IP Library Granted Patent US 8,890,606
Granted Patent B2
US 8,890,606 · App. 13/876,531 · Granted Nov 18, 2014

Voltage switching circuitry, integrated device and integrated circuit, and method of voltage switching

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Quick Facts
Patent No.
US 8,890,606
App. No.
13/876,531
Granted
Nov 18, 2014
Kind
B2
Abstract

A voltage switching circuitry comprises a switching arrangement with a given number N of switches in series between a first terminal receiving a first voltage and a second terminal receiving a second voltage. The first voltage level is higher than the second voltage level, and N is at least equal to 2. A voltage-by-N divider, having N−1 output taps, is arranged to divide the first voltage by N to a scaled down version of the first voltage having a voltage level below voltage max ratings of the switches. The N−1 output taps of the divider are arranged to respectively output N−1 third voltages having respective levels staged below the first voltage level. N−1 max voltage generators generate N−1 fourth voltages, respectively equal to the maximum of the second voltage and of each of the N−1 third voltages. A switch control unit generates N control signals using the N−1 fourth voltages. These N control signals have respective voltage levels staged between the first voltage level and the second voltage level. In addition, each of the N control signals controls one of the switches of the switching arrangement, respectively.

Claims (43)

1. A voltage switching circuitry comprising:

at least one switching arrangement with a given number, N, of switches in series between a first terminal for receiving a first voltage at a first voltage level and a second terminal for receiving a second voltage at a second voltage level, the first voltage level being higher than the second voltage level, and N being at least equal to 2;

a voltage-by-N divider having N−1 output taps, arranged to divide the first voltage by N to a scaled down version of the first voltage having a voltage level below voltage max ratings of the switches, wherein the N−1 output taps of the divider are arranged to respectively output N−1 third voltages having respective levels staged below the first voltage level;

N−1 max voltage generators for generating N−1 fourth voltages, respectively equal to the maximum of the second supply voltage and of each of the N−1 third voltages; and

a switch control unit for generating N control signals using the N−1 fourth voltages, said N control signals having respective voltage levels staged between the first voltage level and the second voltage level, and each of said N control signals controlling one of the switches of the switching arrangement, respectively.

2. The voltage switching circuitry of claim 1 , wherein the switches are PMOS transistors.

3. The voltage switching circuitry of claim 1 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between a terminal at the first voltage and a terminal at the potential of the ground.

4. The voltage switching circuitry of claim 2 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between a terminal at the first voltage and a terminal at the potential of the ground.

5. An integrated circuit device comprising:

a first terminal for receiving a first voltage at a first voltage level;

a second terminal for receiving a second voltage at a second voltage level, the first voltage level being higher than the second voltage level; and

a voltage switching circuitry of claim 1 .

6. The integrated device of claim 5 , comprising a second switching arrangement with N switches in series between the first terminal and a third terminal for receiving a third voltage at a third voltage level, where the first voltage level is higher than the third voltage level, wherein N second control signals controlling the switches of the second switching arrangement are further generated by the switch control unit using the N−1 fourth voltages, said N second control signals having respective voltage levels staged between the first voltage level and the third voltage level.

7. The integrated device of claim 6 , wherein the third terminal is a ground terminal, and wherein the switches of the second switching arrangements are NMOS transistors.

8. The integrated device of claim 6 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between a terminal at the first voltage and a terminal at the ground potential.

9. The integrated device of claim 5 , wherein the switches of the first switching arrangement are PMOS transistors.

10. The integrated device of claim 9 , wherein the third terminal is a ground terminal, and wherein the switches of the second switching arrangements are NMOS transistors.

11. The integrated device of claim 9 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between a terminal at the first voltage and a terminal at the ground potential.

12. The integrated device of claim 5 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between a terminal at the first voltage and a terminal at the ground potential.

13. An integrated circuit comprising:

a Non Volatile Memory block having an input terminal on which a first voltage at a first voltage level or a second voltage at a second voltage level may be applied, where the first voltage level is higher than the second voltage level;

a voltage source having an output terminal delivering the second voltage;

a pad which may receive the first voltage from the exterior of the circuit and which is directly connected to the input terminal of the Non Volatile Memory block; and

a voltage switching circuitry comprising:

a first switching arrangement with a given number N of switches in series between the input terminal of the Non Volatile Memory block and the pad, where N is at least equal to 2;

a second switching arrangement with N switches in series between the input terminal of the Non Volatile Memory block and a ground terminal;

a voltage-by-N divider, having N−1 output taps, arranged to divide the first voltage by N to a scaled down version of the first voltage having a voltage level below voltage max ratings of the switches, wherein the N−1 output taps of the divider are arranged to respectively output N−1 third voltages having respective levels staged below the first voltage level;

N−1 max voltage generators for generating N−1 fourth voltages, respectively equal to the maximum of the second voltage and of each of the N−1 third voltages;

a switch control unit for generating N first control signals using the N−1 fourth voltages, said N first control signals having respective voltage levels staged between the first voltage and the second voltage, each of said N first control signals controlling one of the switches of the first switching arrangement, respectively; and,

N second control signals using the N−1 fourth voltages, said N second control signals having respective voltage levels staged between the first voltage and the third voltage, each of said N second control signals controlling one of the switches of the second switching arrangement, respectively.

14. The integrated circuit of claim 13 , wherein the switches of the first switching arrangement are PMOS transistors.

15. The integrated circuit of claim 14 , wherein the switches of the second switching arrangements are NMOS transistors.

16. The integrated device of claim 14 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between the pad and the ground terminal.

17. The integrated circuit of claim 13 , wherein the switches of the second switching arrangements are NMOS transistors.

18. The integrated device of claim 13 , wherein the voltage-by-N divider comprises N diode-connected MOS transistors in series between the pad and the ground terminal.

19. A method of managing voltage switching between a first terminal receiving a first voltage at a first voltage level and a second terminal receiving a second voltage at a second voltage level, where the first voltage level is higher than the second voltage level, comprising:

dividing the first voltage by a given number N, where N is at least equal to 2, to a scaled down version of the first voltage having a voltage level below voltage max ratings of available switches, and generating N−1 third voltages having respective levels staged below the first voltage level;

generating N−1 fourth voltages, respectively equal to the maximum of the second voltage and of each of the N−1 third voltages, respectively;

generating N first control signals using the N−1 fourth voltages, said N first control signals having respective voltage levels staged between the first voltage level and the second voltage level, and; and,

controlling at least a first switching arrangement with N switches in series between the first terminal and the second terminal, each one of the switches of said first switching arrangement being controlled by one of the N first control signals, respectively.

20. The method of claim 19 , further comprising:

generating N second control signals using the N−1 fourth voltages, said N second control signals having respective voltage levels staged between the first voltage level and a third voltage level, where the first voltage level is higher than the third voltage level; and,

controlling a second switching arrangement with N switches in series between the first terminal and a third terminal receiving the third voltage, each one of the switches of said second switching arrangement being controlled by one of the N second control signals, respectively.

Assignments (31)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
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From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
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From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
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To: NXP B.V.
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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