Patent Assignment
Reel/Frame 066143/0724
Confirmatory Assignment
Recorded: 2023-12-28
Pages: 41
Assignor
OLYMPUS AMERICA INC.
Executed: 2023-11-30
Assignee
EVIDENT SCIENTIFIC, INC.
48 WOERD AVENUE, WALTHAM, MASSACHUSETTS, 02453
Covered Properties
(170)
Method and Apparatus for Testing a Progression of Neoplasia Including Cancer Chemoprevention Testing
Patent:
6,031,930 →
Application:
08/701,974 →
Method and Apparatus for Acquiring and Reconstructing Magnified Specimen Images from a Computer-Controlled Microscope
Patent:
6,101,265 →
Application:
08/805,856 →
Method and Apparatus for Creating a Virtual Microscope Slide
Patent:
6,272,235 →
Application:
09/032,514 →
Method and Apparatus for Acquiring and Reconstructing Magnified Specimen Images from a Computer-Controlled Microscope
Patent:
6,226,392 →
Application:
09/395,694 →
Method and Apparatus for Creating a Virtual Microscope Slide
Patent:
6,522,774 →
Application:
09/574,423 →
Method and apparatus for internet, intranet, and local viewing of virtual microscope slides
Patent:
6,396,941 →
Application:
09/592,561 →
Method and Apparatus for Processing an Image of a Tissue Sample Microarray
Method and Apparatus for Acquiring and Reconstructing Magnified Specimen Images from a Computer-Controlled Microscope
Apparatus for Remote Control of a Microscope
Method and Apparatus for Internet, Intranet, and Local Viewing of Virtual Microscope Slides
Method and Apparatus for Processing an Image of a Tissue Sample Microarray
Method and Apparatus for Creating a Virtual Microscope Slide
Focusable Virtual Microscopy Apparatus and Method
Apparatus for Remote Control of a Microscope
Method and Apparatus for Internet, Intranet, and Local Viewing of Virtual Microscope Slides
Method and Apparatus for Creating a Virtual Microscope Slide
Method and Apparatus for Creating a Virtual Microscope Slide
Method and Apparatus of Mechanical Stage Positioning in Virtual Microscopy Image Capture
Method and Apparatus for Internet, Intranet, and Local Viewing of Virtual Microscope Slides
Fuel Analysis System
Patent:
7,286,633 →
Application:
11/585,367 →
Method and Apparatus for Internet, Intranet, and Local Viewing of Virtual Microscope Slides
Material Inspection Methods and Devices
Focusable Virtual Microscopy Apparatus and Method
Weld Seam Tracking System Using Phased Array Ultrasonic Devices
Computer Image Processing System and Method for Ndt/Ndi Testing Devices
Application:
12/605,716 →
Publication:
US 2010/0104132
Sample Error Minimization for High Dynamic Range Digitization Systems
Multi-Frequency Bond Testing
Ultrasonic Internal Rotating Inspection Probe That Self-Eliminates Air Bubbles
Sequentially Fired High Dynamic Range Ndt/Ndi Inspection Device
High Dynamic Range Ndt/Ndi Inspection Device with Selective Noise Averaging
System and Method for Derivation and Real-Time Application of Acoustic V-Path Correction Data
Magnetic Flux Leakage Inspection Device
Application:
12/748,614 →
Publication:
US 2011/0234212
Removable Wear-Plate Assembly for Acoustic Probes
2D Coil and a Method of Obtaining Ec Response of 3D Coils Using the 2D Coil Configuration
Probe Holder Adjustable to Conform to Test Surfaces
Application:
12/833,539 →
Publication:
US 2012/0006132
Orthogonal Eddy Current Probe for Multi-Directional Inspection
System and Method of Conducting Refraction Angle Verification for Phased Array Probes Using Standard Calibration Blocks
Method and Apparatus for Internet, Intranet, and Local Viewing of Virtual Microscope Slides
Shielded Eddy Current Coils and Methods for Forming Same on Printed Circuit Boards
Automatic Calibration Error Detection for Ultrasonic Inspection Devices
Focusable Virtual Microscopy Apparatus and Method
Rotating Array Probe System for Non-Destructive Testing
Non-Destructive Inspection Instrument Employing Multiple Sensor Technologies in an Integral Enclosure
X-ray analysis apparatus with radiation monitoring feature
Circuitry for Measuring and Compensating Phase and Amplitude Differences in Ndt/Ndi Operation
Image Processing System and Method for Ndt/Ndi Testing Devices
Application:
13/224,874 →
Publication:
US 2013/0060488
Method and a Device of Phased Array Inspection with Pulse Rate Optimization
Reciprocal Interface Panels Suitable for Multi-Purpose Actuators
