Inter-cell interference cancellation
A method includes selecting a first memory cell located along a first bit line and a first word line of a memory array. The method further includes selecting a second memory cell located along (i) the first word line, (ii) a second word line that is adjacent to the first word line, or (iii) a second bit line that is adjacent to the first bit line. A location of the second memory cell is selected based on a predetermined sequence of programming the memory cells. The method further includes writing data in the first memory cell, subsequently writing data in the second memory cell, and reading the first memory cell and the second memory cell. The method further includes detecting one or more states of the second memory causing interference to the first memory cell.
1. A system comprising:
a read module configured to
generate first information about a first memory cell located along a first bit line and a first word line of a memory array by reading memory cells along the first word line of the memory array, the memory cells including the first memory cell, wherein the first information indicates a location of a threshold voltage distribution of the first memory cell relative to a plurality of threshold voltages applied to the first word line to read the memory cells, and
generate second information about a second memory cell by reading the second memory cell, wherein the second memory cell is located along (i) the first word line, (ii) a second word line that is adjacent to the first word line, or (iii) a second bit line that is adjacent to the first bit line, wherein the second information indicates a state of the second memory cell causing interference to the first memory cell; and
a compensation module configured to compensate for the interference using a log-likelihood ratio corresponding to (i) the first information and (ii) a distribution number corresponding to a threshold voltage distribution of the state of the second memory cell causing the interference to the first memory cell.
2. A system comprising:
a read module configured to
generate first information about a first memory cell located along a first bit line and a first word line of a memory array by reading memory cells along the first word line of the memory array, the memory cells including the first memory cell, wherein the first information indicates a location of a threshold voltage distribution of the first memory cell relative to a plurality of threshold voltages applied to the first word line to read the memory cells, and
generate second information about a second memory cell by reading the second memory cell, wherein the second memory cell is located along (i) the first word line, (ii) a second word line that is adjacent to the first word line, or (iii) a second bit line that is adjacent to the first bit line, wherein the second information indicates a state of the second memory cell causing interference to the first memory cell;
a compensation module configured to compensate for the interference caused by the state of the second memory cell based on (i) the first information and (ii) the second information; and
a state determination module configured to determine states of one or more memory cells causing interference to the first memory cell, the one or more memory cells including the second memory cell,
wherein the one or more memory cells are located along (i) the first word line, (ii) the second word line that is adjacent to the first word line, or (iii) the second bit line that is adjacent to the first bit line, and
wherein locations of the one or more memory cells depend on a predetermined sequence of programming the memory cells.
3. The system of claim 2 , further comprising:
a mapping module configured to map one or more of the states causing similar interference to a distribution number,
wherein the distribution number represents threshold voltage distributions of the one or more of the states causing the interference to the first memory cell.
4. The system of claim 3 , further comprising:
a log-likelihood ratio module configured to generate a log-likelihood ratio corresponding to (i) the first information and (ii) the distribution number,
wherein the log-likelihood ratio is used to compensate for the interference to the first memory cell.
5. A method comprising:
generating first information about a first memory cell located along a first bit line and a first word line of a memory array by reading memory cells along the first word line of the memory array, the memory cells including the first memory cell, wherein
the first information indicates a location of a threshold voltage distribution of the first memory cell relative to a plurality of threshold voltages applied to the first word line to read the memory cells;
generating second information about a second memory cell by reading the second memory cell, wherein
the second memory cell is located along (i) the first word line, (ii) a second word line that is adjacent to the first word line, or (iii) a second bit line that is adjacent to the first bit line, and
the second information indicates a state of the second memory cell causing interference to the first memory cell; and
compensating for the interference using a log-likelihood ratio corresponding to (i) the first information and (ii) a distribution number corresponding to a threshold voltage distribution of the state of the second memory cell causing the interference to the first memory cell.
6. A method comprising:
generating first information about a first memory cell located along a first bit line and a first word line of a memory array by reading memory cells along the first word line of the memory array, the memory cells including the first memory cell, wherein
the first information indicates a location of a threshold voltage distribution of the first memory cell relative to a plurality of threshold voltages applied to the first word line to read the memory cells;
generating second information about a second memory cell by reading the second memory cell, wherein
the second memory cell is located along (i) the first word line, (ii) a second word line that is adjacent to the first word line, or (iii) a second bit line that is adjacent to the first bit line, and
the second information indicates a state of the second memory cell causing interference to the first memory cell;
compensating for the interference caused by the state of the second memory cell based on (i) the first information and (ii) the second information; and
determining states of one or more memory cells causing interference to the first memory cell, the one or more memory cells including the second memory cell,
wherein the one or more memory cells are located along (i) the first word line, (ii) the second word line that is adjacent to the first word line, or (iii) the second bit line that is adjacent to the first bit line, and
wherein locations of the one or more memory cells depend on a predetermined sequence of programming the memory cells.
7. The method of claim 6 , further comprising:
mapping one or more of the states causing similar interference to a distribution number,
wherein the distribution number represents threshold voltage distributions of the one or more of the states causing the interference to the first memory cell.
8. The method of claim 7 , further comprising:
generating a log-likelihood ratio corresponding to (i) the first information and (ii) the distribution number,
wherein the log-likelihood ratio is used to compensate for the interference to the first memory cell.