IP Library Granted Patent US 8,832,629
Granted Patent B2
US 8,832,629 · App. 13/811,400 · Granted Sep 9, 2014

Method for optimising cell variant selection within a design process for an integrated circuit device

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Quick Facts
Patent No.
US 8,832,629
App. No.
13/811,400
Granted
Sep 9, 2014
Kind
B2
Abstract

A method is provided for optimising cell variant selection within a design process for an integrated circuit device. The method comprises performing cell placement and signal routing for an integrated circuit being designed using default cell layout information for cell variants of at least one cell type. The method further comprises performing cell variant optimization comprising identifying at least one cell of the at least one cell type to be substituted and substituting a default cell variant of the at least one identified cell with an alternative variant of the at least one identified cell. The method further comprises, during cell optimization, configuring a pin interconnect modification for mapping at least one pin location of the alternative variant of the at least one identified cell to at least one pin contact for the default cell layout.

Claims (29)

1. A method of generating a design for an integrated circuit device, the method comprising:

performing, using a computer, cell placement and signal routing for the integrated circuit device being designed using default cell layout information for cell variants of at least one cell type; and

performing cell variant optimization, wherein cell variant optimization comprises:

identifying at least one cell of the at least one cell type to be substituted,

substituting a default cell variant of the at least one identified cell with an alternative variant of the at least one identified cell, and

during said performing cell variant optimisation, configuring a pin interconnect layout modification for mapping physical layout of at least one pin location of the alternative variant of the at least one identified cell to at least one pin contact for the default cell layout.

2. The method of claim 1 wherein the method further comprises:

defining within at least one cell definition library a pin interconnect layout modification relative to the default cell layout for at least one variant of the at least one cell type; and

during said performing cell variant optimisation, configuring the pin interconnect layout modification for the alternative variant of the at least one identified cell as defined within the at least one cell definition library.

3. The method of claim 2 wherein the method comprises defining, within at least one cell definition library, cell layout information for the default cell variant and at least one alternative cell variant of the at least one cell type, the cell layout information comprising pin interconnect layout modification information for the at least one alternative cell variant.

4. The method of claim 2 wherein the method comprises defining, within at least one cell definition library, cell layout information for the default cell variant, and further defining, within the at least one cell definition library, a pin interconnect layout modification relative to the default cell layout for each alternative cell variant.

5. The method of claim 1 wherein the method comprises defining, within the at least one cell definition library, cell timing information for the default variant of the at least one cell type and a timing delta value for the at least one alternative variant of the at least one cell type.

6. The method of claim 1 wherein configuring a pin interconnect layout modification comprises configuring at least one connecting strip within a metal layer of the integrated circuit device between at least one pin contact of an alternative cell variant and at least one corresponding pin location within the respective default cell layout.

7. The method of claim 6 wherein configuring a pin interconnect layout modification comprises configuring at least one connecting strip within a metal layer of the integrated circuit device adjacent a polysilicon structure of the cell.

8. The method of claim 1 , further including manufacturing the integrated circuit in accordance with the design.

9. An integrated circuit device created by way of a process comprising the method for optimising cell variant selection of claim 1 .

10. A non-transitory computer-readable storage medium having executable program code stored therein for optimising cell variant selection within a design process for an integrated circuit device, the program code operable for:

performing cell placement and signal routing for an integrated circuit being designed using default cell layout information for cell variants of at least one cell type; and

performing cell variant optimization, wherein cell variant optimization comprises identifying at least one cell of the at least one cell type to be substituted,

substituting a default cell variant of the at least one identified cell with an alternative variant of the at least one identified cell, and

during said performing cell variant optimisation, configuring a pin interconnect layout modification for mapping physical layout of at least one pin location of the alternative variant of the at least one identified cell to at least one pin contact for the default cell layout.

11. The computer readable storage medium of claim 10 , wherein the program code is further operable for:

defining within at least one cell definition library a pin interconnect layout modification relative to the default cell layout for at least one variant of the at least one cell type; and

during said performing cell variant optimisation, configuring the pin interconnect layout modification for the alternative variant of the at least one identified cell as defined within the at least one cell definition library.

12. The computer readable storage medium of claim 11 wherein the program code is further operable for defining, within at least one cell definition library, cell layout information for the default cell variant and at least one alternative cell variant of the at least one cell type, the cell layout information comprising pin interconnect layout modification information for the at least one alternative cell variant.

13. The computer readable storage medium of claim 11 wherein the program code is further operable for defining, within at least one cell definition library, cell layout information for the default cell variant, and further defining, within the at least one cell definition library, a pin interconnect layout modification relative to the default cell layout for each alternative cell variant.

14. The computer readable storage medium of claim 10 wherein the program code is further operable for defining, within the at least one cell definition library, cell timing information for the default variant of the at least one cell type and a timing delta value for the at least one alternative variant of the at least one cell type.

15. The computer readable storage medium of claim 10 wherein the program code operable to configure a pin interconnect layout modification comprises further program code operable for configuring at least one connecting strip within a metal layer of the integrated circuit device between at least one pin contact of an alternative cell variant and at least one corresponding pin location within the respective default cell layout.

16. The computer readable storage medium of claim 15 wherein the program code operable to configure a pin interconnect layout modification comprises further program code operable for configuring at least one connecting strip within a metal layer of the integrated circuit device adjacent a polysilicon structure of the cell.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040652 FRAME: 0241. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Jan 5, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
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ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
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SECURITY AGREEMENT Recorded Nov 6, 2013
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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SECURITY AGREEMENT Recorded Jun 18, 2013
From: FREESCALE SEMICONDUCTOR, INC.
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SUPPLEMENT TO IP SECURITY AGREEMENT Recorded May 20, 2013
From: FREESCALE SEMICONDUCTOR, INC.
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From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2013
From: ROZEN, ANTON; PRIEL, MICHAEL; SEIDENWAR, YAAKOV
To: FREESCALE SEMICONDUCTOR INC
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