Method of conserving power based on electronic device's I/O pattern
A method of affecting power used by an electronic device is provided for an electronic device having storage media and running at least one application. Each application interfaces with the storage media through an input/output (I/O) path executing I/O activities that access the storage media in accordance with configurable parameters of the I/O path. A run-time I/O pattern defined by the I/O activities is determined during a run-time period of the electronic device. At least one of the I/O path's configurable parameters is then modified based on the run-time I/O pattern. The method is readily adapted for power conservation by providing selections for the configurable parameters with each of the selections optimizing power usage for a hypothetical I/O pattern. Then, one or more configurable parameters are modified in accordance with one of the selections for which the hypothetical I/O pattern associated therewith is closest to the run-time I/O pattern.
1. A method of affecting power used by an electronic device, comprising the steps of:
providing an electronic device having storage media and running at least one application, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O activities accessing said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O activities during a run-time period of the electronic device; and
modifying at least one of said configurable parameters based on said run-time I/O pattern to thereby affect power used by the electronic device to execute said I/O activities,
wherein said step of modifying comprises the steps of:
providing a plurality of selections for said configurable parameters, each of said selections optimizing power usage for a hypothetical I/O pattern; and
modifying at least one of said configurable parameters in accordance with one of said selections for which said hypothetical I/O pattern associated therewith is closest to said run-time I/O pattern.
2. A method of affecting power used by an electronic device, comprising the steps of:
providing an electronic device having storage media and running at least one application, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O activities accessing said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O activities during a run-time period of the electronic device; and
modifying at least one of said configurable parameters based on said run-time I/O pattern to thereby affect power used by the electronic device to execute said I/O activities,
wherein said step of modifying comprises the steps of:
providing a plurality of selections for said configurable parameters, each of said selections optimizing power usage for a hypothetical I/O pattern, each of said selections having a benchmark metric associated therewith indicative of said hypothetical I/O pattern;
converting said run-time I/O pattern to a run-time metric defined in correspondence with said benchmark metric; and
modifying at least one of said configurable parameters in accordance with one of said selections for which said benchmark metric is closest to said run-time metric.
3. A method according to claim 2 , wherein said I/O activities include I/O reads and I/O writes, and wherein said run-time metric is defined as a ratio between a number of said I/O reads completed in a time interval and a number of said I/O writes completed in said time interval.
4. A method of affecting power used by an electronic device, comprising the steps of:
providing an electronic device having storage media and running at least one application, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O reads and I/O writes to said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O reads and said I/O writes during a run-time period of the electronic device; and
modifying at least one of said configurable parameters based on said run-time I/O pattern to thereby affect power used by the electronic device to execute said I/O reads and said I/O writes,
wherein said step of modifying comprises the steps of:
providing a plurality of selections for said configurable parameters, each of said selections optimizing power usage for a hypothetical I/O pattern; and
modifying at least one of said configurable parameters in accordance with one of said selections for which said hypothetical I/O pattern associated therewith is closest to said run-time I/O pattern.
5. A method of affecting power used by an electronic device, comprising the steps of:
providing an electronic device having storage media and running at least one application, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O reads and I/O writes to said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O reads and said I/O writes during a run-time period of the electronic device; and
modifying at least one of said configurable parameters based on said run-time I/O pattern to thereby affect power used by the electronic device to execute said I/O reads and said I/O writes,
wherein said step of modifying comprises the steps of:
providing a plurality of selections for said configurable parameters, each of said selections optimizing power usage for a hypothetical I/O pattern, each of said selections having a benchmark metric associated therewith indicative of said hypothetical I/O pattern;
converting said run-time I/O pattern to a run-time metric defined in correspondence with said benchmark metric; and
modifying at least one of said configurable parameters in accordance with one of said selections for which said benchmark metric is closest to said run-time metric.
6. A method according to claim 5 , wherein said run-time metric is defined as a ratio between a number of said I/O reads completed in a time interval and a number of said I/O writes completed in said time interval.
7. A method of affecting power used by an electronic device, comprising the steps of:
providing a battery-powered electronic device having storage media running at least one application, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O activities accessing said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O activities during a run-time period of the electronic device;
comparing said run-time I/O pattern to a plurality of hypothetical I/O patterns to determine a closest match therebetween, each of said hypothetical I/O patterns being indicative of a set of said configurable parameters that optimize power used by the electronic device; and
reconfiguring at least one of said configurable parameters of said I/O path in accordance with said set of said configurable parameters associated with one of said hypothetical I/O patterns specified by said closest match,
wherein said step of comparing comprises the steps of:
converting each of said hypothetical I/O patterns to a benchmark metric associated therewith;
converting said run-time I/O pattern to a run-time metric defined in correspondence with said benchmark metric; and
comparing said run-time metric to each said benchmark metric in order to determine said closest match.
8. A method according to claim 7 , wherein said I/O activities include I/O reads and I/O writes, and wherein said run-time metric is defined as a ratio between a number of said I/O reads completed in a time interval and a number of said I/O writes completed in said time interval.
9. A method of affecting power used by an electronic device, comprising the steps of:
running at least one application on an electronic device having storage media, wherein each said application interfaces with said storage media through an input/output (I/O) path executing I/O activities accessing said storage media in accordance with a plurality of configurable parameters of said I/O path;
determining a run-time I/O pattern defined by said I/O activities during a run-time period of the electronic device; and
modifying at least one of said configurable parameters based on said run-time I/O pattern to thereby affect power used by the electronic device to execute said I/O activities,
wherein said step of modifying comprises the steps of:
providing a plurality of selections for said configurable parameters, each of said selections optimizing power usage for a hypothetical I/O pattern; and
modifying at least one of said configurable parameters in accordance with one of said selections for which said hypothetical I/O pattern associated therewith is closest to said run-time I/O pattern.