IP Library Assignment 056675/0285
Patent Assignment
Reel/Frame 056675/0285

Merger and Change of Name

Recorded: 2021-06-24 Pages: 7
Assignors
MENTOR GRAPHICS CORPORATION
Executed: 2020-12-30
SIEMENS INDUSTRY SOFTWARE INC.
Executed: 2020-12-30
Assignee
SIEMENS INDUSTRY SOFTWARE INC.
5800 GRANITE PARKWAY, SUITE 600, PLANO, TEXAS, 75024
Covered Properties (84)
Through-Silicon via Impedance Extraction
Patent: 8,448,115 →
Application: 13/526,443 →
Electrical Hotspot Detection, Analysis and Correction
Patent: 8,914,760 →
Application: 13/627,933 →
Publication: US 2014/0089877
Simulation of Circuits with Repetitive Elements
Patent: 8,832,635 →
Application: 13/709,499 →
Publication: US 2013/0191805
Placement and Area Adjustment for Hierarchical Groups in Printed Circuit Board Design
Patent: 8,839,174 →
Application: 13/755,587 →
Publication: US 2013/0198708
Verification Test Set and Test Bench Map Maintenance
Patent: 8,904,325 →
Application: 13/755,686 →
Publication: US 2013/0198709
Execution Time Profiling for Interpreted Programming Languages
Patent: 9,081,588 →
Application: 13/755,737 →
Publication: US 2013/0232477
Optical Proximity Correction for Topographically Non-Uniform Substrates
Patent: 8,799,832 →
Application: 13/763,292 →
Publication: US 2014/0229903
Circuit Instance Variation Probability System and Method
Patent: 8,631,362 →
Application: 13/776,598 →
Virtual Use Of Electronic Design Automation Tools
Application: 13/783,183 →
Publication: US 2013/0311627
Layout Decomposition for Triple Patterning Lithography
Patent: 8,910,095 →
Application: 13/844,310 →
Publication: US 2014/0237436
Debug Environment for a Multi User Hardware Assisted Verification System
Patent: 9,703,579 →
Application: 13/875,267 →
Publication: US 2014/0032204
Test Data Volume Reduction Based On Test Cube Properties
Patent: 8,996,941 →
Application: 13/914,529 →
Publication: US 2013/0332786
Test Generation For Test-Per-Clock
Patent: 9,347,993 →
Application: 13/919,984 →
Publication: US 2014/0372824
Test Bench Transaction Synchronization in a Debugging Environment
Patent: 9,582,625 →
Application: 13/924,156 →
Publication: US 2014/0005999
Generating Root Cause Candidates for Yield Analysis
Patent: 9,443,051 →
Application: 13/973,998 →
Publication: US 2014/0059511
Defect Injection for Transistor-Level Fault Simulation
Patent: 9,372,946 →
Application: 13/974,006 →
Publication: US 2014/0059507
Faulty Chains Identification Without Masking Chain Patterns
Patent: 9,057,762 →
Application: 14/011,995 →
Formal Verification of Booth Multipliers
Patent: 9,384,167 →
Application: 14/019,365 →
Publication: US 2014/0067897
Test Access Architecture for Multi-Die Circuits
Patent: 9,389,944 →
Application: 14/022,214 →
Test Access Architecture For Stacked Memory And Logic Dies
Patent: 9,689,918 →
Application: 14/030,011 →
Determining Worst-Case Bit Patterns Based Upon Data-Dependent Jitter
Patent: 9,435,840 →
Application: 14/149,806 →
Publication: US 2014/0195866
Modifying Code to Reduce Redundant or Unnecessary Power Usage
Application: 14/154,029 →
Scan-Based Test Architecture for Interconnects in Stacked Designs
Patent: 9,720,041 →
Application: 14/170,804 →
Publication: US 2014/0223247
Test Architecture for Characterizing Interconnects in Stacked Designs
Patent: 9,335,376 →
Application: 14/183,305 →
Publication: US 2014/0237310
Cloud Services Platform
Patent: 9,887,884 →
Application: 14/216,954 →
Publication: US 2014/0325048
Single Event Upset Mitigation for Electronic Design Synthesis
Patent: 9,275,179 →
Application: 14/220,696 →
Publication: US 2014/0289686
Logic Built-In Self-Test with High Test Coverage and Low Switching Activity
Patent: 9,568,552 →
Application: 14/298,663 →
Publication: US 2014/0365840
Generating A Convergent Circuit Design From A Functional Description Using Entities Having Access To The Functional Description And To Physical Design Information
Patent: 8,990,758 →
Application: 14/463,502 →
Publication: US 2014/0359549
Modeling Substrate Noise Coupling For Circuit Simulation
Patent: 9,330,226 →
Application: 14/507,831 →
Canonical Forms of Layout Patterns
Patent: 9,378,327 →
Application: 14/537,504 →
Publication: US 2015/0135151
Compiler for Closed-Loop 1XN Vlsi Design
Patent: 9,558,308 →
Application: 14/537,685 →
Publication: US 2015/0169792
Tag Based System For Leveraging Design Data
Application: 14/549,224 →
Publication: US 2015/0149459
Channel Sharing For Testing Circuits Having Non-Identical Cores
