Communication channel calibration for drift conditions
A method and system provides for execution of calibration cycles from time to time during normal operation of the communication channel. A calibration cycle includes de-coupling the normal data source from the transmitter and supplying a calibration pattern in its place. The calibration pattern is received from the communication link using the receiver on the second component. A calibrated value of a parameter of the communication channel is determined in response to the received calibration pattern. The steps involved in calibration cycles can be reordered to account for utilization patterns of the communication channel. For bidirectional links, calibration cycles are executed which include the step of storing received calibration patterns on the second component, and retransmitting such calibration patterns back to the first component for use in adjusting parameters of the channel at first component.
1. A method of operation of an integrated circuit component, the method used for calibrating a parameter associated with transmission of data on a communication channel, the method comprising:
transmitting a calibration sequence used to establish an operation value that represents the parameter;
transmitting data in accordance with the operation value;
determining adjustment information for the parameter, interspersed with said transmitting data over the communication channel;
adjusting the operation value for the parameter using said adjustment information.
2. The method of claim 1 , wherein the adjustment information indicates drift of the parameter during operation of the integrated circuit component.
3. The method of claim 1 , including storing requests to transmit data over the communication channel during said determining.
4. The method of claim 1 , comprising using a portion of addressable memory space of the integrated circuit component as a storage block to store patterns received in the calibration sequence.
5. The method of claim 1 , wherein said determining includes using second calibration sequences a plurality of times during operation of the integrated circuit component, and producing a pass or fail determination during each use of the second calibration sequences.
6. The method of claim 5 , comprising receiving calibration patterns during said second calibration sequences, and using a portion of addressable memory space of the integrated circuit component as a storage block to store patterns received in the second calibration sequences.
7. The method of claim 5 , including reserving said portion of the addressable memory space for use as the storage block, and storing requests to communicate data over the communication channel to be stored in said portion of the addressable memory space in a cache memory during said second calibration sequences.
8. The method of claim 5 , including reserving said portion of the addressable memory space for use as the storage block, and while using one of the second calibration sequences, storing data from said storage block into temporary storage, storing data of said one of the second calibration sequences into the storage block, and after completion of said one of the second calibration sequences, copying the data from the temporary storage into the storage block.
9. The method of claim 6 , wherein said determining includes using second calibration sequences N times during operation of the integrated circuit component, and producing a pass or fail determination during each use of the second calibration sequences; and
after the Nth second calibration sequence, decrementing a drift value for the parameter if there is less than a predetermined number of pass determinations, and incrementing the drift value if there is more than a predetermined number of fail determinations.
10. An integrated circuit, comprising:
an interface for a communication channel;
logic to apply a parameter associated with transmission of data on the communication channel;
logic to process a calibration sequence to establish an operation value that represents the parameter, and to transmit or receive data in accordance with the operation value;
logic to determine adjustment information for the parameter, interspersed with said transmission or reception of data on the communication channel; and
logic to adjust the operation value for the parameter using said adjustment information.
11. The integrated circuit of claim 10 , wherein the adjustment information indicates drift of the parameter during operation of the integrated circuit.
12. The integrated circuit of claim 10 , including logic to store requests to transmit data over the communication channel while determining the adjustment information.
13. The integrated circuit of claim 10 , comprising addressable memory space, and logic to use portion of the addressable memory space as a storage block to store patterns received in the calibration sequence.
14. The integrated circuit of claim 10 , wherein said logic to determine adjustment information uses second calibration sequences a plurality of times during operation of the integrated circuit, and produces a pass or fail determination during each use of the second calibration sequences.
15. The integrated circuit of claim 14 , comprising logic to receive calibration patterns during said second calibration sequences, and use a portion of addressable memory space of the integrated circuit component as a storage block to store patterns received in the second calibration sequences.
16. The integrated circuit of claim 14 , comprising a cache memory, and logic to reserve said portion of the addressable memory space for use as the storage block, and store requests to communicate data over the communication channel to be stored in said portion of the addressable memory space in the cache memory during said second calibration sequences.
17. The integrated circuit of claim 14 , including logic to reserve said portion of the addressable memory space for use as the storage block, and while using one of the second calibration sequences, to store data from said storage block into temporary storage, store data of said one of the second calibration sequences into the storage block, and after completion of said one of the second calibration sequences, to copy the data from the temporary storage into the storage block.
18. The integrated circuit of claim 10 , wherein said logic to determine adjustment information uses second calibration sequences N times during operation of the integrated circuit, and produces a pass or fail determination during each use of the second calibration sequences; and
after the Nth second calibration sequence, decrements a drift value for the parameter if there is less than a predetermined number of pass determinations, and increments the drift value if there is more than a predetermined number of fail determinations.