IP Library Granted Patent US 8,645,892
Granted Patent B1
US 8,645,892 · App. 13/735,053 · Granted Feb 4, 2014

Configurable circuit and mesh structure for integrated circuit

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Quick Facts
Patent No.
US 8,645,892
App. No.
13/735,053
Granted
Feb 4, 2014
Kind
B1
Abstract

An integrated circuit (IC) design includes configurable circuits arranged in a mesh structure to facilitate routing of signals between different platforms or logic blocks within the design. Each configurable circuit has a semiconductor element with input and output terminals in a first semiconductor layer, input/output (I/O) ports corresponding to directions of the mesh structure in a second semiconductor layer, configurable input vias to allow a signal traveling in a first direction to be received, and configurable output vias that allow an output signal to be output from the configurable circuit in a second direction.

Claims (87)

1. An integrated circuit (IC) layout, comprising:

a plurality of semiconductor devices including a source device and a destination device; and

a plurality of configurable circuits connected between the source and destination devices in a mesh structure for routing a signal from the source device to the destination device, wherein each configurable circuit includes:

a semiconductor element formed in a first semiconductor layer and having an input terminal for receiving the signal and an output terminal for outputting an output signal;

first, second, third, and fourth bidirectional I/O ports formed in a second semiconductor layer, wherein the first, second, third, and fourth bidirectional I/O ports represent first, second, third, and fourth directions of the mesh structure, respectively;

an input conducting ring including:

first and second input conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth input conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth input conducting paths are orthogonal to the first and second input conducting paths; and

first, second, third and fourth fixed input vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth input conducting paths;

an output conducting ring including:

first and second output conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth output conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth output conducting paths are orthogonal to the first and second output conducting paths; and

first, second, third and fourth fixed output vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth output conducting paths;

first and second configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first input conducting path, respectively;

third and fourth configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second input conducting path, respectively;

first and second configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first output conducting path, respectively; and

third and fourth configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports and the second output conducting path, respectively,

wherein the first, second, third, and fourth configurable input vias are configured such that the signal is received from the source device at the input terminal from one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports, and the first, second, third, and fourth configurable output vias are configured such that the output signal is routed to the destination device from the output terminal in one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports.

2. The IC layout of claim 1 , wherein each configurable circuit further includes a bypass conducting ring, wherein the bypass conducting ring includes:

first and second bypass conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth bypass conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth bypass conducting paths are orthogonal to the first and second bypass conducting paths;

first, second, third and fourth fixed bypass vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth bypass conducting paths;

first and second configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first bypass conducting path respectively; and

third and fourth configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second bypass conducting path, respectively;

wherein the first, second, third, and fourth configurable bypass vias are configured such that a second signal received from a second source device from one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports is routed to a second destination device in one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports, and wherein the second signal bypasses the semiconductor element.

3. The IC layout of claim 2 , wherein the first and second semiconductor layers comprise first and second metal layers.

4. The IC layout of claim 1 , wherein the configurable circuit is a part of a cell library of an electronic design automation (EDA) tool.

5. The IC layout of claim 1 , wherein the semiconductor element is at least one of a buffer, a repeater, a multiplexer and an inverter.

6. The IC layout of claim 1 , wherein the source device is a source cell and the destination device is a spare cell of the IC layout.

7. The IC layout of claim 6 , wherein the source cell and the spare cell are located in different semiconductor platforms of the IC layout.

8. An integrated circuit (IC) layout, comprising:

a plurality of semiconductor devices including a source device and a destination device; and

a plurality of configurable circuits connected between the source and destination devices in a mesh structure for routing a signal from the source device to the destination device, wherein each configurable circuit includes:

a semiconductor element formed in a first semiconductor layer and having an input terminal for receiving the signal and an output terminal for outputting an output signal;

first, second, third and fourth bidirectional input/output (I/O) ports formed in a second semiconductor layer, wherein the first, second, third, and fourth bidirectional I/O ports represent first, second, third, and fourth directions in the mesh structure, respectively;

an input conducting ring including:

first and second input conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth input conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth input conducting paths are orthogonal to the first and second input conducting paths; and

first, second, third and fourth fixed input vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth input conducting paths;

an output conducting ring including:

first and second output conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth output conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth output conducting paths are orthogonal to the first and second output conducting paths; and

first, second, third and fourth fixed output vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth output conducting paths;

a bypass conducting ring including:

first and second bypass conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth bypass conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth bypass conducting paths are orthogonal to the first and second bypass conducting paths;

