IP Library › Granted Patent US 9,568,517
Granted Patent B2
US 9,568,517 · App. 13/734,066 · Granted Feb 14, 2017

Self-diagnostic apparatus and method for electric device

Inventors: Se Hoon Lim (Gwangju, KR); Hee Jae Jo (Suwon, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
G01R21/007G01R31/00G06F17/00G01R21/00
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Quick Facts
Patent No.
US 9,568,517
App. No.
13/734,066
Granted
Feb 14, 2017
Kind
B2
Abstract

A diagnostic method and apparatus for self-diagnosis a load side of an electric device to detect the occurrence of the abnormal electricity usage at the load using a simple apparatus based on a current sensor includes checking rated power consumption of a load, measuring power consumption of the load in operation, calculating a change in the power consumption by comparing the rated power consumption of the load with the power consumption of the load in operation, and determining that an abnormal power consumption occurs at the load when the change in the power consumption is outside a predetermined range.

Claims (15)

1. A method of diagnosing electric device, the method comprising:

checking a rated power consumption of at least two operated loads by searching a lookup table;

supplying power to each of the at least two operated loads individually by operating at least one switch, which is controlled by a processor, to route the power to each of the at least two operated loads individually;

measuring a power consumption of each of the at least two operated loads when the power is supplied to each of the at least two operated loads individually,

wherein the measuring of the power consumption of each of the at least two operated loads includes measuring a current value of the power supplied to each of the at least two operated loads individually using a current detector;

calculating, using the processor, a change in the power consumption by comparing the checked rated power consumption of each of the at least two operated loads with the measured power consumption of the at least two operated loads; and

determining, using the processor, that an abnormal power consumption occurs in one or more of the at least two operated loads based on the calculated change in the power consumption being outside a predetermined range in the one or more of the at least two operated loads.

2. The diagnostic method of claim 1 ,

wherein the power consumption of each of the at least two operated loads are calculated based on the measured current value of each of the at least two operated loads.

3. The diagnostic method of claim 1 ,

wherein the determining that the abnormal power consumption occurs is performed in sequence for each of the at least two operated loads based on measuring power consumption of each of the plurality of loads when the power is supplied to each of the at least two operated loads.

4. The diagnostic method of claim 1 , wherein the power consumption of the at least two operated loads is measured using a current sensor, the current sensor being provided on a power cable that supplies the power to the at least two operated loads, and the current sensor being configured to measure the current value of the power supplied to one of the at least two operated loads through the electrical cable without supplying current to another one of the at least two operated loads.

5. The diagnostic method of claim 1 ,

wherein said supply of power is performed by at least three switches which supply the power to at least four operated loads individually.

6. The diagnostic method of claim 4 , wherein the current sensor is a sensor used in at least one of a temperature current (TC) sensor scheme, a dummy resistor scheme that uses a voltage drop by a current, and a hail sensor scheme.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2013
From: LIM, SE HOON; JO, HEE JAE
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 029698/0645 →
Priority Claims (1)
KR 10-2012-0000844 · Jan 4, 2012 · national
Continuity (1)
Related Publication 20130173186A1 · Jul 4, 2013