IP Library Granted Patent US 9,330,228
Granted Patent B2
US 9,330,228 · App. 14/693,304 · Granted May 3, 2016

Generating guiding patterns for directed self-assembly

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,330,228
App. No.
14/693,304
Granted
May 3, 2016
Kind
B2
Abstract

Aspects of the disclosed technology relate to techniques of generating guiding patterns for via-type feature groups. A guiding pattern is constructed based on seeding positions for a via-type feature group. The initial seeding positions are derived from targeted locations of via-type features in the via-type feature group. A potential energy function is then determined for the guiding pattern. Based on the potential energy function, simulated locations of the via-type features are computed. The seeding positions are compared with the targeted locations and may be adjusted based on differences between the simulated locations and the targeted locations. The above operations may be repeated until one of one or more termination conditions are met.

Claims (36)

1. One or more processor-readable storage devices storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:

A: constructing a guiding pattern for a via-type feature group based on seeding positions, wherein the via-type feature group comprises two or more via-type features in a layout design and the seeding positions are initially derived from targeted locations of the two or more via-type features;

B: determining a potential energy function for the guiding pattern, wherein the potential energy function is at least a two-dimensional function and comprises a first portion representing interactions between via-type features in the via-type feature group and a second portion representing wall effects of the guiding pattern;

C: computing simulated locations of the two or more via-type features based on the potential energy function;

D: changing the seeding positions based on differences between the simulated locations and the targeted locations; and

F: repeating operations A through D until one of one or more termination conditions is met.

2. The one or more processor-readable storage devices recited in claim 1 , wherein initial positions of the seeding positions are centers of the corresponding target locations.

3. The one or more processor-readable storage devices recited in claim 1 , wherein the one or more termination conditions comprise whether the simulated locations match the targeted locations.

4. The one or more processor-readable storage devices recited in claim 1 , wherein the one or more termination conditions comprise number of iterations of operations A through D reaches a predetermined number.

5. The one or more processor-readable storage devices recited in claim 1 , wherein the via-type feature group is DSA (Directed-Self-Assembly)-compliant.

6. The one or more processor-readable storage devices recited in claim 1 , wherein the constructing is further based on area ratio information of a di-block copolymer.

7. The one or more processor-readable storage devices recited in claim 1 , wherein the constructing comprises generating polygons centered at the seeding positions.

8. A method, executed by at least one processor of a computer, comprising:

A: constructing a guiding pattern for a via-type feature group based on seeding positions, wherein the via-type feature group comprises two or more via-type features in a layout design and the seeding positions are initially derived from targeted locations of the two or more via-type features;

B: determining a potential energy function for the guiding pattern, wherein the potential energy function is at least a two-dimensional function and comprises a first portion representing interactions between via-type features in the via-type feature group and a second portion representing wall effects of the guiding pattern;

C: computing simulated locations of the two or more via-type features based on the potential energy function;

D: changing the seeding positions based on differences between the simulated locations and the targeted locations; and

F: repeating operations A through D until one of one or more termination conditions is met.

9. The method recited in claim 8 , wherein initial positions of the seeding positions are centers of the corresponding target locations.

10. The method recited in claim 8 , wherein the one or more termination conditions comprise whether the simulated locations match the targeted locations.

11. The method recited in claim 8 , wherein the one or more termination conditions comprise number of iterations of operations A through D reaches a predetermined number.

12. The method recited in claim 8 , wherein the via-type feature group is DSA (Directed-Self-Assembly) compliant.

13. The method recited in claim 8 , wherein the constructing is further based on area ratio information of a di-block copolymer.

14. The method recited in claim 8 , wherein the constructing comprises generating polygons centered at the seeding positions.

15. A system comprising:

one or more processors, the one or more processors programmed to perform a method, the method comprising:

A: constructing a guiding pattern for a via-type feature group based on seeding positions, wherein the via-type feature group comprises two or more via-type features in a layout design and the seeding positions are initially derived from targeted locations of the two or more via-type features;

B: determining a potential energy function for the guiding pattern, wherein the potential energy function is at least a two-dimensional function and comprises a first portion representing interactions between via-type features in the via-type feature group and a second portion representing wall effects of the guiding pattern;

C: computing simulated locations of the two or more via-type features based on the potential energy function;

D: changing the seeding positions based on differences between the simulated locations and the targeted locations; and

F: repeating operations A through D until one of one or more termination conditions is met.

16. The system recited in claim 15 , wherein initial positions of the seeding positions are centers of the corresponding target locations.

17. The system recited in claim 15 , wherein the one or more termination conditions comprise whether the simulated locations match the targeted locations, wherein the one or more termination conditions comprise number of iterations of operations A through D reaches a predetermined number, or both.

18. The system recited in claim 15 , wherein the via-type feature group is DSA (Directed-Self-Assembly) compliant.

19. The system recited in claim 15 , wherein the constructing is further based on area ratio information of a di-block copolymer.

20. The system recited in claim 15 , wherein the constructing comprises generating polygons centered at the seeding positions.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Jun 24, 2021
From: MENTOR GRAPHICS CORPORATION; SIEMENS INDUSTRY SOFTWARE INC.
To: SIEMENS INDUSTRY SOFTWARE INC.
Reel/Frame 056675/0285 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 22, 2015
From: ROBLES, JUAN ANDRES TORRES; MITRA, JOYDEEP; MA, YUANSHENG; KRASNOVA, POLINA; GRANIK, YURI
To: MENTOR GRAPHICS CORPORATION
Reel/Frame 035472/0834 →