IP Library › Granted Patent US 8,890,263
Granted Patent B2
US 8,890,263 · App. 13/776,948 · Granted Nov 18, 2014

Semiconductor device

Inventor: Takuji Yamamura (Kanagawa-ken, JP)
Assignee: Kabushiki Kaisha Toshiba
H01L29/78H01L29/1608H01L29/4175H01L29/772H01L29/20H01L29/42316H01L29/402H01L29/41758H01L29/778H01L29/2003H01L29/7787
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Quick Facts
Patent No.
US 8,890,263
App. No.
13/776,948
Granted
Nov 18, 2014
Kind
B2
Abstract

A semiconductor device has a shield plate electrode short-circuited to a source electrode near the drain electrode. The shield plate electrode is connected to the source terminal electrode which has a VIA hole via the first line of air-bridge structure or overlay structure.

Claims (39)

1. A semiconductor device, comprising:

a substrate;

a gate electrode, which is arranged on a first surface of the substrate and has a plurality of gate finger electrodes;

a source electrode, which is arranged on the first surface of the substrate and has a plurality of source finger electrodes, and one of the plurality of source finger electrodes is close to one of the plurality of gate finger electrodes;

a drain electrode, which is arranged on the first surface of the substrate and has a plurality of drain finger electrodes, and one of the plurality of drain finger electrodes faces the one of the plurality of source finger electrodes via the one of the plurality of gate finger electrodes;

a gate terminal electrode, which is arranged on the first surface of the substrate and is connected to the gate electrode;

a source terminal electrode, which is arranged on the first surface of the substrate and is connected to the source electrode;

a drain terminal electrode, which is arranged on the first surface of the substrate and is connected to the drain electrode;

an insulating layer, which is arranged so as to cover the one of the plurality of gate finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of source finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, at least a part of the one of the plurality of source finger electrodes, and at least a part of the one of the plurality of drain finger electrodes;

a shield plate electrode, which is arranged via the insulating layer over the one of the plurality of drain finger electrodes and the first surface of the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, is short-circuited to the one of the plurality of source finger electrodes, and shields electrically the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes from each other;

a first line, which connects the shield plate electrode and the source terminal electrode by an air-bridge structure or an overlay structure; and

a shield plate short circuit line, which short-circuits the shield plate electrode and the one of the plurality of source finger electrodes;

wherein the shield plate short circuit line overlaps with the one of the pluralityof gate finger electrodes, and

wherein the shield plate short circuit line is arranged via an air gap over the one of the plurality of gate finger electrodes.

2. A semiconductor device, comprising:

a substrate;

a gate electrode, which is arranged on a first surface of the substrate and has a plurality of gate finger electrodes;

a source electrode, which is arranged on the first surface of the substrate and has a plurality of source finger electrodes, and one of the plurality of source finger electrodes is close to one of the plurality of gate finger electrodes;

a drain electrode, which is arranged on the first surface of the substrate and has a plurality of drain finger electrodes, and one of the plurality of drain finger electrodes faces the one of the plurality of source finger electrodes via the one of the plurality of gate finger electrodes;

a gate terminal electrode, which is arranged on the first surface of the substrate and is connected to the gate electrode;

a source terminal electrode, which is arranged on the first surface of the substrate and is connected to the source electrode;

a drain terminal electrode, which is arranged on the first surface of the substrate and is connected to the drain electrode;

an insulating layer, which is arranged so as to cover the one of the plurality of gate finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of source finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, at least a part of the one of the plurality of source finger electrodes, and at least a part of the one of the plurality of drain finger electrodes;

a shield plate electrode, which is arranged via the insulating layer over the one of the plurality of drain finger electrodes and the first surface of the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, is short-circuited to the one of the plurality of source finger electrodes, and shields electrically the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes from each other; and

a first line, which connects the shield plate electrode and the source terminal electrode by an air-bridge structure or an overlay structure,

wherein the first line connects the shield plate electrode and the source terminal electrode by the air bridge structure.

3. A semiconductor device, comprising:

a substrate;

a gate electrode which, is arranged on a first surface of the substrate and has a plurality of gate finger electrodes;

a source electrode, which is arranged on the first surface of the substrate and has a plurality of source finger electrodes, and one of the plurality of source finger electrodes is close to one of the pluralityof gate finger electrodes;

a drain electrode, which is arranged on the first surface of the substrate and has a plurality of drain finger electrodes, and one of the plurality of drain finger electrodes faces the one of the plurality of source finger electrodes via the one of the plurality of gate finger electrodes;

a gate terminal electrode, which is arranged on the first surface of the substrate and is connected to the gate electrode;

a source terminal electrode, which is arranged on the first surface of the substrate and is connected to the source electrode;

a drain terminal electrode, which is arranged on the first surface of the substrate and is connected to the drain electrode;

an insulating layer, which is arranged so as to cover the one of the plurality of gate finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of source finger electrodes, the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, at least a part of the one of the plurality of source finger electrodes, and at least a part of the one of the plurality of drain finger electrodes;

a shield plate electrode, which is arranged via the insulating layer over the one of the plurality of drain finger electrodes and the first surface of the substrate between the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes, is short-circuited to the one of the plurality of source finger electrodes, and shields electrically the one of the plurality of gate finger electrodes and the one of the plurality of drain finger electrodes from each other;

a first line, which connects the shield plate electrode and the source terminal electrode by an air-bridge structure or an overlay structure; and

a second line, which connects the plurality of source finger electrodes and the source terminal electrode,

wherein a second line connects the plurality of source finger electrodes and the source terminal electrode by the air-bridge structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 26, 2013
From: YAMAMURA, TAKUJI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 029876/0509 →
Priority Claims (1)
JP 2012-046458 · Mar 2, 2012 · national
Continuity (1)
Related Publication 20130228789A1 · Sep 5, 2013