Calibrated temperature measurement system
View Patent ↗In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may comprise resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio and the resistor-characterization information.
1. A temperature measurement system, comprising:
a resistor;
a thermistor;
a resistance-to-current converter configured to generate a current signal based on a resistance of one of the resistor and the thermistor;
an analog-to-digital converter (ADC) configured to:
receive a first current signal based on the resistor;
convert the first current signal into a first digital signal;
receive a second current signal based on the thermistor; and
convert the second current signal into a second digital signal;
a memory comprising resistor-characterization information; and
a calculation stage communicatively coupled to an ADC output and configured to:
determine a first digital value based on the first digital signal;
determine a second digital value based on the second digital signal; and
determine a temperature output value based on the first digital value, the second digital value, and the resistor-characterization information.
2. The temperature measurement system of claim 1 , wherein:
the ADC is further configured to:
receive a first complementary current signal based on the resistor;
convert the first complementary current signal into a first complementary digital signal;
receive a second complementary current signal based on the thermistor; and
convert the second complementary current signal into a second complementary digital signal;
the first digital value is further based on the first complementary digital signal; and
the second digital value is further based on the second complementary digital signal.
3. The temperature measurement system of claim 1 , wherein the resistor is located on the same semiconductor chip as the ADC.
4. The temperature measurement system of claim 1 , wherein the resistor-characterization information comprises a resistor-characterization ratio based on an actual resistance of the resistor and a designed resistance of the resistor.
5. The temperature measurement system of claim 1 , further comprising:
a look-up map including a plurality of temperature output values and a corresponding first plurality of resistance-ratio values based on a designed resistance of the resistor; and
a resistance-ratio converter configured to calculate a second plurality of resistance-ratio values based on the first plurality of resistance-ratio values and the resistor-characterization information.
6. The temperature measurement system of claim 1 , wherein the calculation stage is further configured to:
calculate a ratio based on the first digital value and the second digital value; and
determine the temperature output value based in part on the ratio.
7. A temperature measurement system, comprising:
a resistor;
a resistance-to-current converter configured to generate a current signal based on a resistance of at least the resistor;
an analog-to-digital converter (ADC) configured to:
receive a first current signal, the first current signal based on the resistor;
convert the first current signal into a first digital signal;
receive a second current signal; and
convert the second current signal into a second digital signal;
a memory comprising resistor-characterization information; and
a calculation stage communicatively coupled to an ADC output and configured to:
determine a first digital value based on the first digital signal;
determine a second digital value based on the second digital signal; and
determine a temperature output value based on the first digital value, the second digital value, and the resistor-characterization information.
8. The temperature measurement system of claim 7 , wherein:
the ADC is further configured to:
receive a first complementary current signal, the first complementary current signal based on the resistor;
convert the first complementary current signal into a first complementary digital signal;
receive a second complementary current signal; and
convert the second complementary current signal into a second complementary digital signal;
the first digital value is further based on the first complementary digital signal; and
the second digital value is further based on the second complementary digital signal.
9. The temperature measurement system of claim 7 , wherein the resistor is located on the same semiconductor chip as the ADC.
10. The temperature measurement system of claim 7 , wherein the resistor-characterization information comprises a resistor-characterization ratio based on an actual resistance of the resistor and a designed resistance of the resistor.
11. The temperature measurement system of claim 7 , further comprising:
a look-up map including a plurality of temperature output values and a corresponding first plurality of resistance-ratio values based on a designed resistance of the resistor;
a resistance-ratio converter configured to calculate a second plurality of resistance-ratio values based on the first plurality of resistance-ratio values and the resistor-characterization information.
12. The temperature measurement system of claim 7 , wherein the calculation stage is further configured to:
calculate a ratio based on the first digital value and the second digital value; and
determine the temperature output value based in part on the ratio.