IP Library Granted Patent US 8,847,341
Granted Patent B2
US 8,847,341 · App. 13/926,048 · Granted Sep 30, 2014

Magnetic memory device

Inventors: Jangeun Lee (Suwon-si, KR); Sechung Oh (Suwon-si, KR); Jeahyoung Lee (Seoul, KR); Woojin Kim (Yongin-si, KR); Junho Jeong (Suwon-si, KR); Woo Chang Lim (Hwaseong-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L43/02H01F10/3254B82Y25/00H01F10/3286H01F10/123H01L43/08H01F10/3272
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Quick Facts
Patent No.
US 8,847,341
App. No.
13/926,048
Granted
Sep 30, 2014
Kind
B2
Abstract

A magnetic memory device is provided. The magnetic memory device includes a first vertical magnetic layer and a second vertical magnetic layer on a substrate, a tunnel barrier layer between the fist vertical magnetic layer and the second vertical magnetic layer, and an exchange-coupling layer between a first sub-layer of the first vertical magnetic layer and a second sub-layer of the first vertical magnetic layer.

Claims (35)

1. A magnetic memory device comprising:

a reference layer comprising;

a first contact magnetic layer having a first saturation magnetization;

a vertical magnetic layer having perpendicular magnetization; and

an exchange coupling layer disposed between the first contact magnetic layer and the vertical magnetic layer;

a free layer comprising a second contact magnetic layer having a second saturation magnetization; and

a tunnel barrier layer disposed between the free layer and the reference layer,

wherein the first saturation magnetization is higher than the second saturation magnetization, and

wherein the vertical magnetic layer comprises a stacked ferromagnetic layer and non-ferromagnetic layer.

2. The magnetic memory device of claim 1 , wherein the first contact magnetic layer comprises CoFeB.

3. The magnetic memory device of claim 2 , wherein the second contact magnetic layer comprises CoFeB.

4. The magnetic memory device of claim 1 , wherein a thickness of the first contact magnetic layer is less than that of the vertical magnetic layer.

5. The magnetic memory device of claim 1 , wherein the vertical magnetic layer comprises at least one of Cr, Pt, Pd, or Ir.

6. The magnetic memory device of claim 1 , wherein a thickness of the exchange coupling layer is less than a thickness of the tunnel barrier layer.

7. The magnetic memory device of claim 1 , wherein the free layer further comprises a non-magnetic layer.

8. The magnetic memory device of claim 1 , wherein the exchange coupling layer directly contacts an uppermost ferromagnetic layer of the vertical magnetic layer.

9. The magnetic memory device of claim 8 , wherein the uppermost ferromagnetic layer of the vertical magnetic layer is thicker than the remainder of the ferromagnetic layers of the vertical magnetic layer.

10. The magnetic memory device of claim 1 , wherein an uppermost non-ferromagnetic layer of the vertical magnetic layer comprises a different material than the remainder of the non-ferromagnetic layers of the vertical magnetic layer.

11. The magnetic memory device of claim 1 , wherein the vertical magnetic layer comprises alternately and repeatedly stacked ferromagnetic layers and non-ferromagnetic layers.

12. A magnetic memory device comprising:

a reference layer comprising;

a first contact magnetic layer that comprises a CoFeB layer;

a first vertical magnetic layer; and

a first exchange coupling layer disposed between the first contact magnetic layer and the first vertical magnetic layer;

a free layer comprising:

a second contact magnetic layer that comprises a CoFeB layer;

a second vertical magnetic layer; and

a second exchange coupling layer disposed between the second contact magnetic layer and the second vertical magnetic layer; and

a tunnel barrier layer disposed between the free layer and reference layer,

wherein the first and second vertical magnetic each comprise alternately and repeatedly stacked ferromagnetic layers and non-magnetic layers.

13. The magnetic memory device of claim 12 , wherein the second contact magnetic layer comprises CoFeB.

14. The magnetic memory device of claim 12 , wherein a thickness of the first contact magnetic layer is less than that of the first vertical magnetic layer.

15. The magnetic memory device of claim 12 , wherein the first vertical magnetic layer comprises at least one of Cr, Pt, Pd, or Ir.

16. The magnetic memory device of claim 12 , wherein a thickness of the first exchange coupling layer is less than that of the tunnel barrier layer.

17. The magnetic memory device of claim 12 , wherein the free layer further comprises a non-magnetic layer.

Priority Claims (1)
KR 10-2010-0037017 · Apr 21, 2010 · national
Continuity (2)
Continuation 13091215 · Apr 21, 2011
Related Publication 20130285178A1 · Oct 31, 2013