Restoring ECC syndrome in non-volatile memory devices
View Patent ↗A method of restoring an ECC syndrome in a non-volatile memory device having memory cells arranged in a plurality of sectors within a memory cell array, the method comprising identifying a first sector including at least one page having a disabled ECC (error correction code) flag; reading the value of all data bits in said at least one page; calculating values for ECC bits in said at least one page; and writing said data bit values and said calculated ECC bit values to a second sector in the memory cell array.
1. A method of restoring an ECC syndrome in a non-volatile memory device having memory cells arranged in a plurality of sectors within a memory cell array, the method comprising:
identifying a first sector including at least one page having a disabled ECC (error correction code) flag;
reading the value of all data bits in said at least one page;
calculating values for ECC bits in said at least one page;
writing said data bit values and said calculated ECC bit values to a second sector in the memory cell array, and
erasing said second sector prior to writing said data bit values and said calculated ECC bit values from said first sector.
2. The method according to claim 1 further comprising:
reading all pages in said first sector;
identifying all pages having disabled ECC flags;
for all other pages in said first sector having disabled ECC flags:
reading the value of all data bits in each one of said all other pages;
calculating values for ECC bits in each one of said all other pages; and
writing said data bit values and said calculated ECC bit values to said second sector.
3. The method according to claim 1 further comprising:
identifying in said first sector all pages having an enabled ECC flag;
reading the values of all data bits and ECC bits in said pages having an enabled ECC flag;
correcting any incorrect data bit values in said data bits using said ECC bits; and
writing said data bit values including corrected data bit values and said ECC bit values in said pages having an enabled ECC flag to said second sector.
4. The method according to claim 1 further comprising erasing said first sector.
5. The method according to claim 1 further comprising swapping the physical addresses of said first and second sectors.
6. A method of restoring an ECC syndrome in a non-volatile memory device having memory cells arranged in a plurality of sectors within a memory cell array, the method comprising:
identifying a first sector including at least one page having a disabled ECC (error correction code) flag;
reading the value of all data bits in said at least one page;
calculating values for ECC bits in said at least one page;
writing said data bit values and said calculated ECC bit values to a second sector in the memory cell array; and
swapping the physical addresses of said first and second sectors.
7. The method according to claim 6 further comprising:
reading all pages in said first sector;
identifying all pages having disabled ECC flags;
for all other pages in said first sector having disabled ECC flags:
reading the value of all data bits in each one of said all other pages;
calculating values for ECC bits in each one of said all other pages; and
writing said data bit values and said calculated ECC bit values to said second sector.
8. The method according to claim 6 further comprising:
identifying in said first sector all pages having an enabled ECC flag;
reading the values of all data bits and ECC bits in said pages having an enabled ECC flag;
correcting any incorrect data bit values in said data bits using said ECC bits; and
writing said data bit values including corrected data bit values and said ECC bit values in said pages having an enabled ECC flag to said second sector.
9. The method according to claim 6 further comprising erasing said first sector.
10. The method according to claim 6 further comprising erasing said second sector prior to writing said data bit values and said calculated ECC bit values from said first sector.