IP Library › Granted Patent US 9,148,015
Granted Patent B2
US 9,148,015 · App. 13/911,383 · Granted Sep 29, 2015

Protection circuit

Inventors: Kazuhiro Kato (Kanagawa, JP); Takehito Ikimura (Kanagawa, JP)
Assignee: Kabushiki Kaisha Toshiba
H02H9/046
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Quick Facts
Patent No.
US 9,148,015
App. No.
13/911,383
Granted
Sep 29, 2015
Kind
B2
Abstract

A circuit that protects against ESD and avoids an excessive power voltage drop during the protection operation includes a control circuit that is connected between power terminals and outputs a control signal when a voltage between the power terminals exceeds a predetermined value due to a surge current, and an asymmetric current transfer device including a PN junction reverse-biased by the power voltage between the power terminals, that is connected in series with the output current channel of a shunt transistor. The conductivity of the shunt transistor is controlled according to the control signal.

Claims (50)

1. A protection circuit, comprising:

a first power terminal to receive a high potential voltage;

a second power terminal to receive a low potential voltage, a circuit to be protected being connected between the first and the second power terminals;

a control circuit connected between the first and the second power terminals which outputs a control signal when a voltage between the first and the second power terminals exceeds a predetermined threshold value;

a shunt transistor having a current channel between the first and the second power terminals, the shunt transistor having a conductive state thereof controlled according to the control signal; and

an asymmetric current transfer device, including a PN junction reverse-biased by a power voltage between the first and the second power terminals, the current channel of the shunt transistor and the asymmetric current transfer device being connected in series between the first and the second power terminals and in parallel to the circuit.

2. The circuit according to claim 1 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

3. The circuit according to claim 1 , wherein:

the shunt transistor is an NMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the NMOS transistor and the first power terminal.

4. The circuit according to claim 3 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

5. The circuit according to claim 1 , wherein:

the shunt transistor is a PMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the PMOS transistor and the second power terminal.

6. The circuit according to claim 5 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

7. The circuit according to claim 1 , wherein the control circuit comprises:

a bias circuit formed by a series circuit including a resistor and a capacitor connected between the first and the second power terminals, and

a MOS transistor with a gate electrode thereof connected between the resistor and the capacitor and having a current channel thereof between the first and the second power terminals, from which the control signal is output.

8. The circuit according to claim 7 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

9. The circuit according to claim 7 , wherein:

the shunt transistor is an NMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the NMOS transistor and the first power terminal.

10. The circuit according to claim 9 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

11. The circuit according to claim 7 , wherein:

the shunt transistor is a PMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the PMOS transistor and the second power terminal.

12. The circuit according to claim 11 , wherein the PN junction of the asymmetric current transfer device is a PN junction of a diode.

13. A protection circuit, comprising:

a first power terminal;

a second power terminal, a circuit to be protected being connected between the first and the second power terminals;

a control circuit connected between the first and the second power terminals which outputs a control signal when a voltage between the first and the second power terminals exceeds a predetermined threshold value;

a shunt transistor having a current channel between the first and the second power terminals; and

a diode connected to the current channel of the shunt transistor, the current channel of the shunt transistor and the diode being connected in series between the first and the second power terminals and in parallel to the circuit, the diode being reverse-biased by a power voltage between the first and the second power terminals.

14. The circuit according to claim 13 , wherein the diode includes a PN junction.

15. The circuit according to claim 14 , wherein:

the shunt transistor is an NMOS transistor, and

an anode of the diode is connected to the NMOS transistor and a cathode of the diode is connected to the first power terminal.

16. The circuit according to claim 14 , wherein:

the shunt transistor is a PMOS transistor, and

a cathode of the diode is connected to the PMOS transistor and an anode of the diode is connected to the second power terminal.

17. A method for protecting a circuit, comprising:

monitoring a power voltage value between a first power terminal and a second power terminal, a circuit to be protected being connected between the first and the second power terminals;

outputting a control signal when the power voltage value between the first and the second power terminals exceeds a predetermined threshold value;

leading a current from the first power terminal to the second power terminal through a current channel of a shunt transistor and an asymmetric current transfer device that are connected in series between the first and the second power terminals and in parallel to the circuit, based on the control signal when the power voltage value between the first and the second power terminals exceeds a breakdown voltage of the asymmetric current transfer device.

18. The method of claim 17 , wherein:

the shunt transistor is an NMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the NMOS transistor and the first power terminal.

19. The method of claim 17 , wherein:

the shunt transistor is a PMOS transistor, and

the asymmetric current transfer device is connected between a drain electrode of the PMOS transistor and the second power terminal.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 6, 2013
From: KATO, KAZUHIRO; IKIMURA, TAKEHITO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 030559/0193 →
Priority Claims (1)
JP P2012-234621 · Oct 24, 2012 · national
Continuity (1)
Related Publication 20140111893A1 · Apr 24, 2014