IP Library Granted Patent US 9,057,836
Granted Patent B2
US 9,057,836 · App. 13/846,070 · Granted Jun 16, 2015

Infrared absorbing glass wafer and method for producing same

Inventors: Bianca Schreder (Sulzbach, DE); Jochen Freund (Stadecken-Elsheim, DE); Ute Woelfel (Mainz-Laubersheim, DE); Claude Martin (Yverdon-les-Bains, CH); Christophe Baur (Gorier, CH); Steffen Reichesl (Mehlingen, DE); Marc Clement (Mainz, DE)
Assignee: SCHOTT AG
G02B5/226G02B5/208H01L31/0216C03C3/00H01L27/146H01L27/14621
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,057,836
App. No.
13/846,070
Filed
Mar 18, 2013
Granted
Jun 16, 2015
Kind
B2
Art Unit
2816
USPC
257/95
Abstract

A glass wafer is provided that is made of a copper ions containing phosphate or fluorophosphate glass. The glass wafer has a diameter greater than 15 centimeters and a thickness of less than 0.4 millimeters. The glass wafer has two plane-parallel surfaces at least one of which is polished.

Claims (40)

1. A glass wafer comprising:

a copper ions containing phosphate or fluorophosphate glass;

a diameter greater than 15 centimeters and a thickness of less than 0.4 millimeters; and

two plane-parallel surfaces, at least one of the two plane-parallel surfaces being polished, wherein the two plane-parallel surfaces have height modulations in form of waves with a height of less than 200 nanometers based on a length of not more than 1 millimeter.

2. The glass wafer as claimed in claim 1 , wherein the height is less than 130 nanometers.

3. The glass wafer as claimed in claim 1 , wherein the thickness varies by less than ±50 μm based on a surface area of 25 mm 2 .

4. The glass wafer as claimed in claim 3 , wherein the thickness ranges between 0.18 millimeters and 0.32 millimeters.

5. The glass wafer as claimed in claim 1 , further comprising bubbles and inclusions that are no larger than 200 nm.

6. The glass wafer as claimed in claim 1 , wherein the bubbles and inclusions that are no larger than 100 nm.

7. The glass wafer as claimed in claim 1 , comprising a composition, in weight percent, based on oxide of:

P 2 O 5 : 25-80;

Al 2 O 3 : 1-13;

B 2 O 3 : 0-3;

Li 2 O: 0-13;

Na 2 O: 0-10;

K 2 O: 0-11;

MgO: 1-10;

CaO: 0-16;

BaO: 0-26;

SrO: 0-16;

ZnO: 0-10; and

CuO: 1-7.

8. The glass wafer as claimed in claim 1 , comprising a composition, in weight percent, based on oxide of:

P 2 O 5 : 25-60;

Al 2 O 3 : 1-13;

Li 2 O: 0-13;

Na 2 O: 0-10;

K 2 O: 0-11;

MgO: 1-10;

CaO: 1-16;

BaO: 1-26;

SrO: 0-16;

ZnO: 0-10;

CuO: 1-7;

ΣRO (R=Mg, Ca, Sr, Ba) 15-40; and

ΣR 2 O (R=Li, Na, K) 3-18;

wherein starting from the composition, 1 to 39 mol % of the oxide ions (O 2− ) in the glass are replaced by fluoride ions (F).

9. An assembly comprising:

a glass wafer of a copper ions containing phosphate or fluorophosphate glass, the glass wafer having a diameter greater than 15 centimeters and a thickness of less than 0.4 millimeters, the glass wafer having two plane-parallel surfaces at least one of which is polished, the two plane-parallel surfaces having height modulations in form of waves with a height of less than 200 nanometers based on a length of not more than 1 millimeter; and

a semiconductor wafer with a plurality of optoelectronic array sensors for manufacturing camera modules, the glass wafer being bound to the semiconductor wafer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2013
From: SCHREDER, BIANCA; FREUND, JOCHEN; WOELFEL, UTE; MARTIN, CLAUDE; BAUR, CHRISTOPHE; REICHEL, STEFFEN; CLEMENT, MARC KARL
To: SCHOTT AG
Reel/Frame 030913/0212 →
Priority Claims (1)
DE 10 2012 103 077 · Apr 10, 2012 · national
Continuity (1)
Related Publication 20130264672A1 · Oct 10, 2013