Nanomechanical testing system

1. A method for automatically examining an instrument probe coupled with a mechanical testing instrument configured to performing mechanical testing at micron scale or less, the method comprising:

determining if an instrument probe use threshold is achieved, the instrument probe is coupled with a transducer, and the transducer is configured to move the instrument probe, measure an instrument probe indentation depth and measure force applied to the instrument probe through the transducer, and determining if the instrument probe use threshold is achieved includes one or more of:

counting a number of transducer operations, and

determining if the number of transducer operations is greater than a transducer operation count threshold, or

measuring one or more of the instrument probe indentation depth, force applied to the instrument probe through the transducer or a sample mechanical parameter of a sample, and

determining the instrument probe use threshold is met if one or more of the instrument probe indentation depth, force applied to the instrument or the sample mechanical parameter is outside of one or more of a specified indentation depth threshold range, a specified force threshold range or a specified sample mechanical parameter threshold range of the sample; and

conducting a probe check operation once the instrument probe use threshold is achieved, the probe check operation includes:

aligning the instrument probe with a diagnostic sample,

indenting the instrument probe into the diagnostic sample,

measuring one or more of the indentation depth, indentation force or a sample mechanical parameter with the transducer, and

determining the instrument probe requires one of calibration or replacement if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of an indentation threshold range, an indentation force threshold range or a sample mechanical parameter threshold range of the diagnostic sample, respectively.

2. The method of claim 1 , wherein determining if the transducer operation count threshold is achieved includes adjusting the transducer operation count threshold according to one or more of the material tested with the instrument probe and the force applied to the probe through the transducer.

3. The method of claim 1 , wherein determining if the transducer operation count threshold is achieved includes adjusting the transducer operation count threshold according to a specified accuracy range.

4. The method of claim 1 , wherein aligning the instrument probe with the diagnostic sample includes moving the diagnostic sample beneath the instrument probe.

5. The method of claim 4 , wherein moving the diagnostic sample beneath the instrument probe includes one or more of translating and rotating a sample stage surface, wherein the sample stage surface includes a stage receptacle flange housing one or more diagnostic samples.

6. The method of claim 5 , wherein moving the diagnostic sample includes translating the sample stage surface along an X-axis and a Y-Axis.

7. The method of claim 5 , wherein moving the diagnostic sample includes rotating the sample stage surface around a Z-axis.

8. The method of claim 4 , wherein aligning the instrument probe with the diagnostic sample includes a combination of translating and rotating a sample stage surface from a first sample location where the instrument probe is aligned with the first sample location to a second diagnostic location where the instrument probe is aligned with the diagnostic sample.

9. The method of claim 1 comprising conducting a probe calibration if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of the indentation threshold range, the indentation force threshold range or the sample mechanical parameter threshold range, respectively, the probe calibration including:

performing one or more indentations with the instrument probe against the diagnostic sample, each of the one or more indentations are conducted according to a specified array of one of indentation depths or indentation forces, each of the indentation depths and indentations forces are different;

measuring one of the indentation force or the indentation depth of each of the one or more indentations according to the specified array of indentation depths or indentation forces;

associating the respective measured indentation forces or the measured indentation depths with the corresponding indentation depths or indentation forces of the specified array;

calculating a probe area function for the instrument probe according to the relationship between the associated indentation forces or indentation depths with the indentation depths or indentation forces of the specified array; and

calibrating functions for generating one or more of modulus and hardness values for a sample according to the probe area function.

10. The method of claim 9 , comprising conducting the probe check operation after calculation of the probe area function, and determining the instrument probe requires replacement if one or more of the measured indentation depth, the measured indentation force or the sample mechanical parameter are outside of the indentation threshold range, the indentation force threshold range or the sample mechanical parameter threshold range of the diagnostic sample, respectively.