Auger elemental identification algorithm

1. A method of Auger spectral analysis of an input spectrum, the input spectrum including an Auger spectrum, the method comprising:

conditioning the input spectrum to generate a normalized input spectrum;

determining a statistical correlation between the normalized input spectrum and one or more stored elemental spectral signatures; and

characterizing species in the input spectrum from the statistical correlation,

wherein said conditioning the input spectrum includes estimating a background signal of non-Auger electrons in the input spectrum and subtracting the estimated background signal from the input spectrum.

2. The method of claim 1 , wherein the estimated background signal is a convex envelope of the input spectrum and said estimating the background signal include using a convex hull algorithm to calculate the convex envelope.

3. The method of claim 1 , wherein said determining statistical correlation includes performing multilinear regression on the normalized input spectrum against the stored elemental spectral signatures.

4. The method of claim 1 , wherein said conditioning the input spectrum further includes filtering the input spectrum to remove noise from the input spectrum.

5. The method of claim 4 , wherein said filtering the input spectrum includes applying a Savitzky-Golay smoothing filter to the input spectrum.

6. The method of claim 4 , wherein said filtering the input spectrum includes applying a Gaussian filter to the input spectrum.

7. The method of claim 4 , wherein said filtering the input spectrum includes applying a binomial filter to the input spectrum.

8. The method of claim 4 , wherein said filtering the input spectrum includes applying a boxcar filter to the input spectrum.

9. The method of claim 1 , further comprising acquiring the input spectrum, wherein said acquiring the input spectrum includes directing a beam of electrons at a target and determining an energy spectrum of secondary electrons emitted from the target with an Auger detection system.

10. The method of claim 9 , wherein the target is a defect on a semiconductor wafer.

11. The method of claim 9 , wherein the Auger detection system is equipped in a Metrology of review tool.

12. The method of claim 1 , wherein said conditioning the input spectrum further includes subtracting a reference spectrum from the input spectrum.

13. The method of claim 12 , further comprising:

acquiring the input spectrum, wherein acquiring the input spectrum includes directing a beam of electrons at a defect on a semiconductor wafer and determining an energy spectrum of secondary electrons emitted from the defect with an Auger detection system; and

acquiring the reference spectrum, wherein said acquiring the reference spectrum includes directing a beam of electrons at target on the semiconductor wafer that does not have the defect and determining an energy spectrum of secondary electrons emitted from the target with the Auger detection system.

14. The method of claim 1 , wherein said characterizing species includes identifying elements in the input spectrum.

15. The method of claim 14 , wherein said characterizing species further includes determining concentrations of the identified elements.

16. The method of claim 14 , wherein said characterizing species further includes determining confidence levels of the identified elements.

17. A system comprising:

a processor unit;

a memory unit coupled to the processor unit;

a plurality of elemental spectral signatures embodied in the memory unit; and

program instructions embodied in the memory unit an executable by the processor unit, wherein execution of the program instructions by the processor unit causes the processor unit to implement a method of Auger spectral analysis of an input spectrum, the input spectrum including an Auger spectrum, the method comprising:

conditioning the input spectrum to generate a normalized input spectrum;

determining statistical correlation between the normalized input spectrum and the elemental spectral signatures; and

characterizing species in the input spectrum from the statistical correlation,

wherein said conditioning the input spectrum includes estimating a background signal of non-Auger electrons in the input spectrum and subtracting the estimated background signal from the input spectrum.

18. The system of claim 17 , further comprising an Auger detection system, wherein the method further comprises acquiring the input spectrum, wherein said acquiring the input spectrum includes directing a beam of electrons at a target and determining an energy spectrum of secondary electrons emitted from the target with the Auger detection system.

19. The system of claim 18 , wherein the Auger detection system is equipped in a Metrology of review tool.

20. A non-transitory computer readable medium having a plurality of elemental spectral signatures and program instructions embodied therein, wherein execution of the program instructions by a processor unit causes the processor unit to perform a method of Auger spectral analysis of an input spectrum, the input spectrum including an Auger spectrum, the method comprising:

conditioning the input spectrum to generate a normalized input spectrum;

determining statistical correlation between the normalized input spectrum and the stored elemental spectral signatures; and

characterizing species in the input spectrum from the statistical correlation,

wherein said conditioning the input spectrum includes estimating a background signal of non-Auger electrons in the input spectrum and subtracting the estimated background signal from the input spectrum.