first, second, third and fourth fixed bypass vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth bypass conducting paths;

first and second configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first input conducting path, respectively;

third and fourth configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second input conducting path, respectively;

first and second configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first output conducting path, respectively;

third and fourth configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second output conducting path, respectively;

first and second configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first bypass conducting path respectively; and

third and fourth configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second bypass conducting path, respectively,

wherein the first, second, third, and fourth configurable input vias are configured such that the signal is received from the source device at the input terminal from one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports, and the first, second, third, and fourth configurable output vias are configured such that the output signal is routed to the destination device from the output terminal in one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports, and

wherein the first, second, third, and fourth configurable bypass vias are configured such that a second signal received from a second source device from one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports and routed to a second destination device in one of the first, second, third, and fourth directions by way of one of the first, second, third, and fourth bidirectional I/O ports, wherein the second signal bypasses the semiconductor element.

9. The IC layout of claim 8 , wherein the first and second semiconductor layers comprise first and second metal layers.

10. The IC layout of claim 8 , wherein the semiconductor element is at least one of a buffer, a repeater, multiplexer, and an inverter.

11. The IC layout of claim 8 , wherein the source device is a source cell and the destination device is a spare cell.

12. The IC layout of claim 11 , wherein the source cell and the spare cell are located in different semiconductor platforms of the IC layout.

13. The IC layout of claim 8 , wherein the configurable circuit is a part of a cell library of an electronic design automation (EDA) tool.

14. A configurable circuit for routing a first input signal traveling in a first direction in a second direction, and routing a second input signal traveling in a third direction in a fourth direction, the configurable circuit comprising:

a semiconductor element formed in a first semiconductor layer and having an input terminal for receiving the first input signal and an output terminal for outputting a first output signal;

first, second, third and fourth bidirectional input/output (I/O) ports formed in a second semiconductor layer, wherein the first, second, third, and fourth bidirectional I/O ports are configured in respective North, South, East and West directions;

an input conducting ring including:

first and second input conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth input conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth input conducting paths are orthogonal to the first and second input conducting paths; and

first, second, third and fourth fixed input vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth input conducting paths;

an output conducting ring including:

first and second output conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth output conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth output conducting paths are orthogonal to the first and second output conducting paths; and

first, second, third and fourth fixed output vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth output conducting paths;

first and second configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first input conducting path, respectively;

third and fourth configurable input vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second input conducting path, respectively;

first and second configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first output conducting path, respectively; and

third and fourth configurable output vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second output conducting path, respectively,

wherein the first input signal is input to the one of the first through fourth I/O ports having a direction that coincides with the first direction and the first, second, third, and fourth configurable input vias are configured such that the said one of the first through fourth I/O ports is connected to the input terminal of the semiconductor element, and

wherein the first, second, third and fourth configurable output vias are configured such that the output terminal of the semiconductor element is connected to the one of the first through fourth I/O ports having a direction that coincides with the second direction.

15. The configurable circuit of claim 14 , further comprising:

a bypass conducting ring, the bypass conducting ring including:

first and second bypass conducting paths that are substantially parallel and formed in the first semiconductor layer;

third and fourth bypass conducting paths that are substantially parallel and formed in the second semiconductor layer, wherein the third and fourth bypass conducting paths are orthogonal to the first and second bypass conducting paths;

first, second, third and fourth fixed bypass vias extending from the first semiconductor layer to the second semiconductor layer and connecting the first, second, third, and fourth bypass conducting paths;

first and second configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the first and second bidirectional I/O ports with the first bypass conducting path respectively; and

third and fourth configurable bypass vias extending from the first semiconductor layer to the second semiconductor layer and selectively connecting the third and fourth bidirectional I/O ports with the second bypass conducting path, respectively;

wherein the first, second, third, and fourth configurable bypass vias are configured such that the second input signal is received from the one of the first, second, third, and fourth I/O ports having a direction that coincides with the third direction and is routed in the fourth by way of the one of the first, second, third, and fourth bidirectional I/O ports having a direction that coincides with the fourth direction, and wherein by being routed by way of the bypass conducting path the second input signal bypasses the semiconductor element.

16. The configurable circuit of claim 14 , wherein the semiconductor element is at least one of a buffer, a repeater, a multiplexer, and an inverter.

17. The configurable circuit of claim 14 , wherein the first and second semiconductor layers comprise first and second metal layers.

Assignments (22)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
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From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041260/0850 →
MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
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To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
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