Method and apparatus for monitoring timing of critical paths
An apparatus for monitoring timing of a plurality of critical paths of a functional circuit includes a plurality of canary circuits, each configured to be coupled to a critical path of a functional circuit for detecting and outputting critical timing events. Each canary circuit includes an adjustable delay element and an analyzer circuit for receiving a count of the critical timing event output from at least one of the plurality of canary circuits for a predetermined time interval for a plurality of delay values of the adjustable delay elements and for determining a probability distribution of critical timing events of the at least one of the plurality of critical paths for the predetermined time interval for the plurality of delay values.
1. Apparatus for monitoring timing of a plurality of critical paths of a functional circuit, the apparatus comprising:
a plurality of canary circuits, each configured to be coupled to a critical path of a functional circuit for detecting and outputting critical timing events, each canary circuit including an adjustable delay element having a plurality of delay values; and
an analyser circuit configured to receive the critical timing event outputs from at least one of the plurality of canary circuits during a predetermined time interval, to count the critical timing events that occur at each of the plurality of delay values of at least one of the adjustable delay elements, and to determine a probability distribution of the counted critical timing events over the plurality of delay values.
2. The apparatus according to claim 1 , wherein each of the plurality of canary circuits includes a canary register; wherein the adjustable delay element is coupled between the critical path and an input of the canary register; and wherein an output of the canary register indicates a critical timing event.
3. The apparatus according to claim 2 , wherein each of the plurality of canary circuits are coupled to the input of a sequential functional element of the critical path.
4. The apparatus according to claim 3 , wherein the sequential functional element comprises the terminal register of a critical path.
5. The apparatus according to claim 4 , wherein the apparatus further comprises an enable/disable terminal for enabling or disabling any one of the plurality of canary circuits.
6. The apparatus according to claim 5 , wherein each of the plurality of canary circuits comprises a monitor register for storing occurrence of a critical timing event.
7. The apparatus according to claim 6 , wherein the analyser circuit includes a logic circuit that further includes an identifier circuit for identifying from the monitor register in which critical path a critical timing event occurred.
8. The apparatus according to claim 7 , wherein the predetermined time interval is variable.
9. A dynamic voltage/frequency scaling system for dynamically adjusting the voltage and/or clock frequency for at least one functional circuit, the system comprising:
at least one functional circuit including a plurality of critical paths;
the apparatus according to claim 1 , wherein the analyser circuit of the apparatus is further configured to derive the number of critical timing events for the predetermined time interval of the at least one critical path; and
a control module configured to control the voltage and/or clock frequency of the at least one functional circuit based upon a predetermined threshold derived from the probability distribution of critical timing events determined by the apparatus.
10. The dynamic voltage/frequency scaling system according to claim 9 , wherein the control module is further configured to increase the voltage and/or reduce the clock frequency if the count of critical timing events exceeds the predetermined threshold.
11. The dynamic voltage/frequency scaling system according to claim 10 , wherein the control module is further configured to reduce the voltage and/or increase the clock frequency if the count of critical timing events is less than the predetermined threshold.
12. A method for monitoring timing of a plurality of critical paths of a functional circuit, the method comprising:
detecting critical timing events of at least one of the plurality critical paths of a functional circuit;
maintaining a count of the detected critical timing events for a predetermined time interval for a plurality of delays of the at least one critical path; and
determining a probability distribution of the count of critical timing events of the at least one of the plurality of critical paths for the predetermined time interval for the plurality of delays.
13. The method according to claim 12 , further comprising varying the predetermined time interval.
14. A method of dynamically controlling voltage/frequency scaling of a voltage and/or clock frequency for at least one functional circuit, the method comprising:
monitoring critical timing events according to the method of claim 12 ;
detecting critical timing events of at least one of the plurality of critical paths of a functional circuit;
deriving the number of critical timing events for a predetermined time interval of the at least one critical path; and
controlling the voltage and/or clock frequency of the at least one functional circuit based upon the derived number of critical timing events with respect to a predetermined threshold defined by the probability distribution of critical timing events determined by the monitoring.
15. The method according to claim 14 , wherein controlling further includes:
increasing the voltage and/or reducing the clock frequency if the count of critical timing events exceeds the predetermined threshold; and
reducing the voltage and/or increasing the clock frequency if the count of critical timing events is less than the predetermined threshold.