Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information
Apparatuses and methods for measuring an electrical characteristic of a model signal line and providing measurement information based at least in part on the measurement of the electrical characteristic. An example apparatus includes a signal line model including a model signal line configured to model electrical characteristics of a signal line. The apparatus further includes a measurement circuit coupled to the signal line model and configured to measure the electrical characteristic of the model signal line responsive to an input signal provided to the model signal line. The measurement circuit is further configured to provide measurement information based at least in part on the measurement to set a signal applied to the signal line.
1. An apparatus, comprising:
a signal line model including a model signal line configured to model electrical characteristics of a signal line; and
a measurement circuit coupled to the signal line model, the measurement circuit configured to receive an input signal provided to the model signal line and receive an output signal of the model signal line, and configured to measure the electrical characteristic of the model signal line based on the input signal and the output signal, the measurement circuit further configured to provide measurement information based at least in part on a measurement to set a signal applied to the signal line,
wherein the measurement circuit is configured to provide a pulse signal as the measurement information, wherein a pulse width of the pulse signal is representative of a propagation delay of the model signal line.
2. The apparatus of claim 1 wherein the measurement circuit is configured to measure a propagation delay of the model signal line.
3. The apparatus of claim 1 , further comprising:
a counter coupled to the measurement circuit and configured to count a number of clock cycles of a clock signal within the pulse signal.
4. The apparatus of claim 1 , further comprising:
a coupling circuit coupled to the model signal line and further coupled to an input and output of the signal line model, the coupling circuit configured to couple the model signal line to the input and output.
5. The apparatus of claim 4 wherein the coupling circuit is further configured to couple the model signal line to ground when the model signal line is not coupled to the input and output.
6. The apparatus of claim 1 wherein model signal line is one of a plurality of model signal lines included in the signal line model, the plurality of model signal lines configured to model a plurality of signal lines.
7. The apparatus of claim 1 wherein the model signal line is configured to model a word line.
8. The apparatus of claim 1 wherein the measurement circuit comprises an oscillator configured to be coupled to a model signal line and provide an output signal having a cycle time based at least in part on the electrical characteristic of the model signal line.
9. The apparatus of claim 8 , further comprising a counter coupled to the oscillator, the counter configured to count a number of cycles of the output signal from the oscillator and provide a control signal responsive to the same.
10. The apparatus of claim 1 wherein the measurement circuit comprises:
a NAND logic gate; and
an inverter having an input coupled to an output of the NAND gate, wherein an input of the NAND logic gate is configured to be coupled to the model signal line.