Microfabricated high-bandpass foucault aperture for electron microscopy
View Patent ↗A variant of the Foucault (knife-edge) aperture is disclosed that is designed to provide single-sideband (SSB) contrast at low spatial frequencies but retain conventional double-sideband (DSB) contrast at high spatial frequencies in transmission electron microscopy. The aperture includes a plate with an inner open area, a support extending from the plate at an edge of the open area, a half-circle feature mounted on the support and located at the center of the aperture open area. The radius of the half-circle portion of reciprocal space that is blocked by the aperture can be varied to suit the needs of electron microscopy investigation. The aperture is fabricated from conductive material which is preferably non-oxidizing, such as gold, for example.
1. An aperture comprising:
a conductive plate defining an open area;
a conductive support extending from an inner edge of the conductive plate into the open area; and
an approximately half-circle conductive feature at an end of the conductive support located substantially at a center of the open area, the half-circle conductive feature comprising an approximately semicircular cut-out at about a center of the half-circle conductive feature configured to pass an unscattered portion of an electron beam and to block a portion of a scattered portion of the electron beam, the aperture configured to be placed at a back focal plane of an objective lens of a transmission electron microscope.
2. The aperture of claim 1 , wherein the aperture comprises a substantially non-oxidizing metal.
3. The aperture of claim 2 , wherein the substantially non-oxidizing metal comprises gold.
4. The aperture of claim 1 , wherein the aperture comprises a carbon-coated metal.
5. The aperture of claim 1 , wherein the aperture comprises carbon-coated titanium.
6. The aperture of claim 1 , wherein the aperture comprises titanium.
7. The aperture of claim 1 , wherein the aperture is configured to be heated to at least approximately 350° C. during operation of the transmission electron microscope.
8. A method of enhancing phase contrast in an electron beam image comprising:
providing a transmission electron microscope (TEM), an electron beam generated by the TEM passing through a specimen;
positioning an aperture at a back focal plane of an objective lens the TEM, the aperture comprising:
a conductive plate defining an open area,
a conductive support extending from an inner edge of the conductive plate into the open area, and
an approximately half-circle conductive feature at an end of the conductive support located substantially at a center of the open area, the half-circle conductive feature comprising an approximately semicircular cut-out at about a center of the half-circle conductive feature configured to pass an unscattered portion of the electron beam and to block a portion of a scattered portion of the electron beam; and
imaging the electron beam on an image plane of the TEM.
9. An aperture comprising:
a conductive plate defining an open area;
a conductive support extending from an inner edge of the conductive plate into the open area; and
an approximately half-circle conductive feature at an end of the conductive support located substantially at a center of the open area, the half-circle conductive feature comprising a split step off-set in an edge of the half-circle conductive feature configured to enhance single-sideband contrast in a direction parallel to the edge, the aperture configured to be placed at a back focal plane of an objective lens of a transmission electron microscope.
10. The aperture of claim 9 , wherein the aperture comprises a substantially non-oxidizing metal.
11. The aperture of claim 10 , wherein the substantially non-oxidizing metal comprises gold.
12. The aperture of claim 9 , wherein the aperture comprises a carbon-coated metal.
13. The aperture of claim 9 , wherein the aperture comprises carbon-coated titanium.
14. The aperture of claim 9 , wherein the aperture comprises titanium.
15. The aperture of claim 9 , wherein the aperture is configured to be heated to at least approximately 350° C. during operation of the transmission electron microscope.
16. The method of claim 8 , wherein the aperture comprises a substantially non-oxidizing metal.
17. The method of claim 16 , wherein the substantially non-oxidizing metal comprises gold.
18. The method of claim 8 , wherein the aperture comprises a carbon-coated metal.
19. The method of claim 8 , wherein the aperture comprises carbon-coated titanium.
20. The method of claim 8 , wherein the aperture comprises titanium.