Method and apparatus to control the effective gain of a statistically calibrated analog to digital converter
View Patent ↗A method and apparatus for controlling the effective gain of an ADC when the ADC is occasionally or continuously calibrated using the statistics of the input signal and when the statistics are not stationary.
1. A method of controlling an analog to digital converter (ADC), the ADC receiving an input signal, the ADC having a set of threshold levels, the set of threshold levels being controlled by a pre-defined ADC calibration procedure responsive to a level of an input signal provided to the ADC, the method comprising:
a) calculating, as a function of the threshold levels, a metric of the ADC to obtain a calculated metric;
b) comparing the calculated metric with a target metric to obtain a comparison value; and
c) adjusting, as a function of the comparison value, the level of the input signal to obtain an adjusted input signal level.
2. The method of claim 1 wherein calculating the metric is preceded by obtaining the threshold levels.
3. The method of claim 1 further comprising, after action b and when there is a previous comparison value, determining if the comparison value is the same as the previous comparison value and, if the comparison value is the same as the previous comparison value, proceeding back to action a, otherwise proceeding to action c.
4. The method of claim 2 wherein:
each threshold level corresponds to a respective voltage level; and
calculating the metric includes modeling the threshold levels as a function of one of some of the voltage levels using a linear regression, and all of the voltage levels using the linear regression.
5. The method of claim 4 wherein the linear regression model has a slope associated thereto, the metric of the ADC being the value of the slope.
6. The method of claim 4 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.
7. The method of claim 6 wherein when the comparison value is positive, adjusting the level of the input signal consists in decreasing the level of the input signal.
8. The method of claim 6 wherein when the comparison value is negative, adjusting the level of the input signal consists in increasing the level of the input signal.
9. A method of controlling a gain of an analog to digital converter (ADC), the ADC receiving an input signal, the ADC having a set of threshold levels, the set of threshold levels being controlled by a pre-defined ADC calibration procedure responsive to a level of an input signal provided to the ADC, the method comprising:
a) calculating, as a function of the threshold levels, a metric of the ADC to obtain a calculated metric;
b) comparing the calculated metric with a target metric to obtain a comparison value, the pre-defined ADC calibration procedure being a function of the target metric; and
c) modifying the target metric in accordance with the comparison value to obtain a modified target metric.
10. The method of claim 9 wherein:
the ADC has references statistics associated thereto;
prior to comparing the calculated metric with a target metric to obtain a comparison value, the target metric is determined in accordance with the reference statistics; and
modifying the target metric includes modifying the reference statistics.
11. The method of claim 9 wherein:
the reference statistics include a complementary cumulative histogram relating a number of events as a function of a set of ADC threshold indices, each ADC threshold index corresponding to a respective threshold level of the set threshold levels; and
modifying the reference statistics includes multiplying the ADC threshold indices by a multiplication factor, the multiplication factor being a function of the comparison value.
12. The method of claim 9 wherein calculating the metric is preceded by obtaining the threshold levels.
13. The method of claim 9 further comprising, after action b, and when there is a previous comparison value, determining if the comparison value is the same as the previous comparison value and, if the comparison value is the same as the previous comparison value, proceeding back to action a, otherwise proceeding to action c.
14. The method of claim 12 wherein:
each threshold level corresponds to a respective voltage level; and
calculating the metric includes modeling the threshold levels as a function of one of some of the voltage levels using a linear regression, and all of the voltage levels using the linear regression.
15. The method of claim 14 wherein the linear regression model has a slope associated thereto, the metric of the ADC being the value of the slope.
16. The method of claim 14 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.
17. The method of claim 10 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.
18. A non-transitory, tangible computer-readable medium having recorded thereon instructions to be carried out by a processor to perform a method of controlling an analog to digital converter (ADC), the ADC receiving an input signal, the ADC having a set of threshold levels, the set of threshold levels being controlled by a pre-defined ADC calibration procedure responsive to a level of an input signal provided to the ADC, the method comprising:
a) calculating, as a function of the threshold levels, a metric of the ADC to obtain a calculated metric;
b) comparing the calculated metric with a target metric to obtain a comparison value; and
c) adjusting, as a function of the comparison value, the level of the input signal to obtain an adjusted input signal level.