Patent: 9,915,702 →
Application: 14/554,898 →
Publication: US 2015/0149847
Dynamic Shift For Test Pattern Compression
Patent: 9,335,374 →
Application: 14/557,739 →
Publication: US 2015/0153410
System Design Management
Patent: 9,734,273 →
Application: 14/567,495 →
Publication: US 2015/0347656
Scan Cell Selection For Partial Scan Designs
Application: 14/633,999 →
Publication: US 2015/0248515
Isometric Test Compression With Low Toggling Activity
Patent: 9,651,622 →
Application: 14/642,501 →
Publication: US 2015/0253385
Connectivity-Aware Layout Data Reduction For Design Verification
Patent: 9,785,736 →
Application: 14/663,275 →
Publication: US 2016/0063172
Generating Guiding Patterns For Directed Self-Assembly
Patent: 9,330,228 →
Application: 14/693,304 →
Publication: US 2015/0227676
Low Power Testing Based On Dynamic Grouping Of Scan
Application: 14/710,390 →
Publication: US 2015/0323597
Non-Intrusive Software Verification
Patent: 9,898,388 →
Application: 14/721,191 →
Publication: US 2015/0339214
Prelinked Embedding
Application: 14/730,009 →
Publication: US 2015/0347162
Directed Self-Assembly-Aware Layout Decomposition for Multiple Patterning
Patent: 9,652,581 →
Application: 14/745,231 →
Publication: US 2016/0292345
Statistical Channel Analysis with Correlated Input Patterns
Application: 14/793,579 →
Publication: US 2016/0004804
Additive Design of Heat Sinks
Patent: 9,928,317 →
Application: 14/824,370 →
Publication: US 2016/0224699
Secure Protocol for Chip Authentication
Application: 14/851,429 →
Publication: US 2017/0063821
Test Point Insertion For Low Test Pattern Counts
Application: 14/884,611 →
Publication: US 2016/0109517
Chip-Scale Electrothermal Analysis
Patent: 9,740,804 →
Application: 14/931,637 →
Publication: US 2016/0125106
Low Power Corruption Of Memory In Emulation
Patent: 9,990,452 →
Application: 14/941,481 →
Publication: US 2017/0140084
Execution of Complex Recursive Algorithms
Application: 14/950,947 →
Publication: US 2016/0147516
Class Object Handle Tracking
Application: 15/006,289 →
Publication: US 2016/0232084
Recognizing and Utilizing Circuit Topology in an Electronic Circuit Design
Patent: 9,817,932 →
Application: 15/007,440 →
Publication: US 2017/0161408
Coverage Data Interchange
Application: 15/011,276 →
Publication: US 2016/0357834
Deterministic Built-In Self-Test Based On Compressed Test Patterns Stored On Chip And Their Derivatives
Patent: 9,933,485 →
Application: 15/051,063 →
Publication: US 2016/0245863
Guiding Patterns Optimization For Directed Self-Assembly
Application: 15/084,993 →
Publication: US 2016/0292309
Leakage Reduction Using Stress-Enhancing Filler Cells
Patent: 9,836,569 →
Application: 15/085,044 →
Publication: US 2016/0292341
Full-Chip Assessment Of Time-Dependent Dielectric Breakdown
Application: 15/201,294 →
Publication: US 2017/0286588
Hybrid Compilation For FPGA Prototyping
Patent: 9,959,379 →
Application: 15/207,383 →
Publication: US 2017/0103156
Pattern Optical Similarity Determination
Patent: 9,798,226 →
Application: 15/245,869 →
Publication: US 2016/0363854
Low-Level Sensor Fusion
Application: 15/287,537 →
Publication: US 2018/0067489
Test Point-Enhanced Hardware Security
Application: 15/353,412 →
Publication: US 2017/0141930
Assertion Statement Check and Debug
Application: 15/362,510 →
Publication: US 2017/0161403
Transition Test Generation for Detecting Cell Internal Defects
Application: 15/400,904 →
Publication: US 2017/0193155
Circuit Defect Diagnosis Based On Sink Cell Fault Models
Application: 15/454,909 →
Automatic Axial Thrust Analysis Of Turbomachinery Designs
Application: 15/454,963 →
Publication: US 2017/0286592
Communication Circuitry in an Electronic Control Unit
Application: 15/458,727 →
Publication: US 2017/0264718
Correcting EUV Crosstalk Effects For Lithography Simulation
Application: 15/472,364 →
Publication: US 2017/0285490
Wide-Range Clock Signal Generation For Speed Grading Of Logic Cores
Application: 15/592,763 →
Publication: US 2017/0328952
Virtual Ethernet Mutable Port Group Transactor
Application: 15/594,382 →
Publication: US 2017/0351795
Target Capture and Replay in Emulation
Application: 15/669,283 →
Publication: US 2017/0337309
Content Addressable Memory Modeling in Emulation and Prototyping
Application: 15/724,262 →
Dynamic Model Generation For Lithographic Simulation
Application: 15/724,264 →
Removal of Artificial Resonances Using Boundary Element Method
Application: 15/789,719 →
Publication: US 2018/0113971
