IP Library › Granted Patent US 9,178,022
Granted Patent B2
US 9,178,022 · App. 13/809,993 · Granted Nov 3, 2015

Precursor composition and method for forming amorphous conductive oxide film

Inventors: Tatsuya Shimoda (Nomi, JP); Jinwang Li (Kanazawa, JP)
Assignee: JAPAN SCIENCE AND TECHNOLOGY AGENCY
H01L29/2206C01G55/00C01G55/002H01B1/08H01L29/4908C01P2002/72C01P2006/40H01L21/02422H01L21/02565H01L21/02592H01L21/02628H01L29/7869
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Quick Facts
Patent No.
US 9,178,022
App. No.
13/809,993
Granted
Nov 3, 2015
Kind
B2
Abstract

The present invention provides a precursor composition for forming a conductive oxide film having high conductivity and a stable amorphous structure maintained even after heated at high temperature by a simple liquid phase process. The precursor composition of the present invention contains at least one selected from the group consisting of carboxylates, nitrates and sulfates of lanthanoids (but, except for cerium); at least one selected from the group consisting of carboxylates, nitrosyl carboxylates, nitrosyl nitrates and nitrosyl sulfates of ruthenium, iridium or rhodium; and a solvent containing at least one selected from the group consisting of carboxylic acids, alcohols and ketones.

Claims (18)

1. A composition comprising:

at least one selected from the group consisting of carboxylates, nitrates and sulfates of lanthanoids except for cerium,

at least one selected from the group consisting of carboxylates, nitrosyl carboxylates, nitrosyl nitrates and nitrosyl sulfates of ruthenium, iridium or rhodium, and

a solvent comprising at least one selected from the group consisting of carboxylic acids, alcohols and ketones,

wherein a ratio (N A /N B ) of a number of atoms of the lanthanoid (N A ) and a number of atoms of ruthenium, iridium or rhodium (N B ) in the composition is 0.6 to 2.0.

2. The composition according to claim 1 , wherein the solvent is a non-aqueous solvent.

3. The composition according to claim 1 or 2 , wherein the ratio (N A /N B ) of a number of atoms of the lanthanoid (N A ) and a number of atoms of ruthenium, iridium or rhodium (N B ) in the composition is 0.7 to 1.5.

4. The composition according to claim 1 or 2 , wherein the lanthanoid is at least one selected from the group consisting of lanthanum, praseodymium, neodymium, samarium, europium and gadolinium.

5. A method of forming an amorphous conductive oxide film, comprising applying the composition according to claim 1 or 2 on a substrate to form a coated film, and heating the coated film under an oxidizing atmosphere.

6. An amorphous conductive oxide film formed by the method according to claim 5 .

7. The amorphous conductive oxide film according to claim 6 , which has p-type semiconductivity.

8. A method of forming a patterned amorphous conductive oxide film, comprising:

applying the composition according to claim 1 or 2 on a substrate to form a coated film,

placing a patterned mold on the coated film such that the coated film is sandwiched between the substrate and the patterned mold, and

heating the coated film under an oxidizing atmosphere.

9. A patterned amorphous conductive oxide film formed by the method according to claim 8 .

10. The patterned amorphous conductive oxide film according to claim 9 , which has p-type semiconductivity.

11. The composition according to claim 1 or 2 , wherein the ratio (N A /N B ) of a number of atoms of the lanthanoid (N A ) and a number of atoms of ruthenium, iridium or rhodium (N B ) in the composition is 0.8 to 1.3.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 16, 2013
From: SHIMODA, TATSUYA; LI, JINWANG
To: JAPAN SCIENCE AND TECHNOLOGY AGENCY
Reel/Frame 029638/0743 →
Priority Claims (1)
JP 2010-159475 · Jul 14, 2010 · national
Continuity (1)
Related Publication 20130112973A1 · May 9, 2013