Eddy Current Array Probe and Method for Lift-Off Compensation During Operation Without Known Lift References
Application:
13/427,205 →
Publication:
US 2013/0249540
Circuitry for and a Method of Compensating Drift in Resistance in Eddy Current Probes
Apparatus and Method for Overlaying Touch-Screen Input with Digital Display of an Ndt/Ndi Instrument
X-Ray Analysis Apparatus with Detector Window Protection Feature
Method of and an Apparatus Conducting Calibration for Phased-Array Shear Wave Channels Inspecting Square Bars
Ultrasonic Testing Instrument with Dithery Pulsing
Sizing of a Defect Using Phased Array System
Method and System of Using 1.5D Phased Array Probe for Cylindrical Parts Inspection
Assembly with a Universal Manipulator for Inspecting Dovetail of Different Sizes
System and Method of Non-Destructive Inspection with a Visual Scanning Guide
Method and System of Signal Representation for Ndt/Ndi Devices
Eddy Current Array Configuration with Reduced Length and Thickness
Non-Destructive Testing Instrument with Display Features Indicating Signal Saturation
Application:
14/035,202 →
Publication:
US 2014/0088921
Method and Circuitry for Removing Circling Drifts in Ndt/Ndi Measurement Display
Hall Effect Measurement Instrument with Temperature Compensation
Instrument and Method of Measuring the Concentration of a Target Element in a Multi-Layer Thin Coating
Automatic Calibration for Phased Array Inspection of Girth Weld
Packet Based Dds Minimizing Mathematical and Dac Noise
Aparatus and Method for Conducting and Real-Time Application of Ec Probe Calibration
Xrf Instrument with Removably Attached Window Protecting Films
Assembly of Xrd/Xrf Sample Cells
Application:
14/313,411 →
Publication:
US 2015/0003580
System and Method of Correcting a Non-Concentric Ultrasonic Iris Inspection Result
Spacer Accessory for Xrf Handheld Analyzers
Circuit and Method of Providing a Stable Display for Eddy Current Instruments
Test Stand for Xrf Instrument Enabling Multi-Way Operation
Hall Effect Measurement Instrument with Temperature Compensation
A System and a Method of Automatically Generating a Phased Array Ultrasound Scan Plan for Non-Destructive Inspection
Method of Conducting Probe Coupling Calibration in a Guided-Wave Inspection Instrument
System and Method of Dynamic Gating in Non-Destructive Weld Inspection
Phased Array System Capable of Computing Gains for Non-Measured Calibration Points
Method of Calibrating a Phased Array Ultrasonic System Without Known Test Object Sound Speed
Patent:
9,952,185 →
Application:
14/790,626 →
Method and System of Consolidating Multiple Phased Array Instruments
Probe Holder Providing Constant Lift-Off for in-Line Bar-Pipe Testing
Focusing Wedge for Ultrasonic Testing
Xrd Sample Handling Apparatus
X-Ray Analytical Instrument with Improved Control of Detector Cooling and Bias Supply
Touchscreen Display Assembly for Harsh Environment
Phased Array Ultrasonic Transducers with Solderless Stack Bonding Assembly
Method and Apparatus for X-Ray Detection System Gain Calibration Using a Pulser
Xrf Analyzer with Improved Resolution by Using Micro-Reset
Phased-Array Probe and a Phased-Array Search Unit
Xrf Instrument with Removably Attached Window Protecting Film Assembly
Phased Array Weld Inspection System with Assisted Analysis Tools
Application:
15/333,367 →
Publication:
US 2018/0113100
Virtual Channels for Eddy Current Array Probes
Ultrasonic Inspection Configuration with Beam Overlap Verification
Application:
15/429,700 →
Publication:
US 2018/0231508
Ultrasonic Phased Array Probe Using Pcb as Matching Layer
Method and System of Deducing Sound Velocity Using Time-of-Flight of Surface Wave
Total Focusing Method Adaptively Corrected by Using Plane Wave
Non-Destructive Inspection Having Phase Amplitude Modulation with Time Division Multiplexing
Eddy Current Inspection Instrument with Noise Shaping Filter
Water Wedge for Flexible Probe
Gapless Calibration Method for Phased Array Ultrasonic Inspection
Dual Ultrasonic Probe with Variable Roof Angle
Ultrasonic Tfm with Calculated Angle Beams
Eddy Current Array Probe and Method for Lift-Off Compensation During Operation Without Known Lift References
Application:
15/872,719 →
Publication:
US 2018/0143161
