Probes with programmable motion

1. An electronic contactor apparatus comprising:

a guide comprising a guide hole; and

a probe comprising a tip at an end of an elongated body disposed in said guide hole, said probe structured for said tip to contact and slide along a surface of a terminal of an electronic device under test (DUT) in response to a force of contact on said tip by said terminal;

wherein:

said elongated body comprises a first patterned region that contacts and rides on a first contact region in said guide hole and a second patterned region that contacts and rides on a second contact region in said guide hole as said elongated body moves in said guide hole in response to said force of contact on said tip, and

as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in a pattern that comprises lateral translation of said tip along said surface of said terminal, wherein said lateral translation is a combined function of said first patterned region and said second patterned region;

wherein the first patterned region comprises at least one of a curved surface or two surfaces with a discontinuity between the two surfaces;

wherein the second patterned region comprises at least one of a curved surface or two surfaces with a discontinuity between the two surfaces;

wherein:

said first patterned region comprises one or more surfaces that extend into or out of a side of said elongated body,

said second patterned region comprises one or more surfaces that extend into or out of a side of said elongated body, and

said combined function corresponds to said one or more surfaces of said first patterned region and said one or more surfaces of said second patterned region.

2. The apparatus of claim 1 , wherein:

said first contact region is inside said guide hole adjacent a first opening of said guide hole in a first surface of said guide, and

said second contact region is inside said guide hole adjacent a second opening of said guide hole in a second surface of said guide, and

said first surface is opposite said second surface.

3. The apparatus of claim 2 , wherein there is a gap between said elongated body and an inner sidewall of said guide hole.

4. The apparatus of claim 1 , wherein said one or more surfaces of said first patterned region comprise at least two contiguous curved surfaces.

5. The apparatus of claim 1 , wherein said one or more surfaces of said first patterned region diverge from one or more sides of said elongated body.

6. The apparatus of claim 1 , wherein at least one of said surfaces of said first patterned region is curved.

7. The apparatus of claim 1 , wherein said one or more surfaces of said first patterned region comprise a sequence of surfaces that diverge in different directions from said side of said elongated body.

8. The apparatus of claim 1 , wherein:

said lateral translation of said tip comprises translation of said tip in a first direction along said surface of said terminal followed by translation of said tip in a second direction along said surface of said terminal, and

said second direction is substantially opposite said first direction.

9. The apparatus of claim 1 , wherein said probe further comprises a second tip at an opposite end of said elongated body.

10. The apparatus of claim 1 , wherein:

a longest length of said elongated body and a direction of said force are oriented along an axis that is substantially vertical, and

said lateral translation of said tip is substantially horizontal.

11. A probe card assembly comprising:

a wiring substrate comprising an electrical interface to a tester for controlling testing of an electronic device under test (DUT);

a guide comprising guide holes; and

electrically conductive probes disposed to contact terminals of said DUT and electrically connected to said electrical interface,

wherein:

each said probe comprises a tip at an end of an elongated body disposed in a corresponding one of said guide holes,

said elongated body comprises a first patterned region that contacts and rides on a first contact region in said corresponding guide hole and a second patterned region that contacts and rides on a second contact region in said corresponding guide hole as said elongated body moves in said corresponding guide hole in response to a force of one of said terminals of said DUT against said tip, and

as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in a pattern that comprises lateral translation of said tip along a surface of said one of said terminals, wherein said lateral translation is a combined function of said first patterned region and said second patterned region;

wherein the first patterned region comprises at least one of a curved surface or two surfaces with a discontinuity between the two surfaces;

wherein the second patterned region comprises at least one of a curved surface or two surfaces with a discontinuity between the two surfaces;

wherein:

said first patterned region comprises one or more surfaces that extend into or out of a side of said elongated body,

said second patterned region comprises one or more surfaces that extend into or out of a side of said elongated body, and

said combined function corresponds to said one or more surfaces of said first patterned region and said one or more surfaces of said second patterned region.

12. The probe card assembly of claim 11 , wherein for each said probe:

said first contact region is inside said corresponding guide hole adjacent a first opening of said corresponding guide hole in a first surface of said guide, and

said second contact region is inside said corresponding guide hole adjacent a second opening of said corresponding guide hole in a second surface of said guide, and said first surface is opposite said second surface.

13. The probe card assembly of claim 12 , wherein there is a gap between said elongated body and an inner sidewall of said guide hole.

14. The probe card assembly of claim 11 , wherein said one or more surfaces of said first patterned region comprise at least two contiguous curved surfaces.

