IP Library Granted Patent US 9,099,611
Granted Patent B2
US 9,099,611 · App. 13/735,607 · Granted Aug 4, 2015

Light emitting device

Inventor: Yong Tae Moon (Seoul, KR)
Assignees: LG INNOTEK CO., LTD.; TAMURA CORPORATION; KOHA CO., LTD.
H01L33/32H01L21/0242H01L21/0254H01L21/02458H01L21/02488H01L21/02502H01L21/02538H01L33/007H01L33/12H01L33/44H01L2224/48091
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Quick Facts
Patent No.
US 9,099,611
App. No.
13/735,607
Granted
Aug 4, 2015
Kind
B2
Abstract

Disclosed is a method for fabricating a light emitting device. The method includes forming an oxide including gallium aluminum over a gallium oxide substrate, forming a nitride including gallium aluminum over the oxide including gallium aluminum and forming a light emitting structure over the nitride including gallium aluminum.

Claims (36)

1. A light emitting device comprising:

a gallium oxide layer over a gallium oxide substrate;

a gallium nitride layer over the gallium oxide layer; and

a light emitting structure over the gallium nitride layer,

wherein the light emitting structure is directly disposed on the gallium nitride layer, and

wherein the light emitting structure comprises:

a second conductive semiconductor layer over the gallium nitride layer;

an active layer over the second conductive semiconductor layer; and

a first conductive semiconductor layer over the active layer,

wherein the second conductive semiconductor layer is disposed on the gallium nitride layer.

2. The light emitting device of claim 1 , wherein the gallium oxide layer comprise a gallium aluminum oxide layer, and

wherein the gallium oxide layer is directly disposed on the gallium nitride layer.

3. The light emitting device of claim 2 , wherein the gallium aluminum oxide layer comprises Ga x Al y O z (0 x≦1, 0 y≦1, 0 z≦1).

4. The light emitting device of claim 2 , wherein the gallium aluminum oxide layer has a thickness of 1 μm or less.

5. The light emitting device of claim 1 , wherein the gallium nitride layer is inter-disposed between the gallium oxide layer and the light emitting structure.

6. The light emitting device of claim 1 , wherein the gallium oxide layer is directly disposed on the gallium oxide substrate.

7. The light emitting device of claim 1 , wherein the light emitting structure does not contact the gallium oxide layer.

8. The light emitting device of claim 1 , wherein the light emitting structure does not contact the gallium oxide substrate.

9. The light emitting device of claim 1 , wherein a first interfacial adhesion between the gallium oxide layer and the gallium nitride layer is stronger than a second interfacial adhesion between the gallium oxide substrate and the light emitting structure.

10. The light emitting device of claim 1 , wherein the gallium nitride layer comprises a gallium aluminum nitride layer.

11. The light emitting device of claim 10 , wherein the gallium aluminum nitride layer comprises Ga x Al y N z (0<x≦1, 0<y≦1, 0<z≦1).

12. The light emitting device of claim 1 , wherein the gallium oxide substrate comprises a Ga 2 O 3 substrate.

13. A light emitting device comprising:

a gallium oxide substrate;

a gallium aluminum oxide layer over the gallium oxide substrate;

a gallium aluminum nitride layer on the gallium aluminum oxide layer; and

a light emitting structure over the gallium aluminum nitride layer,

wherein the light emitting structure is directly disposed on the gallium aluminum nitride layer, and

wherein the light emitting structure comprises:

a second conductive semiconductor layer over the gallium nitride layer:

an active layer over the second conductive semiconductor layer; and

a first conductive semiconductor layer over the active layer,

wherein the second conductive semiconductor layer is disposed on the gallium nitride layer.

14. The light emitting device of claim 13 , wherein the gallium aluminum oxide layer comprises Ga x Al y O z (0<x≦1, 0<y≦1, 0<z≦1).

15. The light emitting device of claim 13 , wherein the gallium aluminum nitride layer comprises Ga x Al y N z (0<x≦1, 0<y≦1, 0<z≦1).

16. The light emitting device of claim 13 , wherein the gallium oxide substrate comprises a Ga 2 O 3 substrate.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2022
From: KOHA CO., LTD.
To: TAMURA CORPORATION
Reel/Frame 058547/0853 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 25, 2021
From: LG INNOTEK CO., LTD.
To: SUZHOU LEKIN SEMICONDUCTOR CO., LTD.
Reel/Frame 056366/0335 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2014
From: LG INNOTEK CO., LTD.
To: LG INNOTEK CO., LTD.; TAMURA CORPORATION; KOHA CO., LTD.
Reel/Frame 033711/0100 →
Priority Claims (1)
KR 10-2009-0127189 · Dec 18, 2009 · national
Continuity (3)
Continuation 13349387 · Jan 12, 2012
Continuation 12940718 · Nov 5, 2010
Related Publication 20130119402A1 · May 16, 2013