Data Center Selection for Communication with an Industrial Testing Device
Instrument Case for Use by Operator Suspended from Harness
Application:
15/941,933 →
Publication:
US 2019/0298043
Photon Counting in Laser Induced Breakdown Spectroscopy
Application:
15/954,685 →
Publication:
US 2018/0348141
System and Method for Ultrasound Inspection with Time Reversal
Portable Phased Array Test Instrument
Method and Apparatus for Measuring Wall Thickness, Ovality of Tubular Materials
Ultrasonic Measurement of Surface Profile and Average Diameter of a Tube
X-Ray Analytical Instrument with Improved Control of Detector Cooling and Bias Supply
Flow Cell for Analysis of Fluids
Ultrasonic Transducer Using Aerogel as Filler Material
Application:
16/133,921 →
Publication:
US 2019/0103547
High Throughput Light Sheet Microscope with Adjustable Angular Illumination
Application:
16/137,240 →
Publication:
US 2020/0096754
Ultrasonic Scanner with Interchangeable Wedge and Flexible Probe
Scanner Magnetic Wheel System for Close Traction on Pipes and Pipe Elbows
Ultrasonic Bar Inspection System with Improved Centering Assembly
Generalized Dmas Algorithm for Improved Ultrasound Imaging
Application:
16/655,150 →
Publication:
US 2020/0121292
Ultrasonic Inspection Configuration with Beam Overlap Verification
Flow Cell for Analysis of Fluids
Data Center Selection for Communication with an Industrial Testing Device
Eddy Current Array Probe and Method for Lift-Off Compensation During Operation Without Known Lift References
Application:
17/034,811 →
Publication:
US 2021/0010975
Portable Phased Array Test Instrument
Application:
17/113,517 →
Publication:
US 2021/0088481
Ultrasonic Measurement of Surface Profile and Average Diameter of a Tube
Data Center Selection for Communication with an Industrial Testing Device
Xrf Analyzer with Improved Resolution by Using Micro-Reset
Application:
17/811,962 →
Publication:
US 2022/0342090
Over-Molding of a Casing for a Non-Destructive Inspection Instrument
Patent:
640,580 →
Application:
29/362,248 →
Casing for a Non-Destructive Instrument
Patent:
668,564 →
Application:
29/377,292 →
Bench Top X-Ray Fluorescence (Xrf) Instrument
Patent:
702,350 →
Application:
29/412,249 →
Casing for a Non-Destructive Inspection Instrument
Patent:
769,746 →
Application:
29/494,478 →
Casing of a Hand Held X-Ray Fluorescence (Xrf) Analyzer Instrument
Patent:
769,447 →
Application:
29/542,589 →
Casing of a Hand Held Ultrasonic Flaw Detector Instrument
Patent:
794,207 →
Application:
29/559,753 →
Docking Station for a Hand Held X-Ray Fluorescence (Xrf) Instrument
Patent:
796,680 →
Application:
29/577,091 →
Ultrasonic Scanner for Inspecting Pipes and Pipe Elbows
Patent:
863,012 →
Application:
29/623,878 →
Casing for a Portable Non-Destructive Test Instrument
Patent:
909,900 →
Application:
29/678,815 →
Portable Non-Destructive Test Instrument
Patent:
969,643 →
Application:
29/766,026 →
Material Inspection Methods and Devices
Application:
61/058,789 →
Sample Error Minimization for High Dynamic Range Digitization Systems
Application:
61/108,083 →
Computer Image Processing System and Method for Ndt/Ndi Testing Devices
Application:
61/108,251 →
Automatic Calibration Error Detection for Ultrasonic Inspection Devices
Application:
61/317,446 →
Rotating Array Probe Non-Destructive Test System for Encircled Pipe or Bar Inspection
Application:
61/324,993 →
Portable Ultrasonic Non-Destructive Test (Ndt) Instrument
Application:
61/439,154 →
X Ray Analysis Apparatus with Detector Window Protection Feature
Application:
61/509,252 →
Method of and an Apparatus Conducting Calibration for Phased-Array Shear Wave Channels Inspecting Square Bars
Application:
61/526,552 →
Ndt Assembly with a Universal Manipulator for Inspecting Dovetail of Different Sizes
Application:
61/678,857 →
Non-Destructive Testing Instrument with Display Features Indicating Signal Saturation
Application:
61/705,361 →
Hall Effect Measurement Instrument with Temperature Compensation
Application:
61/726,232 →
Instrument with Improvement in Detection of Multi-Layer Thin Coating
Application:
61/727,350 →
Removable Window Protecting Films and a Method of Applying Such to an Xrf/Xrd Device
Application:
61/810,424 →
Test Stand for Xrf Instrument Enabling Multi-Way Operation