Flow Control In Networking System-On-Chip Verification
Application: 15/792,078 →
Publication: US 2018/0113976
Determination Of Structure Function Feature Correlation To Thermal Model Element Layers
Application: 15/792,158 →
Publication: US 2018/0314782
Worst Case Eye for Multi-Level Pulse Amplitude Modulated Links
Application: 15/796,596 →
Publication: US 2018/0123840
Context-Aware Pattern Matching For Layout Processing
Application: 15/873,833 →
Publication: US 2018/0307791
Generic Protocol Analyzer for Circuit Design Verification
Application: 15/873,879 →
Publication: US 2018/0300440
Test Application Time Reduction Using Capture-Per-Cycle Test Points
Application: 15/884,369 →
Publication: US 2018/0252768
Cell-Aware Diagnostic Pattern Generation for Logic Diagnosis
Application: 15/884,372 →
Publication: US 2018/0253346
Efficient And Flexible Network For Streaming Data In Circuits
Application: 15/925,642 →
Concurrent Testbench and Software Driven Verification
Application: 15/943,423 →
Publication: US 2018/0285484
Inter-Cell Bridge Defect Diagnosis
Application: 15/972,812 →
Reconfigurable Scan Network Defect Diagnosis
Application: 15/985,679 →
Publication: US 2018/0335475
Related Assignments (20)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 26, 2012
From: KOURKOULOS, VASILEIOS; SUAYA, ROBERTO
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 028447/0336 →
Assignment of Assignor's Interest Nov 5, 2012
From: SALEM, RAMI FATHY; EISSA, HAITHAM MOHAMED; ARAFA, AHMED; MOUSA, SHERIF HANY
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 029241/0862 →
Assignment of Assignor's Interest Dec 10, 2012
From: LIN, POLE SHANG; WEN, KUEI SHAN; PERNG, RUEY KUEN
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 029438/0835 →
Assignment of Assignor's Interest Feb 18, 2013
From: GRANIK, YURI; HOLLERBACH, UWE; ADAM, KONSTANTINOS
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 029823/0032 →
Assignment of Assignor's Interest Mar 1, 2013
From: MEHROTRA, AMIT; SOMANI, ABHISHEK; JOHNSON, KURT; ESTRADA, PAUL
To: BERKELEY DESIGN AUTOMATION, INC.
Reel/Frame 029909/0712 →
Assignment of Assignor's Interest Mar 18, 2013
From: LI, QIAO; GHOSH, PRADIPTYA
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030034/0395 →
Assignment of Assignor's Interest Apr 26, 2013
From: GRIFFIN, BRIAN
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030295/0288 →
Assignment of Assignor's Interest May 17, 2013
From: BALLANCE, MATTHEW
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030436/0523 →
Assignment of Assignor's Interest May 17, 2013
From: SUITER, GERALD P.
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030436/0497 →
Assignment of Assignor's Interest Jun 20, 2013
From: RAJSKI, JANUSZ; LIN, XIJIANG
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030655/0731 →
Assignment of Assignor's Interest Jun 21, 2013
From: RAJSKI, JANUSZ; SOLECKI, JEDRZEJ; TYSZER, JERZY; MRUGALSKI, GRZEGORZ
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 030661/0335 →
Assignment of Assignor's Interest Aug 29, 2013
From: SUNTER, STEPHEN KENNETH
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 031112/0267 →
Assignment of Assignor's Interest Aug 29, 2013
From: HUANG, YU; CHENG, WU-TUNG; GUO, RUIFENG; SHARMA, MANISH
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 031112/0331 →
Assignment of Assignor's Interest Sep 6, 2013
From: CASE, MICHAEL L.
To: CALYPTO DESIGN SYSTEMS, INC.
Reel/Frame 031153/0091 →
Assignment of Assignor's Interest Sep 16, 2013
From: AGARWALA, BADRUDDIN; PARIKH, TARAK; BHAT, VIVEK; JOSHI, NEERAJ
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 031215/0741 →
Assignment of Assignor's Interest Sep 20, 2013
From: BENWARE, ROBERT; CHENG, WU-TUNG; SCHUERMYER, CHRISTOPHER; CHANG, CHEN-YI
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 031249/0680 →
Assignment of Assignor's Interest Nov 15, 2013
From: SURESH, KRISHNAMURTHY; SELVIDGE, CHARLES W.; GUPTA, SANJAY; JAIN, AMIT
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 031615/0911 →
Nunc Pro Tunc Assignment Aug 31, 2015
From: BERKELEY DESIGN AUTOMATION, INC.
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 036456/0918 →
Assignment of Assignor's Interest Jul 6, 2017
From: FULLER, RONALD W.
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 042926/0811 →
Assignment of Assignor's Interest Dec 13, 2018
From: CALYPTO DESIGN SYSTEMS, INC.
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 047766/0077 →