19. The non-transitory, tangible computer-readable medium of claim 18 wherein calculating the metric is preceded by obtaining the threshold levels.
20. The non-transitory, tangible computer-readable medium of claim 18 wherein the method further comprises, after action b and when there is a previous comparison value, determining if the comparison value is the same as the previous comparison value and, if the comparison value is the same as the previous comparison value, proceeding back to action a, otherwise proceeding to action c.
21. The non-transitory, tangible computer-readable medium of claim 19 wherein:
each threshold level corresponds to a respective voltage level; and
calculating the metric includes modeling the threshold levels as a function of one of some of the voltage levels using a linear regression, and all of the voltage levels using the linear regression.
22. The non-transitory, tangible computer-readable medium of claim 21 wherein the linear regression model has a slope associated thereto, the metric of the ADC being the value of the slope.
23. The non-transitory, tangible computer-readable medium of claim 19 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.
24. The non-transitory, tangible computer-readable medium of claim 23 wherein when the comparison value is positive, adjusting the level of the input signal consists in decreasing the level of the input signal.
25. The non-transitory, tangible computer-readable medium of claim 23 wherein when the comparison value is negative, adjusting the level of the input signal consists in increasing the level of the input signal.
26. A non-transitory, tangible computer-readable medium having recorded thereon instructions to be carried out by a processor to perform a method of controlling a gain of an analog to digital converter (ADC), the ADC receiving an input signal, the ADC having a set of threshold levels, the set of threshold levels being controlled by a pre-defined ADC calibration procedure responsive to a level of an input signal provided to the ADC, the method comprising:
a) calculating, as a function of the threshold levels, a metric of the ADC to obtain a calculated metric;
b) comparing the calculated metric with a target metric to obtain a comparison value, the pre-defined ADC calibration procedure being a function of the target metric; and
c) modifying the target metric in accordance with the comparison value to obtain a modified target metric.
27. The non-transitory, tangible computer-readable medium of claim 26 wherein:
the ADC has references statistics associated thereto;
prior to comparing the calculated metric with a target metric to obtain a comparison value, the target metric is determined in accordance with the reference statistics; and
modifying the target metric includes modifying the reference statistics.
28. The non-transitory, tangible computer-readable medium of claim 26 wherein:
the reference statistics include a complementary cumulative histogram relating a number of events as a function of a set of ADC threshold indices, each ADC threshold index corresponding to a respective threshold level of the set threshold levels; and
modifying the reference statistics includes multiplying the ADC threshold indices by a multiplication factor, the multiplication factor being a function of the comparison value.
29. The non-transitory, tangible computer-readable medium of claim 26 wherein calculating the metric is preceded by obtaining the threshold levels.
30. The non-transitory, tangible computer-readable medium of claim 26 wherein the method further comprises, after action b, and when there is a previous comparison value, determining if the comparison value is the same as the previous comparison value and, if the comparison value is the same as the previous comparison value, proceeding back to action a, otherwise proceeding to action c.
31. The non-transitory, tangible computer-readable medium of claim 29 wherein:
each threshold level corresponds to a respective voltage level; and
calculating the metric includes modeling the threshold levels as a function of one of some of the voltage levels using a linear regression, and all of the voltage levels using the linear regression.
32. The non-transitory, tangible computer-readable medium of claim 31 wherein the linear regression model has a slope associated thereto, the metric of the ADC being the value of the slope.
33. The non-transitory, tangible computer-readable medium of claim 31 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.
34. The non-transitory, tangible computer-readable medium of claim 27 wherein:
the target metric is a target slope;
the calculated metric is a calculated slope; and
the comparison value is obtained by subtracting the calculated slope from the target slope.