Generating root cause candidates for yield analysis
View Patent ↗Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
1. A method comprising:
by using a computer:
identifying points of interest by searching for disruptions and/or discontinuities of features in a layout design, the points of interest representing locations of potential critical features;
determining at least one region of interest for one or more of the points of interest;
extracting one or more properties from the at least one region of interest, the one or more properties representing at least one pattern characteristic of the at least one region of interest;
generating diagnosis reports by testing one or more devices comprising an integrated circuit fabricated according to the layout design, the testing indicating one or more of the devices as being failing devices; and
analyzing the diagnosis reports of the failing devices fabricated according to the layout design based at least on the one or more properties to identify probable root causes.
2. The method recited in claim 1 , wherein the at least one region of interest is determined based on a predetermined size.
3. The method recited in claim 1 , wherein the at least one region of interest is associated with one of the points of interest.
4. The method recited in claim 1 , wherein the one or more properties comprise a pattern identifier obtained with a hash function.
5. The method recited in claim 1 , wherein the analyzing comprises:
generating root cause candidates based on at least the extracted one or more properties; and
identifying probable root causes based on the generated root cause candidates.
6. One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
identifying points of interest in a layout design, points of interest representing locations of potential critical features;
determining at least one region of interest for the points of interest;
extracting one or more properties from the at least one region of interest, the one or more properties representing one or more metrics quantifying a characteristic of the at least one region of interest; and
analyzing diagnosis reports generated by testing failing devices fabricated according to the layout design based at least on the one or more properties to identify probable root causes.
7. The one or more non-transitory computer-readable media recited in claim 6 , wherein the identifying comprises:
searching for disruptions of layout features.
8. The one or more non-transitory computer-readable media recited in claim 6 , wherein the at least one region of interest is determined based on a predetermined size.
9. The one or more non-transitory computer-readable media recited in claim 6 , wherein the at least one region of interest is associated with one of the points of interest.
10. The one or more non-transitory computer-readable media recited in claim 6 , wherein the analyzing comprises:
generating root cause candidates based on at least the extracted one or more properties; and
identifying probable root causes based on the generated root cause candidates.
11. A system, comprising:
one or more processors, the one or more processors programmed to perform a method, the method comprising:
identifying points of interest by searching for disruptions and/or discontinuities of features in a layout design, the points of interest representing locations of potential critical features;
determining at least one region of interest for the one or more points of interest;
extracting one or more properties from the at least one region of interest, the one or more properties representing one or more metrics quantifying a characteristic of the at least one region of interest, the properties including at least one or more of the following: X vertex count, Y vertex count, X perimeter, or Y perimeter; and
analyzing diagnosis reports of failing devices fabricated according to the layout design based at least on the one or more properties to identify probable root causes.
12. The system recited in claim 11 , wherein the identifying comprises:
searching for disruptions of layout features.
13. The system recited in claim 11 , wherein the at least one region of interest is determined based on a predetermined size.
14. The system recited in claim 11 , wherein the at least one region of interest is associated with one of the points of interest.
15. The system recited in claim 11 , wherein the analyzing comprises:
generating root cause candidates based on at least the extracted one or more properties; and
identifying probable root causes based on the generated root cause candidates.