Transistor having increased breakdown voltage
View Patent ↗A transistor includes a source finger electrode having a source finger electrode beginning and a source finger electrode end. The transistor also includes a drain finger electrode with a curved drain finger electrode end having an increased radius of curvature. The resulting decreased electric field at the curved drain finger electrode end allows for an increased breakdown voltage and a more robust and reliable transistor.
1. A transistor having interdigitated drain and source finger electrodes, said transistor comprising:
a gate region between said interdigitated drain and source finger electrodes;
a drain finger electrode having a drain finger electrode beginning and a curved drain finger electrode end, said curved drain finger electrode end being surrounded by said gate region and having a radius of curvature;
wherein a width of said curved drain finger electrode end is greater than a width of said drain finger electrode beginning;
wherein a width of said gate region surrounding said curved drain finger electrode end is greater than a width of said gate region surrounding said drain finger electrode beginning;
wherein said gate region surrounding said curved drain finger electrode end has a radius of curvature greater than said radius of curvature of said curved drain finger electrode end to increase a gate-to-drain spacing at said curved drain finger electrode end.
2. The transistor of claim 1 , wherein said radius of curvature of said curved drain finger electrode end is greater than half of said width of said drain finger electrode beginning.
3. The transistor of claim 1 , wherein said transistor further comprises a source finger electrode having a source finger electrode beginning coupled to a source pad, and a source finger electrode end;
wherein said curved drain finger electrode end is extended beyond a length of said source finger electrode.
4. The transistor of claim 1 , wherein said radius of curvature of said curved drain finger electrode end results in said width of said curved drain finger electrode end being greater than said width of said drain finger electrode beginning.
5. The transistor of claim 1 , wherein said curved drain finger electrode end has a major axis longer than and perpendicular to a minor axis, and wherein said major axis is substantially aligned with said drain finger electrode.
6. The transistor of claim 1 , wherein said curved drain finger electrode end is substantially an ellipsoid.
7. The transistor of claim 6 , wherein a major axis of said ellipsoid is substantially aligned with said drain finger electrode.
8. The transistor of claim 1 , wherein a source-to-drain half-pitch of said transistor is substantially constant from a source finger electrode beginning to a source finger electrode end.
9. The transistor of claim 1 , wherein a length of said drain finger electrode is greater than a length of said source finger electrodes.
10. The transistor of claim 1 , wherein said transistor comprises a group III-V high electron mobility transistor (group III-V HEMT).
11. The transistor of claim 1 , wherein said drain finger electrode is a tapered drain finger electrode.
12. A transistor having interdigitated drain and source finger electrodes, said transistor comprising:
a gate region between said interdigitated drain and source finger electrodes;
a drain finger electrode with a curved drain finger electrode end and a drain finger electrode beginning;
a source finger electrode having a source finger electrode beginning coupled to a source pad, and a source finger electrode end;
said curved drain finger electrode end extended beyond a length of said source finger electrode;
wherein a width of said gate region surrounding said curved drain finger electrode end is greater than a width of said gate region surrounding said drain finger electrode beginning;
wherein said gate region surrounding said curved drain finger electrode end has a radius of curvature greater than a radius of curvature of said curved drain finger electrode end to increase a gate-to-drain spacing at said curved drain finger electrode end.
13. The transistor of claim 12 , wherein said curved drain finger electrode end has a radius of curvature for reducing a termination electric field at said curved drain finger electrode end.
14. The transistor of claim 13 , wherein said radius of curvature of said curved drain finger electrode end is greater than half of a width of said drain finger electrode beginning of said drain finger electrode.
15. The transistor of claim 12 , wherein a width of said curved drain finger electrode end is greater than a width of said drain finger electrode beginning of said drain finger electrode.
16. The transistor of claim 12 , wherein said curved drain finger electrode end has a major axis longer than and perpendicular to a minor axis, and wherein said major axis is substantially aligned with said drain finger electrode.
17. The transistor of claim 12 , wherein said curved drain finger electrode end is substantially an ellipsoid.
18. The transistor of claim 17 , wherein a major axis of said ellipsoid is substantially aligned with said drain finger electrode.
19. The transistor of claim 12 , wherein a source-to-drain half-pitch of said transistor is substantially constant from said source finger electrode beginning to said source finger electrode end.
20. The transistor of claim 12 , wherein a length of said drain finger electrode is greater than said length of said source finger electrode.
21. The transistor of claim 12 , wherein said transistor comprises a group III-V high electron mobility transistor (group III-V HEMT).
22. The transistor of claim 12 , wherein said drain finger electrode is a tapered drain finger electrode.