Memory module and a memory test system for testing the same
A memory module includes a first rank, a second rank and a test control unit. The first rank includes a plurality of semiconductor memory devices configured to operate in response to a first chip selection signal. The second rank includes a plurality of semiconductor memory devices configured to operate in response to a second chip selection signal. The test control unit is configured to simultaneously enable the first and second chip selection signals to test the first and second ranks in a test mode.
1. A memory module, comprising:
a first rank which comprises a plurality of semiconductor memory devices configured to operate in response to a first chip selection signal;
a second rank which comprises a plurality of semiconductor memory devices configured to operate in response to a second chip selection signal; and
a test control unit configured to receive first and second rank selection signals respectively corresponding to the first and second ranks from an external source,
wherein the test control unit is configured to simultaneously enable the first and second chip selection signals to test the first and second ranks in a test mode in response to the first rank selection signal which is enabled.
2. The memory module of claim 1 , wherein the test control unit includes a memory buffer or a register clock driver, and the memory module is a registered dual in-line memory module.
3. The memory module of claim 1 , wherein the test control unit is configured to receive a command signal through a plurality of lines from the external source and is put in the test mode or released from the test mode in response to the command signal.
4. The memory module of claim 1 , wherein the test control unit comprises a test mode terminal and is put in the test mode in response to a signal received through the test mode terminal.
5. The memory module of claim 1 , wherein if the test control unit is in the test mode, the test control unit is configured to output the first and second chip selection signals which have the same logic level as the first rank selection signal.
6. The memory module of claim 1 , wherein if the test control unit is in the test mode, the test control unit is configured to simultaneously enable the first and second chip selection signals when the first and second rank selection signals are simultaneously enabled.
7. The memory module of claim 1 , wherein the semiconductor memory devices include dynamic random access memories.
8. A memory test system, comprising:
at least one socket configured to be connected with a memory module comprising first and second ranks;
a memory controller configured to output first and second rank selection signals respectively corresponding to the first and second ranks and control the memory module; and
a processing unit configured to determine whether to place the memory module in a test mode and, if the memory module is placed in the test mode, the processing unit is configured to recognize the first and second ranks as a single rank and simultaneously tea the first and second ranks by outputting the first rank selection signal which is enabled.
9. The memory test system of claim 8 , wherein the processing unit is configured to perform a basic input/output system (BIOS) and determine whether to place the memory module in the test mode by performing the BIOS.
10. The memory test system of claim 8 , wherein the processing unit comprises a general-purpose terminal and is configured to determine whether to place the memory module in the test mode in response to a signal received through the general-purpose terminal.
11. The memory test system of claim 8 , further comprising:
an input/output (IO) device controller configured to control an input device through which a user inputs a command,
wherein the processing unit is configured to determine whether to place the memory module in the test mode in response to a signal received through the IO device controller.
12. The memory test system of claim 8 , wherein if the memory module is in the test mode, the memory controller is configured to output the first and second rank selection signals at the same time.
13. The memory test system of claim 8 , wherein the memory controller and the processing unit are disposed on a semiconductor chip.
14. The memory test system of claim 8 , further comprising a test control unit which is connected to the memory controller and the at least one socket,
wherein the memory module includes a small outline dual in-line memory module or an unbuffered dual in-line memory module, and the test control unit is configured to output a control signal simultaneously selecting the first and second ranks if the test control unit is in the test mode.
15. A memory module, comprising:
a plurality of ranks, each rank including a plurality of semiconductor memory devices; and
a test control unit configured to receive a plurality of rank selection signals respectively corresponding to the plurality of ranks from an external source,
wherein the test control unit is configured to test the ranks as a single rank in a test mode in response to one of the plurality of rank selection signals.
16. The memory module of claim 15 , wherein the test control unit is configured to simultaneously test the ranks.
17. The memory module of claim 16 , wherein the test control unit is configured to provide enabled chip selection signals to each of the ranks.
18. The memory module of claim 15 , wherein the test control unit is configured to be placed in a test mode to test the ranks.
19. The memory module of claim 15 , wherein the semiconductor memory devices include volatile memory devices.