IP Library Granted Patent US 9,117,738
Granted Patent B2
US 9,117,738 · App. 13/966,164 · Granted Aug 25, 2015

Interconnection of semiconductor device with graphene wire

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Quick Facts
Patent No.
US 9,117,738
App. No.
13/966,164
Granted
Aug 25, 2015
Kind
B2
Abstract

According to one embodiment, a semiconductor device using multi-layered graphene wires includes a substrate having semiconductor elements formed therein, a first graphene wire formed above the substrate and including a multi-layered graphene layer having a preset impurity doped therein, a second graphene wire formed on the same layer as the first multi-layered graphene wire above the substrate and including a multi-layered graphene layer into which the preset impurity is not doped, a lower-layer contact connected to the undersurface side of the first multi-layered graphene wire, and an upper-layer contact connected to the upper surface side of the second multi-layered graphene wire.

Claims (10)

1. A semiconductor device comprising:

a substrate having semiconductor elements formed therein,

a first multi-layered graphene wire formed above the substrate, the first multi-layered graphene wire including a multi-layered graphene layer having a preset impurity doped therein,

a second multi-layered graphene wire formed on the same layer as the first multi-layered graphene wire above the substrate, the second multi-layered graphene wire formed wider than the first multi-layered graphene wire and including a multi-layered graphene layer in an edge portion of which the impurity is selectively doped,

a lower-layer contact connected to the undersurface side of the first multi-layered graphene wire, and

an upper-layer contact connected to the upper surface side of the second multi-layered graphene wire; and

wherein each of the first and second multi-layered graphene wires includes a sequentially laminated catalytic underlying layer, catalytic metal layer and the multi-layered graphene layer from the lower-layer side.

2. The device according to claim 1 , wherein the impurity is one of Br, I, F and Cl.

3. The device according to claim 1 , wherein the lower-layer contact is connected to the semiconductor element via a wire on the lower-layer side of the multi-layered graphene wire and the upper-layer contact is connected to a wire on the upper-layer side of the multi-layered graphene wire.

4. The device according to claim 1 , wherein the first multi-layered graphene wire is arranged in a memory cell region and the second multi-layered graphene wire is arranged in a peripheral circuit region.

Assignments (4)
DE-MERGER Recorded Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
MERGER Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
CHANGE OF NAME AND ADDRESS Recorded Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2013
From: WADA, MAKOTO; MIYAZAKI, HISAO; KAJITA, AKIHIRO; ISOBAYASHI, ATSUNOBU; SAITO, TATSURO; SAKAI, TADASHI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 031488/0792 →