Application:
61/931,023 →
System and Method of Dynamic Gating in Non-Destructive Weld Inspection
Application:
62/005,358 →
Phased Array System Capable of Computing Gains for Non-Measured Calibration Points
Application:
62/018,271 →
Method and System Consolidating Multiple Phased Array Instruments
Application:
62/029,051 →
Xrd Sample Handling Apparatus
Application:
62/073,250 →
Phased Array Ultrasonic Transducers with Solderless Stack Bonding Assembly
Application:
62/112,933 →
Phased-Array Probe and a Phased-Array Search Unit
Application:
62/140,962 →
Flexible Array Using a Flexible Circuit as the Matching Layer
Application:
62/301,115 →
Plane Wave Adaptively Corrected Total Focusing Method
Application:
62/315,946 →
Increased Speed and Reduced Noise in Eddy Current Inspection
Application:
62/328,778 →
Water Wedge for Flexible Probe
Application:
62/340,242 →
Gapless Calibration for Reliable Inspection Over Wide Angular Range
Application:
62/357,414 →
Ultrasonic Tfm with Calculated Angle Beams
Application:
62/437,761 →
Data Storage Localization Selection for Ndt Inspection
Application:
62/488,236 →
Photon Counting in Laser Induced Breakdown Spectroscopy
Application:
62/512,203 →
System and Method for Ultrasound Inspection with Time Reversal
Application:
62/513,558 →
Portable Phased Array Test Instrument
Application:
62/523,339 →
Ultrasonic Matrix Composite Transducer Using Aerogel as Filler Material
Application:
62/565,326 →
Ultrasonic Scanner with Interchangeable Wedge and Flexible Probe
Application:
62/578,050 →
Scanner Magnetic Wheel System for Close Traction on Pipes and Pipe Elbows
Application:
62/578,077 →
Generalized Dmas Algorithm for Improved Ultrasound Imaging
Application:
62/746,660 →
Related Assignments
(19)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jul 14, 1997
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 008625/0402 →
Assignment of Assignor's Interest
Jul 14, 1997
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 008625/0388 →
Assignment of Assignor's Interest
Sep 8, 1998
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 009452/0228 →
Assignment of Assignor's Interest
Oct 23, 2000
From: BACUS, JAMES W.; BACUS, JAMES V.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 011212/0701 →
Assignment of Assignor's Interest
May 4, 2001
From: BACUS, JAMES W.; BACUS, JAMES V.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 011779/0204 →
Assignment of Assignor's Interest
Dec 14, 2001
From: BACUS, JAMES W.; BACUS, JAMES V.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 012389/0725 →
Assignment of Assignor's Interest
Jan 7, 2002
From: BACUS, JAMES W.; BACUS, JAMES V.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 012455/0100 →
Assignment of Assignor's Interest
Dec 19, 2002
From: BACUS RESEARCH LABORATORIES, INC.
To: BACUS LABORATORIES, INC.
Reel/Frame 013589/0652 →
Change of Name
Jun 20, 2003
From: BACUS RESEARCH LABORATORIES, INC.
To: BRUCUS LABORATORIES, INC.
Reel/Frame 014186/0724 →
Assignment of Assignor's Interest
Jul 18, 2003
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS LABORATORIES, INC.
Reel/Frame 014300/0771 →
Change of Name
Oct 27, 2003
From: BACUS RESEARCH LABORATORIES, INC.
To: BACUS LABORATORIES, INC.
Reel/Frame 014628/0556 →
Change of Name
Oct 30, 2003
From: BACUS RESEARCH LABORATORIES, INC.
To: BACUS LABORATORIES, INC.
Reel/Frame 014642/0146 →
Change of Name
Nov 17, 2003
From: BACUS RESEARCH LABORATORIES, INC.
To: BACUS LABORATORIES, INC.
Reel/Frame 014692/0327 →
Assignment of Assignor's Interest
Nov 1, 2005
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS LABORATORIES, INC.
Reel/Frame 016714/0274 →
Assignment of Assignor's Interest
Feb 19, 2009
From: BACUS LABORATORIES, INC.
To: OLYMPUS AMERICA INC.
Reel/Frame 022277/0607 →
Assignment of Assignor's Interest
Jun 12, 2009
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 022813/0466 →
Assignment of Assignor's Interest
Jun 12, 2009
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 022813/0513 →
Assignment of Assignor's Interest
Jun 12, 2009
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 022813/0504 →
Assignment of Assignor's Interest
Jun 12, 2009
From: BACUS, JAMES V.; BACUS, JAMES W.
To: BACUS RESEARCH LABORATORIES, INC.
Reel/Frame 022813/0478 →