15. The probe card assembly of claim 11 , wherein for each said probe, said one or more surfaces of said first patterned region diverge from one or more sides of said elongated body of said probe.

16. The probe card assembly of claim 15 , wherein at least one of said surfaces of said first patterned region is curved.

17. The probe card assembly of claim 11 , wherein said one or more surfaces of said first patterned region comprise a sequence of surfaces that diverge in different directions from said side of said elongated body.

18. The probe card assembly of claim 11 , wherein:

said lateral translation of said tip comprises translation of said tip in a first direction along said surface of said one of said terminals followed by translation of said tip in a second direction along said surface of said one of said terminals, and

said second direction is substantially opposite said first direction.

19. The probe card assembly of claim 11 , wherein for each said probe:

a longest length of said elongated body and a direction of said force are along an axis that is substantially vertical, and

said lateral translation of said tip is substantially horizontal.

20. The apparatus of claim 2 , wherein a pattern of said one or more surfaces of said first patterned region is substantially the same as a pattern of said one or more surfaces of said second patterned region.

21. The apparatus of claim 1 , wherein said first patterned region and said second patterned region have substantially the same pattern.

22. The apparatus of claim 10 , wherein:

a horizontal cross-section of said elongated body at said first patterned region comprises a contour that imparts rotation of said elongated body about said axis, and

as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in a pattern that comprises said lateral translation and said rotation.

23. The apparatus of claim 1 , wherein said first patterned region comprises a contour that rotates said elongated body as said first patterned region rides on said first contact region.

24. The apparatus of claim 1 , wherein:

a cross-sectional shape of said elongated body is polygonal;

said first patterned region is on a first side of said elongated body,

said second patterned region is on a second side of said elongated body, and

said first side and said second side are contiguous sides of said elongated body.

25. The probe card assembly of claim 12 , wherein a pattern of said one or more surfaces of said first patterned region is substantially the same as a pattern of said one or more surfaces of said second patterned region.

26. The probe card assembly of claim 11 , wherein said first patterned region and said second patterned region have substantially the same pattern.

27. The probe card assembly of claim 19 , wherein:

a horizontal cross-section of said elongated body at said first patterned region comprises a contour that imparts rotation of said elongated body about said axis, and

as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in a pattern that comprises said lateral translation and said rotation.

28. The probe card assembly of claim 11 , wherein said first patterned region comprises a contour that rotates said elongated body as said first patterned region rides on said first contact region.

29. The probe card assembly of claim 11 , wherein:

a cross-sectional shape of said elongated body is polygonal;

said first patterned region is on a first side of said elongated body,

said second patterned region is on a second side of said elongated body, and

said first side and said second side are contiguous sides of said elongated body.

30. The apparatus of claim 1 , wherein in an absence of said force on said tip:

a first portion of said elongated body extends away from a first opening of said guide hole in a first side of said guide, a second portion of said elongated body extends away from a second opening of said guide hole in a second side of said guide that is opposite said first side, a middle portion of said elongated body between said first portion and said second portion is disposed inside said guide hole, and

there is a gap between said middle portion of said elongated body and said first opening of said guide hole sufficient so that said elongated body does not contact said first opening of said guide hole.

31. The probe card assembly of claim 11 , wherein in an absence of said force on said tip:

a first portion of said elongated body extends away from a first opening of said guide hole in a first side of said guide, a second portion of said elongated body extends away from a second opening of said guide hole in a second side of said guide that is opposite said first side, a middle portion of said elongated body between said first portion and said second portion is disposed inside said guide hole, and

there is a gap between said middle portion of said elongated body and said first opening of said guide hole sufficient so that said elongated body does not contact said first opening of said guide hole.

32. The apparatus of claim 1 , wherein as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in said pattern that comprises said lateral translation without substantially twisting about said elongated body.

33. The apparatus of claim 1 , wherein:

said first patterned region but not said second pattern region of said elongated body contacts and rides on said first contact region, and

said second patterned region but not said first pattern region of said elongated body contacts and rides on said second contact region.

34. The probe card assembly of claim 11 , wherein as said first patterned region rides on said first contact region and said second patterned region rides on said second contact region, said tip moves in said pattern that comprises said lateral translation without substantially twisting about said elongated body.

35. The probe card assembly of claim 11 , wherein:

said first patterned region but not said second pattern region of said elongated body contacts and rides on said first contact region, and

said second patterned region but not said first pattern region of said elongated body contacts and rides on said second contact region.