IP Library Granted Patent US 9,528,917
Granted Patent B2
US 9,528,917 · App. 13/858,056 · Granted Dec 27, 2016

Gas probes

Inventor: Jeremy Knight (Market Drayton, GB)
Assignee: EnDet Ltd
G01N1/10G01K1/08G01K13/02G01N1/2247G01N1/2294
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Quick Facts
Patent No.
US 9,528,917
App. No.
13/858,056
Granted
Dec 27, 2016
Kind
B2
Abstract

A gas sampling probe is provided that includes an elongate member having an inlet end and an outlet end, and a sampling passage disposed within the member. The sampling passage extends from the inlet end to the outlet end. The inlet end comprises a curved outer surface. Numerous other aspects are provided.

Claims (30)

1. A gas sampling probe comprising:

an elongate member having an inlet end and an outlet end; and

a sampling passage disposed within the member, the sampling passage extending from the inlet end to the outlet end,

wherein the inlet end comprises a curved outer surface treated using a passivation process to reduce surface activity and particulate adhesion, and

wherein the member comprises a helical fin.

2. The gas sampling probe of claim 1 , wherein the inlet end further comprises a seal between an outer surface of the sampling passage and an inner surface of the member.

3. The gas sampling probe of claim 1 , wherein the curved outer surface corresponds to a surface formed by revolving a smooth curve about a center axis of the sampling passage and/or member.

4. The gas sampling probe of claim 1 , wherein the curved outer surface comprises a hemispherical shape.

5. The gas sampling probe of claim 1 , wherein the outer surface comprises a surface roughness less than 0.4 μRA.

6. The gas sampling probe of claim 1 , wherein the sampling passage comprises a cross sectional area between 0.1 mm 2 to 30 mm 2 .

7. The gas sampling probe of claim 1 , wherein an inner surface of the sampling passage comprises a surface roughness of less than 0.8 μRA.

8. The gas sampling probe of claim 1 , wherein an inner surface of the sampling passage is treated by electro-polishing to reduce surface roughness.

9. The gas sampling probe of claim 1 , wherein an inner surface of the sampling passage is treated with using a passivation process to reduce surface activity.

10. The gas sampling probe of claim 1 , wherein:

the gas sampling probe is adapted for use with a conduit carrying a flowing fluid, the conduit comprising an axis parallel to the fluid flow; and

the gas sampling probe is adapted to be inclined at an angle “a” relative to the axis, where “a” is in the range 45° to 90°.

11. The gas sampling probe of claim 1 , wherein the member comprises a tube.

12. A probe main body for insertion into a pipe transporting fluid, the probe main body comprising:

an elongate upper tubular portion;

an elongate lower tubular portion which is integral with and having a diameter smaller than the upper tubular portion;

a sampling bore which extends between the upper and lower tubular portions; and

a plurality of helical fins integrally formed on the lower tubular portion and which wind along and around an outer surface of the lower tubular portion and which overlap each other,

wherein a radial extension of the lower tubular portion plus helical fins substantially corresponds to an external radius of the upper tubular portion.

13. The probe main body of claim 12 , wherein each of the plurality of helical fins originates on the outer surface of the lower tubular portion at a separate location.

14. A probe main body for insertion into a pipe transporting fluid, the probe main body comprising:

an elongate upper tubular portion;

an elongate lower tubular portion which is integral with the upper tubular portion;

a sampling bore which extends between the upper and lower tubular portions; and

a plurality of helical fins integrally formed on the lower tubular portion and which wind along and around an outer surface of the lower tubular portion and which overlap each other,

wherein each of the plurality of helical fins originates on the outer surface of the lower tubular portion at a separate location.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2023
From: ORBITAL GAS SYSTEMS, NORTH AMERICA, INC.
To: MANGAN, INC.
Reel/Frame 064858/0188 →
CHANGE OF NAME Recorded Sep 15, 2022
From: ORBITAL ENERGY GROUP, INC.
To: ORBITAL INFRASTRUCTURE GROUP, INC.
Reel/Frame 061438/0430 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 10, 2021
From: ENDET LIMITED
To: ORBITAL ENERGY GROUP, INC.
Reel/Frame 055213/0176 →
LICENSE Recorded Jun 19, 2014
From: ENDET LIMITED
To: ORBITAL GAS SYSTEMS LIMITED
Reel/Frame 033137/0625 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 3, 2013
From: KNIGHT, JEREMY
To: ENDET LTD.
Reel/Frame 030733/0314 →
Priority Claims (2)
GB 0525185.5 · Dec 10, 2005 · national
GB 0623351.4 · Nov 23, 2006 · national
Continuity (2)
Continuation 12096836
Related Publication 20140130582A1 · May 15, 2014