IP Library › Granted Patent US 8,907,454
Granted Patent B2
US 8,907,454 · App. 13/763,798 · Granted Dec 9, 2014

Transistor with heat sink joined to only part of one electrode

Inventors: Yoshinobu Sasaki (Tokyo, JP); Hitoshi Kurusu (Tokyo, JP)
Assignee: Mitsubishi Electric Corporation
H01L27/04H01L29/73
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Quick Facts
Patent No.
US 8,907,454
App. No.
13/763,798
Granted
Dec 9, 2014
Kind
B2
Abstract

A transistor includes: a semiconductor substrate; a first electrode on the semiconductor substrate and having first and second portions; a second electrode on the semiconductor substrate and spaced apart from the first electrode; a control electrode on the semiconductor substrate and disposed between the first electrode and the second electrode; and a first heat sink plate joined to the second portion of the first electrode without being joined to the first portion of the first electrode.

Claims (37)

1. A transistor comprising:

a semiconductor substrate;

a first electrode on the semiconductor substrate and having first and second portions;

a second electrode on the semiconductor substrate and spaced apart from the first electrode;

a control electrode on the semiconductor substrate and disposed between the first electrode and the second electrode;

a first heat sink plate joined to the second portion of the first electrode without being joined to the first portion of the first electrode; and

a first resistor located between the first portion of the first electrode and the second portion of the first electrode.

2. The transistor according to claim 1 , wherein the first heat sink plate is joined to the semiconductor substrate outside a region where the first electrode, the second electrode, and the control electrode are present.

3. The transistor according to claim 1 , wherein the first portion of the first electrode is located at an end portion of the first electrode.

4. A transistor comprising:

a semiconductor substrate;

a first electrode on the semiconductor substrate and having first and second portions;

a second electrode on the semiconductor substrate and spaced apart from the first electrode;

a control electrode on the semiconductor substrate and disposed between the first electrode and the second electrode; and

a first heat sink plate joined to the second portion of the first electrode without being joined to the first portion of the first electrode, wherein

the control electrode includes a first portion opposite the first portion of the first electrode, and a second portion opposite the second portion of the first electrode, and

the transistor further comprises a second resistor located between the first portion of the control electrode and the second portion of the control electrode.

5. The transistor according to claim 4 , wherein the first heat sink plate is joined to the semiconductor substrate outside a region where the first electrode, the second electrode, and the control electrode are present.

6. The transistor according to claim 4 , wherein the first portion of the first electrode is located at an end portion of the first electrode.

7. A transistor comprising:

a semiconductor substrate;

a first electrode on the semiconductor substrate and having first and second portions;

a second electrode on the semiconductor substrate and spaced apart from the first electrode;

a control electrode on the semiconductor substrate and disposed between the first electrode and the second electrode;

a first heat sink plate joined to the second portion of the first electrode without being joined to the first portion of the first electrode; and

a second heat sink plate joined to the first portion of the first electrode without being joined to the second portion of the first electrode, and heat-releasing performance of the second heat sink plate is lower than heat-releasing performance of the first heat sink plate.

8. The transistor according to claim 7 , wherein the first heat sink plate is joined to the semiconductor substrate outside a region where the first electrode, the second electrode, and the control electrode are present.

9. The transistor according to claim 7 , wherein the first portion of the first electrode is located at an end portion of the first electrode.

10. A transistor comprising:

a semiconductor substrate;

a first electrode on the semiconductor substrate and having first and second portions;

a second electrode on the semiconductor substrate and spaced apart from the first electrode;

a control electrode on the semiconductor substrate and disposed between the first electrode and the second electrode;

a first heat sink plate joined to the second portion of the first electrode without being joined to the first portion of the first electrode; and

a high-thermal-resistance film located between the first portion of the first electrode and the first heat sink plate and having a thermal resistance higher than thermal resistances of the first electrode and the first heat sink plate.

11. The transistor according to claim 10 , wherein the first heat sink plate is joined to the semiconductor substrate outside a region where the first electrode, the second electrode, and the control electrode are present.

12. The transistor according to claim 10 , wherein the first portion of the first electrode is located at an end portion of the first electrode.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2017
From: MITSUBISHI ELECTRIC CORPORATION
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 040839/0688 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2013
From: SASAKI, YOSHINOBU; KURUSU, HITOSHI
To: MITSUBISHI ELECTRIC CORPORATION
Reel/Frame 030140/0556 →
Priority Claims (1)
JP 2012-085642 · Apr 4, 2012 · national
Continuity (1)
Related Publication 20130264682A1 · Oct 10, 2013