I/O buffer circuit includes a P buffer and an N buffer, and

a P buffer region in which the P buffer is arranged is arranged beside a level shifter region in which the level shifter circuit is arranged.

7. The semiconductor integrated circuit device according to claim 3 , wherein

the I/O buffer region comprises a PMOS transistor, an NMOS transistor, first and second resistive elements, and first and second diode elements,

the PMOS transistor has a gate terminal connected to the IO logic circuit, one of a source terminal and a drain terminal connected to a back-gate terminal and the first wiring, and the other one of the terminals connected to a first terminal of the first resistive element,

the first resistive element has a second terminal connected to the pad,

the first diode element is connected between the first wiring and the pad,

the NMOS transistor has a gate terminal connected to the IO logic circuit, one of a source terminal and a drain terminal is connected to a back-gate terminal and the second wiring, and the other one of the terminals is connected to a first terminal of the second resistive element,

the second resistive element has a second terminal connected to the pad, and

the second diode element is connected between the second wiring and the pad.

8. The semiconductor integrated circuit device according to claim 1 , wherein

the level shifter region in which the level shifter circuit is arranged includes: a first voltage region in which a circuit supplying a first power supply voltage to the I/O logic circuit is arranged; and a second voltage region in which a circuit supplying a second power supply voltage to the core logic circuit is arranged,

the first voltage region is arranged within the I/O logic region, and

the second voltage region is arranged between the core region and a pair of the I/O logic region and the I/O buffer region.

Assignments (2)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2012
From: SAKAMOTO, KAZUO; MORINO, NAOZUMI; TANAKA, KAZUO; ISHIZUKA, HIROYASU
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 029152/0655 →
Priority Claims (1)
JP 2011-229075 · Oct 18, 2011 · national
Continuity (1)
Related Publication 20130093508A1 · Apr 18, 2013