IP Library Granted Patent US 8,847,412
Granted Patent B2
US 8,847,412 · App. 13/672,750 · Granted Sep 30, 2014

Microelectronic assembly with thermally and electrically conductive underfill

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Quick Facts
Patent No.
US 8,847,412
App. No.
13/672,750
Granted
Sep 30, 2014
Kind
B2
Abstract

A microelectronic assembly may include a microelectronic element having a surface and a plurality of contacts at the surface; a first element consisting essentially of at least one of semiconductor or dielectric material, the first element having a surface facing the surface of the microelectronic element and a plurality of first element contacts at the surface of the first element; electrically conductive masses each joining a contact of the plurality of contacts of the microelectronic element with a respective first element contact of the plurality of first element contacts; a thermally and electrically conductive material layer between the surface of the microelectronic element and the surface of the first element and adjacent conductive masses of the conductive masses; and an electrically insulating coating electrically insulating the conductive masses and the surfaces of the microelectronic element and the first element from the thermally and electrically conductive material layer.

Claims (33)

1. A microelectronic assembly comprising:

a microelectronic element having a surface and a plurality of contacts at the surface;

a first element consisting essentially of at least one of semiconductor or dielectric material, the first element having a surface facing the surface of the microelectronic element and a plurality of first element contacts at the surface of the first element;

electrically conductive masses each joining a contact of the plurality of contacts of the microelectronic element with a respective first element contact of the plurality of first element contacts;

a thermally and electrically conductive material layer external to and facing the conductive masses between the surface of the microelectronic element and the surface of the first element and adjacent conductive masses of the conductive masses; and

an electrically insulating coating provided to the conductive masses and the surfaces of the microelectronic element and the first element and facing the thermally and electrically conductive material layer to electrically insulate the conductive masses and the surfaces of the microelectronic element and the first element from the thermally and electrically conductive material layer.

2. The assembly of claim 1 ,

wherein the contacts at the surface of the microelectronic element are arranged at locations of an area array, and

wherein the conductive material layer overlies a portion of the surface of the microelectronic element coextensive with the area array.

3. The assembly of claim 1 ,

wherein the microelectronic assembly is a microelectronic package, the first element is a substrate having terminals configured for electrically connecting the microelectronic package with a component external to the microelectronic package, and the first element contacts are electrically connected with the terminals.

4. The assembly of claim 3 ,

wherein the surface of the substrate is a first surface, and the terminals are at a second surface of the substrate opposite from the first surface.

5. The assembly of claim 4 ,

wherein the microelectronic element is a packaged semiconductor chip.

6. The assembly of claim 4 ,

wherein the substrate includes a conductive element electrically connected with at least one of the terminals, and the conductive material layer is electrically connected with the conductive element.

7. The assembly of claim 1 ,

wherein the microelectronic element is an unpackaged semiconductor chip.

8. The assembly of claim 1 ,

wherein the insulating coating is a conformal coating that includes poly-p-xylylene.

9. The assembly of claim 1 ,

wherein the insulating coating has a maximum thickness of about two microns.

10. The assembly of claim 1 ,

wherein the microelectronic element is a first unpackaged semiconductor chip, and the first element is a second unpackaged semiconductor chip.

11. The assembly of claim 10 ,

wherein the first unpackaged semiconductor chip has a second surface opposite the surface at which the contacts are disposed, and second contacts at the second surface electrically connected with the contacts, the assembly further comprising:

a third unpackaged semiconductor chip having contacts at a surface thereof facing the second contacts of the first unpackaged semiconductor chip and joined thereto by respective second electrically conductive masses;

a second thermally and electrically conductive material layer between the surface of the third unpackaged semiconductor chip and the second surface of the first unpackaged semiconductor chip and adjacent second conductive masses of the second conductive masses; and

a second electrically insulating coating electrically insulating the second conductive masses, the surface of the third unpackaged semiconductor chip and the second surface of first unpackaged semiconductor chip from the second thermally and electrically conductive material layer.

12. The assembly of claim 1 , wherein a dielectric material layer encapsulates the electrically insulating coating.

13. The assembly of claim 12 , wherein the dielectric material layer encapsulates the thermally and electrically conductive material layer.

14. The assembly of claim 1 , wherein the electrically insulating coating is on the conductive masses and the surfaces of the microelectronic element and the first element.

Assignments (6)
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 073508/0661 →
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 073689/0793 →
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: ROYAL BANK OF CANADA
To: TESSERA, INC.; INVENSAS BONDING TECHNOLOGIES, INC. (F/K/A ZIPTRONIX, INC.); FOTONATION CORPORATION (F/K/A DIGITALOPTICS CORPORATION AND F/K/A DIGITALOPTICS CORPORATION MEMS); INVENSAS CORPORATION; TESSERA ADVANCED TECHNOLOGIES, INC; DTS, INC.; DTS LLC; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
Reel/Frame 052920/0001 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
SECURITY INTEREST Recorded Dec 2, 2016
From: INVENSAS CORPORATION; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; ZIPTRONIX, INC.; DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; DTS, LLC; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 040797/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2012
From: HABA, BELGACEM; MCELREA, SIMON
To: INVENSAS CORPORATION
Reel/Frame 029488/0540 →