Light emitting device and fabrication method thereof
View Patent ↗The present invention relates to a method of fabricating a patterned substrate for fabricating a light emitting diode (LED), the method including forming an aluminum layer on a substrate, forming an anodic aluminum oxide (AAO) layer having a large number of holes formed therein by performing an anodizing treatment of the aluminum layer, partially etching a surface of the substrate using the aluminum layer with the large number of the holes as a shadow mask, thereby forming patterns, and removing the aluminum layer from the substrate.
1. A method of fabricating a vertical light emitting diode (LED), comprising:
forming a low doped first conductive semiconductor layer on a sacrificial substrate;
forming an aluminum layer on a surface of the low doped first conductive semiconductor layer;
forming an anodic aluminum oxide (AAO) layer having a plurality of holes formed therein by performing an anodizing treatment of the aluminum layer;
etching and patterning the low doped first conductive semiconductor layer using the aluminum layer with the plurality of the holes as a shadow mask to expose a portion of the low doped first conductive semiconductor layer, thereby forming a plurality of grooves;
removing the aluminum layer from the low doped first conductive semiconductor layer;
sequentially forming a high doped first conductive semiconductor layer, an active layer and a second conductive semiconductor layer on the low doped first conductive semiconductor layer with the plurality of the grooves;
forming a metal reflective layer and a conductive substrate on the second conductive semiconductor layer;
separating the sacrificial substrate from the low doped first conductive semiconductor layer; and
forming an electrode pad on the other surface of the low doped first conductive semiconductor layer, the electrode pad being filled in a plurality of the grooves to be in ohmic contact with the high doped first conductive semiconductor layer.
2. The method of claim 1 , wherein the doping concentration of dopant in the high doped first conductive semiconductor layer is 5 to 9×10 18 /cm 3 , and the doping concentration of dopant in the low doped first conductive semiconductor layer is below 5×10 18 /cm 3 .