Techniques for providing a direct injection semiconductor memory device
View Patent ↗Techniques for providing a direct injection semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a direct injection semiconductor memory device including a first region connected to a bit line extending in a first orientation and a second region connected to a source line extending in a second orientation. The direct injection semiconductor memory device may also include a body region spaced apart from and capacitively coupled to a word line extending in the second orientation, wherein the body region is electrically floating and disposed between the first region and the second region. The direct injection semiconductor memory device may further include a third region connected to a carrier injection line extending in the second orientation, wherein the first region, the second region, the body region, and the third region are disposed in sequential contiguous relationship.
1. A direct injection semiconductor memory device comprising:
a first region electrically connected to a bit line;
a second region electrically connected to a source line;
a body region spaced apart from and capacitively coupled to a word line, wherein the body region is electrically floating and disposed between the first region and the second region;
a third region electrically connected to a carrier injection line, wherein the first region, the second region, the body region, and the third region are disposed in sequential contiguous relationship such that the second region is disposed between the body region and the third region, wherein the first region, the body region, and the second region forms a first bipolar junction transistor, and wherein the body region, the second region, and the third region forms a second bipolar junction transistor.
2. The direct injection semiconductor memory device according to claim 1 , wherein the first region and the second region are N-doped regions.
3. The direct injection semiconductor memory device according to claim 2 , wherein the body region and the third region are a P-doped region.
4. The direct injection semiconductor memory device according to claim 1 , wherein the bit line is connected to the first region via a bit line contact.
5. The direct injection semiconductor memory device according to claim 1 , wherein the source line is connected to the second region via a source line contact.
6. The direct injection semiconductor memory device according to claim 1 , wherein the word line is circumferentially surrounded by an insulating/dielectric material.
7. The direct injection semiconductor memory device according to claim 1 , wherein the carrier injection line is circumferentially surrounded by an insulating/dielectric material.
8. The direct injection semiconductor memory device according to claim 1 , wherein the carrier injection line includes an ohmic contact on a plurality of side portions of the third region in a fin configuration.
9. The direct injection semiconductor memory device according to claim 1 , wherein the word line is disposed to cover a plurality of side portions of the body region in a fin configuration.
10. The direct injection semiconductor memory device according to claim 1 , further comprising a plurality of barrier walls configured on a continuous planar region.
11. The direct injection semiconductor memory device according to claim 10 , further comprising a substrate disposed below the plurality of barrier walls.
12. A method for biasing a direct injection semiconductor memory device comprising the step of:
applying a first voltage potential to a first region via a bit line;
applying a second voltage potential to a second region via a source line;
applying a third voltage potential to a body region via a word line that is capacitively coupled to the body region, wherein the body region is electrically floating and disposed between the first region and the second region;
applying a fourth voltage potential to a third region via a carrier injection line, wherein the first region, the second region, the body region, and the third region are disposed in sequential contiguous relationship such that the second region is disposed between the body region and the third region, wherein the first region, the body region, and the second region forms a first bipolar junction transistor, and wherein the body region, the second region, and the third region forms a second bipolar junction transistor.
13. The method according to claim 12 , further comprising increasing the third voltage potential applied to the body region via the word line during a hold operation to perform a read operation.
14. The method according to claim 12 , further comprising increasing the second voltage potential applied to the second region via the source line during a hold operation to perform a read operation.
15. The method according to claim 12 , further comprising maintaining the fourth voltage potential applied to the third region via the carrier injection line during the hold operation to perform a read operation.
16. The method according to claim 12 , further comprising maintaining the third voltage potential applied to the body region via the word line during a hold operation to perform a write logic high operation.
17. The method according to claim 12 , further comprising maintaining the second voltage potential applied to the second region via the source line during a hold operation to perform a write logic high operation.
18. The method according to claim 12 , further comprising increasing the fourth voltage potential applied to the third region via the carrier injection line during a hold operation to perform a write logic high operation.
19. The method according to claim 12 , further comprising increasing the third voltage potential applied to the body region via the word line during a hold operation to perform a write logic low operation.
20. The method according to claim 12 , further comprising increasing the second voltage potential applied to the second region via the source line during a hold operation to perform a write logic low operation.
21. The method according to claim 12 , further comprising maintaining the first voltage potential applied to the first region via the bit line during a hold operation to perform a write logic low operation.
22. The method according to claim 12 , further comprising increasing the first voltage potential applied to the first region via the bit line during a write logic low operation to maintain a logic high stored in the memory cell.