Semiconductor light-emitting device and method for manufacturing same
View Patent ↗According to one embodiment, a semiconductor light-emitting device includes an n-type semiconductor layer including a nitride semiconductor, a p-type semiconductor layer including a nitride semiconductor, a light-emitting portion and a stacked body. The light-emitting portion is provided between the n-type and p-type semiconductor layers and includes a barrier layer and a well layer. The well layer is stacked with the barrier layer. The stacked body is provided between the light-emitting portion and the n-type semiconductor layer and includes a first layer and a second layer. The second layer is stacked with the first layer. Average In composition ratio of the stacked body is higher than 0.4 times average In composition ratio of the light-emitting portion. The layer thickness t b of the barrier layer is 10 nanometers or less.
1. A semiconductor light-emitting device comprising:
an n-type semiconductor layer having a face equivalent to a C-surface and including a nitride semiconductor;
a p-type semiconductor layer including a nitride semiconductor;
a light-emitting portion provided between the n-type semiconductor layer and the p-type semiconductor layer and including:
a barrier layer including In b Ga 1-b N (0≦b<1) and having a layer thickness t b (nanometers); and
a well layer stacked with the barrier layer, including In w Ga 1-w N (0<w<1, b<w), and having a layer thickness t w (nanometers); and
a stacked body provided between the light-emitting portion and the n-type semiconductor layer and including:
a first layer including In x Ga 1-x N (0≦x<1) and having a layer thickness t x (nanometers); and
a second layer stacked with the first layer, including In y Ga 1-y N (0<y≦1, x<y<w), and having a layer thickness t y (nanometers),
an average In composition ratio of the stacked body being higher than 0.4 times and not higher than 0.7 times an average In composition ratio of the light-emitting portion, assuming that the average In composition ratio of the light-emitting portion is (w×t w +b×t b )/(t w +t b ), and the average In composition ratio of the stacked body is (x×t x +y×t y )/(t x +t y ), and
the layer thickness t b of the barrier layer being 10 nanometers or less,
a thickness of the stacked body being equal to or greater than a thickness of the light-emitting portion,
a thickness of the first layer being thicker than 1 nanometer and thinner than 3 nanometers, and
a thickness of the second layer being thicker than 0 nanometer and thinner than 2 nanometers.
2. The device according to claim 1 , wherein
plural ones of the first layer are provided,
plural ones of the second layer are provided, and
the plurality of first layers and the plurality of second layers are alternately stacked.
3. The device according to claim 1 , wherein
plural ones of the barrier layer are provided, and the plurality of barrier layers are stacked with each other, and
plural ones of the well layer are provided, and each of the plurality of well layers is located between the plurality of barrier layers.
4. The device according to claim 1 , wherein the barrier layer containing In has an In composition ratio lower than an In composition ratio of the well layer.
5. The device according to claim 1 , wherein the second layer has an In composition ratio higher than an In composition ratio of the first layer.
6. The device according to claim 1 , wherein the second layer has an In composition ratio lower than an In composition ratio of the well layer.
7. The device according to claim 1 , wherein the first layer has an In composition ratio lower than an In composition ratio of the well layer.
8. The device according to claim 1 , wherein the layer thickness t b of the barrier layer is 5 nanometers or less.
9. The device according to claim 1 , wherein the n-type semiconductor layer grows along an axis equivalent to a c-axis.
10. The device according to claim 1 , wherein the n-type semiconductor layer provided on a substrate has a face equivalent to a C-surface.