Faulty chains identification without masking chain patterns

1. A method, executed by at least one processor of a computer, comprising:

identifying no-failing-bits output channels of a compactor based on output data of a test, the no-failing-bits output channels outputting no failing bits during the test;

identifying good scan chains based on scan chains associated with the no-failing-bits output channels; and

analyzing bits outputted from failing-bits output channels per clock cycle to identify one or more suspected faulty scan chains from scan chains other than the good scan chains, each of the failing-bits output channels outputting at least one failing bit during the test, each of the one or more suspected faulty scan chains solely explaining failing bits outputted from all output channels in the failing-bits output channels that are associated with the each of the one or more suspected faulty scan chains for at least one clock cycle.

2. The method recited in claim 1 , wherein the compactor is an X-compactor or its variant.

3. The method recited in claim 1 , wherein the compactor is an I-compactor or its variant.

4. The method recited in claim 1 , wherein the analyzing comprises:

analyzing structure or compaction function of the compactor.

5. The method recited in claim 1 , wherein the analyzing comprises:

partitioning scan chains other than the good scan chains and the failing-bits output channels into groups, output channels in each of the groups being associated only with scan chains in the each of the groups and scan chains in each of the groups being associated only with output channels in the each of the groups; and

performing per-clock-cycle analysis on each of the groups.

6. The method recited in claim 1 , being applied when hamming distance is greater than two.

7. One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:

identifying no-failing-bits output channels of a compactor based on output data of a test, the no-failing-bits output channels outputting no failing bits during the test;

identifying good scan chains based on scan chains associated with the no-failing-bits output channels; and

analyzing bits outputted from failing-bits output channels per clock cycle to identify one or more suspected faulty scan chains from scan chains other than the good scan chains, each of the failing-bits output channels outputting at least one failing bit during the test, each of the one or more suspected faulty scan chains solely explaining failing bits outputted from all output channels in the failing-bits output channels that are associated with the each of the one or more suspected faulty scan chains for at least one clock cycle.

8. The one or more non-transitory computer-readable media recited in claim 7 , wherein the compactor is an X-compactor or its variant.

9. The one or more non-transitory computer-readable media recited in claim 7 , wherein the compactor is an I-compactor or its variant.

10. The one or more non-transitory computer-readable media recited in claim 7 , wherein the analyzing comprises:

analyzing structure or compaction function of the compactor.

11. The one or more non-transitory computer-readable media recited in claim 7 , wherein the analyzing comprises:

partitioning scan chains other than the good scan chains and the failing-bits output channels into groups, output channels in each of the groups being associated only with scan chains in the each of the groups and scan chains in each of the groups being associated only with output channels in the each of the groups; and

performing per-clock-cycle analysis on each of the groups.

12. The one or more non-transitory computer-readable media recited in claim 7 , wherein the method is applied when hamming distance is greater than two.

13. A system comprising:

one or more processors, the one or more processors programmed to perform a method, the method comprising:

identifying no-failing-bits output channels of a compactor based on output data of a test, the no-failing-bits output channels outputting no failing bits during the test;

identifying good scan chains based on scan chains associated with the no-failing-bits output channels; and

analyzing bits outputted from failing-bits output channels per clock cycle to identify one or more suspected faulty scan chains from scan chains other than the good scan chains, each of the failing-bits output channels outputting at least one failing bit during the test, each of the one or more suspected faulty scan chains solely explaining failing bits outputted from all output channels in the failing-bits output channels that are associated with the each of the one or more suspected faulty scan chains for at least one clock cycle.

14. The system recited in claim 13 , wherein the compactor is an X-compactor or its variant.

15. The system recited in claim 13 , wherein the compactor is an I-compactor or its variant.

16. The system recited in claim 13 , wherein the analyzing comprises:

analyzing structure or compaction function of the compactor.

17. The system recited in claim 13 , wherein the analyzing comprises:

partitioning scan chains other than the good scan chains and the failing-bits output channels into groups, output channels in each of the groups being associated only with scan chains in the each of the groups and scan chains in each of the groups being associated only with output channels in the each of the groups; and

performing per-clock-cycle analysis on each of the groups.

18. The system recited in claim 13 , wherein the method is applied when hamming distance is greater than two.