Circuit component and method of making the same
View Patent ↗The present invention provides a circuit component that enables satisfactory connection between a substrate and an IC chip and a method of making the same. The circuit component includes an IC chip and a substrate connected to each other using an electrically conductive adhesive containing electrically conductive particles. Bump electrodes and a non-electrode surface are provided on a mounting surface of the IC chip. The non-electrode surface is a portion of the mounting surface other than a portion where the bump electrodes are formed. Electrically conductive particles are placed in a first state between the surfaces of the substrate and the non-electrode surface so as to be in contact with both surfaces. Electrically conductive particles are placed in a second state between the surfaces of both the substrate and the bump electrodes, so as to be more flattened than the first state and dig into the bump electrodes.
1. A circuit component comprising:
an IC chip; and
a substrate;
wherein the IC chip and the substrate are connected to each other via an electrically conductive adhesive containing electrically conductive particles,
wherein the IC chip has a mounting surface on which a bump electrode and a non-electrode surface are provided, the non-electrode surface being a portion of the mounting surface other than a portion in which the bump electrode is formed,
wherein electrically conductive particles in a first state exist between a surface of the substrate and the non-electrode surface, the first state being a state in which the electrically conductive particles are in contact with both the surface of the substrate and the non-electrode surface, and
wherein electrically conductive particles in a second state exist between the surface of the substrate and the bump electrode, the second state being a state in which the electrically conductive particles are placed so as to be more flattened than the first state and dig into the bump electrode.
2. The circuit component according to claim 1 , wherein
the substrate is a glass substrate.
3. The circuit component according to claim 2 ,
wherein an interval between the non-electrode surface and the surface of the substrate is 70% or more and 100% or less of a maximum particle diameter of a first part of the electrically conductive particles, wherein the first part of the electrically conductive particles does not include a second part of the electrically conductive particles that have a particle diameter in the top 1% of all the electrically conductive particles.
4. The circuit component according to claim 2 ,
wherein the electrically conductive particles have a size in a height direction of the bump electrode, and wherein the size of the electrically conductive particles, in the height direction of the bump electrode, in the second state is 15% or more and 80% or less of the average particle diameter of the electrically conductive particles.
5. The circuit component according to claim 1 ,
wherein an interval between the non-electrode surface and the surface of the substrate is 70% or more and 100% or less of a maximum particle diameter of a first part of the electrically conductive particles, wherein the first part of the electrically conductive particles does not include a second part of the electrically conductive particles that have a particle diameter in the top 1% of all the electrically conductive particles.
6. The circuit component according to claim 1 ,
wherein the electrically conductive particles have a size in a height direction of the bump electrode, and wherein the size of the electrically conductive particles, in the height direction of the bump electrode, in the second state is 15% or more and 80% or less of the average particle diameter of the electrically conductive particles.
7. A circuit component comprising:
an IC chip; and
a substrate, wherein the IC chip and the substrate are connected to each other via an electrically conductive adhesive containing electrically conductive particles,
wherein the IC chip has a mounting surface on which a bump electrode and a non-electrode surface are provided, the non-electrode surface being a portion of the mounting surface other than a portion in which the bump electrode is formed, and
wherein electrically conductive particles having a size in a height direction of the bump electrode exist between a surface of the substrate and the non-electrode surface, the size being substantially coincident with an interval between the surface of the substrate and the non-electrode surface.
8. The circuit component according to claim 7 , wherein
the substrate is a glass substrate.
9. The circuit component according to claim 8 ,
wherein an interval between the non-electrode surface and the surface of the substrate is 70% or more and 100% or less of a maximum particle diameter of a first part of the electrically conductive particles, wherein the first part of the electrically conductive particles does not include a second part of the electrically conductive particles that have a particle diameter in the top 1% of all the electrically conductive particles.
10. The circuit component according to claim 8 ,
wherein the size of the electrically conductive particles, in the height direction of the bump electrode, in a second state, is 15% or more and 80% or less of the average particle diameter of the electrically conductive particles.
11. The circuit component according to claim 7 ,
wherein an interval between the non-electrode surface and the surface of the substrate is 70% or more and 100% or less of a maximum particle diameter of a first part of the electrically conductive particles, wherein the first part of the electrically conductive particles does not include a second part of the electrically conductive particles that have a particle diameter in the top 1% of all the electrically conductive particles.
12. The circuit component according to claim 7 ,
wherein the size of the electrically conductive particles, in the height direction of the bump electrode, in a second state, is 15% or more and 80% or less of the average particle diameter of the electrically conductive particles.