IP Library Granted Patent US 9,316,675
Granted Patent B2
US 9,316,675 · App. 13/826,571 · Granted Apr 19, 2016

Secondary plasma detection systems and methods

Inventors: Jesse N. Klein (West Henrietta, NY); Richard Pham (San Jose, CA)
Assignee: MKS Instruments, Inc.
G01R31/00H01J37/32H01J37/32183H01J37/32935
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Quick Facts
Patent No.
US 9,316,675
App. No.
13/826,571
Granted
Apr 19, 2016
Kind
B2
Abstract

A system includes a control module, a detection module, and a reaction module. The control module is configured to receive a sensor signal indicating a power characteristic of an output power provided from a power generator to a load. The load is separate from the control module and the power generator. The detection module is configured to (i) detect a shift parameter of the power characteristic based on the sensor signal, (ii) compare the shift parameter to a first threshold, and (iii) indicate whether the shift parameter has exceeded the first threshold and not a second threshold. The reaction module is configured to indicate that a low-level abnormality exists in the load in response to the shift parameter exceeding the first threshold and not the second threshold.

Claims (63)

1. A system comprising:

a control module configured to receive a sensor signal indicating a power characteristic of an output power provided from a power generator to a load, wherein the load is separate from the control module and the power generator;

a detection module configured to (i) detect a shift parameter of the power characteristic based on the sensor signal, and (ii) indicate whether the shift parameter has exceeded a threshold associated with a secondary plasma in the load; and

a reaction module configured to indicate that a low-level abnormality exists in the load in response to the shift parameter exceeding the threshold.

2. The system of claim 1 , wherein the shift parameter is a shift in the power characteristic or a shift percentage of the power characteristic.

3. The system of claim 1 , wherein the power characteristic is an impedance detected at an output of the power generator or downstream from the power generator.

4. The system of claim 1 , wherein:

the load is a plasma chamber; and

the power characteristic changes based on voltage and current supplied to electrodes in the plasma chamber.

5. The system of claim 1 , wherein the second threshold corresponds to a low-impedance arc event.

6. The system of claim 1 , wherein in the power generator is one of a radio frequency power generator, a direct current power generator, and an alternating current power generator.

7. The system of claim 1 , wherein:

the low-level abnormality corresponds to secondary plasma in the load; and

the secondary plasma is not located within an area between electrodes of the load.

8. The system of claim 1 , wherein the low-level abnormality includes a diversion in current from an electrode in the load to secondary plasma in the load.

9. The system of claim 1 , further comprising:

a power module configured to determine whether output power of the power generator is enabled and generate a power signal; and

a stability module configured to determine whether the power characteristic is stable during a first state and based on the power signal,

wherein the detection module is configured to detect the shift parameter during a second state and subsequent to the stability module indicating that the power characteristic is stable.

10. The system of claim 9 , wherein:

the control module is configured to transition from the second state to the first state in response to a change in a setpoint of the power generator; and

subsequent to the change in the setpoint,

the detection module is configured to temporarily cease monitoring the power characteristic, and

the stability module is configured to redetermine whether the power characteristic is stable.

11. The system of claim 1 , wherein the detection module is configured to (i) monitor a length of time in which a shift in the power characteristic occurred, and (ii) detect the low-level abnormality based on the length of time.

12. The system of claim 1 , wherein the detection module is configured to monitor a speed at which a shift in the power characteristic occurred, and (ii) detect the low-level abnormality based on the speed.

13. The system of claim 1 , further comprising a stability module configured to (i) obtain samples of the power characteristic, (ii) determine whether the samples are at least one of equal to each other and within a predetermined range of each other, and (iii) determine a baseline based on the samples being at least one of equal to each other and within the predetermined range of each other,

wherein the detection module is configured to detect the shift parameter based on the baseline.

14. The system of claim 1 , further comprising a stability module configured to (i) obtain samples of the power characteristic for a predetermined period, and (ii) determine a baseline based on a last predetermined number of the samples,

wherein the detection module is configured to detect the shift parameter based on the baseline.

15. The system of claim 1 , further comprising a stability module configured to determine an expected value of the power characteristic,

wherein the detection module is configured to detect the shift parameter based on the expected value.

16. The system of claim 1 , wherein the reaction module is configured to (i) perform a first series of tasks in response to the detection of the low-level abnormality, and (ii) perform a second series of tasks in response to detecting a high-level abnormality in the load,

wherein current drawn from the power generator due to the low-level abnormality is less than current drawn from the power generator due to the high-level abnormality.

17. The system of claim 1 , wherein the reaction module is configured to adjust a setpoint corresponding to the output power in response to the detection of the low-level abnormality to clear the low-level abnormality.

18. The system of claim 17 , wherein the reaction module is configured to maintain output power in an ON state in response to the detection of the low-level abnormality.

19. The system of claim 1 , wherein the reaction module is configured to determine whether to disable the output power in response to the detection of the low-level abnormality.

20. The system of claim 1 , wherein the reaction module is configured to adjust the power characteristic in response to the detection of the low-level abnormality to clear the low-level abnormality.

21. A power generator comprising:

the system of claim 1 ; and

a generator circuit configured to generate the output power to power the load and supply the output power from the power generator to the load.

22. A power generator system comprising:

the power generator of claim 21 ;

the load; and

a host control module configured to control operation of the power generator and the load.

23. The power generator system of claim 22 , wherein:

the reaction module is configured to transmit a warning signal to the host control module;

the warning signal indicates detection of the low-level abnormality; and

the host control module is configured to adjust a setpoint of the generator circuit in response to the warning signal.

24. A power generator comprising:

a generator circuit configured to generate an output power to power a plasma chamber and supply the output power from the power generator to the plasma chamber;

a control module configured to receive a sensor signal indicating a power characteristic of the output power provided from the generator circuit to the plasma chamber;

a detection module configured to (i) detect a shift parameter of the power characteristic based on the sensor signal, and (ii) indicate whether the shift parameter has exceeded a threshold associated with secondary plasma in the plasma chamber; and

a reaction module configured to indicate that a low-level abnormality exists in the plasma chamber in response to the shift parameter exceeding the threshold.

25. The system of claim 1 wherein the threshold is further defined as a first threshold and the detection module is further configured to compare the shift parameter to the first threshold, and indicate whether the shift parameter has exceeded the first threshold and not a second threshold.

26. The system of claim 25 , wherein:

a high-level abnormality exists in the load when the shift parameter exceeds the second threshold; and

current drawn by the load from the power generator is greater due to the high-level abnormality than current drawn by the load due to the low-level abnormality.

27. The system of claim 26 , wherein the high-level abnormality includes a short.

28. The system of claim 25 , wherein the shift detection module is configured to:

detect a high-level abnormality in the load based on the sensor signal;

detect the high-level abnormality in the load when the shift parameter exceeds the second threshold; and

a magnitude of the first threshold is less than a magnitude of the second threshold.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 18, 2013
From: KLEIN, JESSE N; PHAM, RICHARD
To: MKS INSTRUMENTS, INC.
Reel/Frame 030243/0491 →
Continuity (2)
Provisional Application 61697518 · Sep 6, 2012
Related Publication 20140062305A1 · Mar 6, 2014