System and method for scan chain re-ordering
View Patent ↗A system for re-ordering a scan chain of an electronic circuit design using an electronic design automation (EDA) tool includes a processor and a memory in communication with the processor. The scan chain includes a plurality of scan cells. All connections of the scan chain are disconnected. An output port of a first scan cell is connected to input ports of other scan cells to form a first set of scan cell combinations. A first scan cell combination is selected from the first set of scan cell combinations based on weighted averages of ordering parameters of each of the first set of scan cell combinations. The process is repeated to re-order the scan chain.
1. An electronic design automation (EDA) tool for selecting a first scan cell combination from a plurality of scan cells in a scan chain of an electronic circuit design for re-ordering the scan chain, the EDA tool comprising:
a timing placement tool that provides a plurality of ordering parameters corresponding to each combination of two scan cells of the plurality of scan cells;
a memory that stores the electronic circuit design; and
a processor in communication with the memory, wherein the processor is configured for:
disconnecting a first plurality of connections between the plurality of scan cells;
identifying a first scan cell from the plurality of scan cells, wherein the first scan cell is at least one of a scan cell that receives a test input signal from an external test apparatus and a scan cell that provides an output signal to the external test apparatus;
connecting the first scan cell with each of the plurality of scan cells to form a first plurality of scan cell combinations;
determining a plurality of ordering parameters corresponding to each of the first plurality of scan cell combinations using the timing placement tool;
determining at least one weighted average of the plurality of ordering parameters corresponding to each of the first plurality of scan cell combinations;
arranging the first plurality of scan cell combinations based on the at least one weighted average; and
selecting the first scan cell combination based on a predetermined priority of the plurality of ordering parameters.
2. The EDA tool of claim 1 , wherein the first scan cell combination includes the first scan cell and a second scan cell.
3. The EDA tool of claim 2 , wherein the processor further performs the step of re-ordering the first and second scan cells by selecting the first scan cell combination.
4. The EDA tool of claim 3 , wherein the processor further performs the step of disconnecting a second plurality of connections between the first plurality of scan cell combinations excluding the first scan cell combination.
5. The EDA tool of claim 4 , wherein the processor further performs the step of connecting the second scan cell with each of the plurality of scan cells to form a second plurality of scan cell combinations.
6. The EDA tool of claim 2 , wherein the processor further performs the step of selecting the first scan cell combination based on a length threshold, a clock skew threshold, and a slack threshold.
7. The EDA tool of claim 3 , wherein the length threshold, the clock skew threshold, and the slack threshold correspond to maximum values for the net-length, the clock skew, and the slack, respectively.
8. The EDA tool of claim 1 , wherein the plurality of ordering parameters includes at least one of clock skew, slack, and net-length corresponding to each of the plurality of scan cell combinations.
9. The EDA tool of claim 1 , wherein the processor further performs the step of constructing the first plurality of scan cell combinations by iteratively connecting the first scan cell to each of the plurality of scan cell combinations and determining a plurality of ordering parameters corresponding to each iterative connection of the first scan cell with each of the plurality of scan cells after each iterative connection of the first scan cell with each of the plurality of scan cells.
10. The EDA tool of claim 1 , wherein, the processor selects the first scan cell combination using a brute force algorithm.
11. A method for selecting a first scan cell combination from a plurality of scan cells in a scan chain of an electronic circuit design for re-ordering the scan chain using an electronic design automation (EDA) tool executing on a processor, wherein the electronic design automation tool includes a timing placement tool and a memory for storing the electronic circuit design, the method comprising:
disconnecting a first plurality of connections between the plurality of scan cells;
identifying a first scan cell from the plurality of scan cells, wherein the first scan cell is at least one of a scan cell that receives a test input signal from an external test apparatus and a scan cell that provides an output signal to the external test apparatus;
connecting the first scan cell with each of the plurality of scan cells to form a first plurality of scan cell combinations;
determining a plurality of ordering parameters corresponding to each of the first plurality of scan cell combinations using the timing placement tool;
determining at least one weighted average of the plurality of ordering parameters corresponding to each of the first plurality of scan cell combinations;
arranging the first plurality of scan cell combinations based on the at least one weighted average; and
selecting the first scan cell combination based on a predetermined priority of the plurality of ordering parameters.
12. The method of claim 11 , wherein the first scan cell combination includes the first scan cell and a second scan cell.
13. The method of claim 12 , wherein the first and second scan cells are re-ordered by selecting the first scan cell combination.
14. The method of claim 13 , further comprising disconnecting a second plurality of connections between the first plurality of scan cell combinations excluding the first scan cell combination.
15. The method of claim 14 , further comprising connecting the second scan cell with each of the plurality of scan cells to form a second plurality of scan cell combinations.
16. The method of claim 11 , wherein the plurality of ordering parameters includes at least one of clock skew, slack, and net-length corresponding to each of the plurality of scan cell combinations.
17. The method of claim 16 , wherein the first scan cell combination is selected based on a length threshold, a clock skew threshold, and a slack threshold.
18. The method of claim 17 , wherein the length threshold, the clock skew threshold, and the slack threshold correspond to maximum values for the net-length, the clock skew, and the slack, respectively.
19. The method of claim 11 , wherein the first plurality of scan cell combinations is constructed by iteratively connecting the first scan cell to each of the plurality of scan cell combinations and determining a plurality of ordering parameters corresponding to each iterative connection of the first scan cell with each of the plurality of scan cells after each iterative connection of the first scan cell with each of the plurality of scan cells.
20. The method of claim 11 , wherein the first scan cell combination is selected using a brute force algorithm.