Ultrasonic testing instrument with dithery pulsing

1. A non-destructive inspection or testing (NDT/NDI) device configured for inspecting a test object, comprising:

a probe configured for pulsing a test object during a testing cycle at a testing location with N pulses to produce and receive N sets of wave responses, and to produce therefrom N sets of electric echo signals;

at least one analog to digital converter configured to digitize the N sets of echo signals and to produce therefrom N sets of digitized signal samples, which correspond respectively to N sets of acquired signal samples and N sets of noise signal samples;

a digital logic device, having a data processing unit configured to execute an averaging process by which the N sets of signal samples are summed and averaged to produce a final testing result;

wherein each one of the N sets of noise signal samples includes a residual acoustic energy from a previous one of the N sets of noise signal samples,

wherein the digital logic device further comprises a pulser control unit configured to control the pulsing according to a dithery pulsing sequence by which the probe is pulsed in a random dithery manner given by a plurality of dither values which are independent between one pulse and another so that the combination effect of the residual acoustic energy from the N sets of the noise signal samples is decimated during the averaging process and in the testing result,

wherein the averaging process is conducted regardless of the dithery pattern, and,

wherein the dithery pulsing sequence is governed by T 0 +nT+D n , wherein n=1˜N, with n to be a sequence number at which the probe is pulsed, T 0 to be a starting time of the pulsing, T to be a pulse time interval between two adjacent pulses, and D n are the dither values.

2. The device of claim 1 , wherein N is an averaging factor used by the digital logic device for the averaging process.

3. The device of claim 1 , wherein the digital logic device further comprises an averaging unit for executing the averaging process, the averaging unit further including an averaging controller, a digital memory, an adder and a divider.

4. The device of claim 1 , wherein the pulser control unit further comprises a timing controller, a pulser counter, a timing adder, a main counter and pulser controller to apply the dithery pulsing.

5. The device of claim 1 , wherein the probe includes a single element ultrasonic transmitter.

6. The device of claim 1 , wherein the probe includes a single element transceiver.

7. The device of claim 1 , wherein the probe is a dual element probe.

8. The device of claim 1 , wherein the probe is a phased array probe.

9. A method of pulsing a non-destructive inspection or testing (NDT/NDI) device having a probe configured for pulsing a test object during a testing cycle, the method comprises the steps of:

pulsing the probe with N pulses according to a pulsing sequence,

causing the probe to receive N sets of wave responses, and to produce therefrom N sets of electric echo signals;

digitizing the N sets of echo signals to produce N sets of digitized signal samples, which correspond respectively to N sets of acquired signal samples and N sets of noise signal samples, wherein each one of the N sets of noise signal samples includes a residual acoustic energy from a previous one of the N sets of noise signal samples;

averaging said N sets of acquired signal samples using a digital logic component;

wherein the pulsing sequence has a random dithery manner given by a plurality of dither values which are independent between one pulse and another so that the combination effect of the residual acoustic energy from the N sets of the noise signal samples is decimated during the averaging step and in the testing result,

wherein the averaging process is conducted regardless of the dithery pattern, and,

wherein the dithery pulsing sequence is governed by T 0 +nT+D n , wherein n=1˜N, with n to be a sequence number at which the probe is pulsed, T 0 to be a starting time of the pulsing, T to be a pulse time interval between two adjacent pulses, and D n are the dither values.

10. The method of claim 9 , wherein the steps of pulsing, digitizing and averaging are executed by a digital logic device.

11. The method of claim 10 , wherein the digital logic device further comprises an averaging unit for executing the averaging process, the averaging unit further including an averaging controller, a digital memory, an adder and a divider.

12. The method claim 10 , wherein the logic device further comprising a pulser control unit which further comprises a timing controller, a pulser counter, a timing adder, a main counter and pulser controller to apply the dithery pulsing.

13. The method claim 1 , wherein the probe includes a single element ultrasonic probe.

14. The method claim 1 , wherein the probe is a multiple or array element ultrasonic probe.