IP Library Granted Patent US 8,735,185
Granted Patent B2
US 8,735,185 · App. 13/967,019 · Granted May 27, 2014

Light emitting device and fabrication method thereof

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Quick Facts
Patent No.
US 8,735,185
App. No.
13/967,019
Granted
May 27, 2014
Kind
B2
Abstract

The present invention relates to a method of fabricating a patterned substrate for fabricating a light emitting diode (LED), the method including forming an aluminum layer on a substrate, forming an anodic aluminum oxide (AAO) layer having a large number of holes formed therein by performing an anodizing treatment of the aluminum layer, partially etching a surface of the substrate using the aluminum layer with the large number of the holes as a shadow mask, thereby forming patterns, and removing the aluminum layer from the substrate.

Claims (11)

1. A method of fabricating a vertical light emitting diode (LED), comprising:

forming a low doped first conductive semiconductor layer on a sacrificial substrate;

forming an aluminum layer on a surface of the low doped first conductive semiconductor layer;

forming an anodic aluminum oxide (AAO) layer having a plurality of holes formed therein by performing an anodizing treatment of the aluminum layer;

etching and patterning the low doped first conductive semiconductor layer using the aluminum layer with the plurality of the holes as a shadow mask to expose a portion of the low doped first conductive semiconductor layer, thereby forming a plurality of grooves;

removing the aluminum layer from the low doped first conductive semiconductor layer;

sequentially forming a high doped first conductive semiconductor layer, an active layer and a second conductive semiconductor layer on the low doped first conductive semiconductor layer with the plurality of the grooves;

forming a metal reflective layer and a conductive substrate on the second conductive semiconductor layer;

separating the sacrificial substrate from the low doped first conductive semiconductor layer; and

forming an electrode pad on the other surface of the low doped first conductive semiconductor layer, the electrode pad being filled in a plurality of the grooves to be in ohmic contact with the high doped first conductive semiconductor layer.

2. The method of claim 1 , wherein the doping concentration of dopant in the high doped first conductive semiconductor layer is 5 to 9×10 18 /cm 3 , and the doping concentration of dopant in the low doped first conductive semiconductor layer is below 5×10 18 /cm 3 .

Assignments (1)
CHANGE OF NAME Recorded Apr 21, 2014
From: SEOUL OPTO DEVICE CO., LTD
To: SEOUL VIOSYS CO., LTD
Reel/Frame 032723/0126 →