Dynamic model generation for lithographic simulation
Disclosed are techniques for processing layout designs based on dynamically-generated lithographic models. Lithographic models are determined for a plurality of regions of a reticle prior to lithographic simulation. During lithographic simulation, lithographic models for a small area within a particular region are generated based on the lithographic models for the particular region, the lithographic models for one or more neighboring regions, and location information of the small area relative to the region and to the one or more neighboring regions. The lithography models comprise illuminating and imaging system models and mask electro-magnetic field models.
1. A method, executed by at least one processor of a computer, comprising:
receiving layout data for one or more layout designs;
processing the one or more layout designs based on printed features predicted by lithographic simulation, wherein the lithography simulation comprises:
selecting a section of layout features in the one or more layout designs,
generating models for an area where the layout features are located, the models comprising an illuminating and imaging system model and a mask electro-magnetic field model, the models being generated based on predetermined models for a region that includes the area, predetermined models for one or more neighboring regions, and location information of the area relative to the region and to the one or more neighboring regions,
performing lithographic simulation based on the models to determine printed features for the layout features, and
repeating the selecting operation, the generating operation and the performing operation; and
storing results of the processed one or more layout designs in a tangible medium.
2. The method recited in claim 1 , wherein the processing the one or more layout designs comprises performing an optical proximity correction (OPC) process on the one or more layout designs.
3. The method recited in claim 1 , wherein the mask electro-magnetic field model is derived based on a domain decomposition method (DDM).
4. The method recited in claim 1 , wherein the generating models comprises:
generating the mask electro-magnetic field model based on interpolation of predetermined electro-magnetic field models in the predetermined models for the region and predetermined electro-magnetic field models in the predetermined models for the one or more neighboring regions.
5. The method recited in claim 4 , wherein the interpolation is a linear interpolation or a cubic interpolation.
6. The method recited in claim 1 , wherein the illuminating and imaging system model is derived based on a sum-of-coherent-systems (SOCS) method.
7. The method recited in claim 6 , wherein the generating models comprises:
generating the illuminating and imaging system model based on a combination of predetermined illuminating and imaging system models in the predetermined models for the region and predetermined illuminating and imaging system models in the predetermined models for the one or more neighboring regions, the combination comprising changing weight values for kernels.
8. One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
receiving layout data for one or more layout designs;
processing the one or more layout designs based on printed features predicted by lithographic simulation, wherein the lithography simulation comprises:
selecting a section of layout features in the one or more layout designs,
generating models for an area where the layout features are located, the models comprising an illuminating and imaging system model and a mask electro-magnetic field model, the models being generated based on predetermined models for a region that includes the area, predetermined models for one or more neighboring regions, and location information of the area relative to the region and to the one or more neighboring regions,
performing lithographic simulation based on the models to determine printed features for the layout features, and
repeating the selecting operation, the generating operation and the performing operation; and
storing results of the processed one or more layout designs in a tangible medium.
9. The one or more non-transitory computer-readable media recited in claim 8 , wherein the processing the one or more layout designs comprises performing an optical proximity correction (OPC) process on the one or more layout designs.
10. The one or more non-transitory computer-readable media recited in claim 8 , wherein the mask electro-magnetic field model is derived based on a domain decomposition method (DDM).
11. The one or more non-transitory computer-readable media recited in claim 8 , wherein the generating models comprises:
generating the mask electro-magnetic field model based on interpolation of predetermined electro-magnetic field models in the predetermined models for the region and predetermined electro-magnetic field models in the predetermined models for the one or more neighboring regions.
12. The one or more non-transitory computer-readable media recited in claim 11 , wherein the interpolation is a linear interpolation or a cubic interpolation.
13. The one or more non-transitory computer-readable media recited in claim 8 , wherein the illuminating and imaging system model is derived based on a sum-of-coherent-systems (SOCS) method.
14. The one or more non-transitory computer-readable media recited in claim 13 , wherein the generating models comprises:
generating the illuminating and imaging system model based on a combination of predetermined illuminating and imaging system models in the predetermined models for the region and predetermined illuminating and imaging system models in the predetermined models for the one or more neighboring regions, the combination comprising changing weight values for kernels.
15. A system, comprising:
one or more processors, the one or more processors programmed to perform a method, the method comprising:
receiving layout data for one or more layout designs;
processing the one or more layout designs based on printed features predicted by lithographic simulation, wherein the lithography simulation comprises:
selecting a section of layout features in the one or more layout designs,
generating models for an area where the layout features are located, the models comprising an illuminating and imaging system model and a mask electro-magnetic field model, the models being generated based on predetermined models for a region that includes the area, predetermined models for one or more neighboring regions, and location information of the area relative to the region and to the one or more neighboring regions,
performing lithographic simulation based on the models to determine printed features for the layout features, and
repeating the selecting operation, the generating operation and the performing operation; and
storing results of the processed one or more layout designs in a tangible medium.
16. The system recited in claim 15 , wherein the processing the one or more layout designs comprises performing an optical proximity correction (OPC) process on the one or more layout designs.
17. The system recited in claim 15 , wherein the mask electro-magnetic field model is derived based on a domain decomposition method (DDM).
18. The system recited in claim 15 , wherein the generating models comprises:
generating the mask electro-magnetic field model based on interpolation of predetermined electro-magnetic field models in the predetermined models for the region and predetermined electro-magnetic field models in the predetermined models for the one or more neighboring regions.
19. The system recited in claim 18 , wherein the interpolation is a linear interpolation or a cubic interpolation.
20. The system recited in claim 15 , wherein the illuminating and imaging system model is derived based on a sum-of-coherent-systems (SOCS) method.
21. The system recited in claim 20 , wherein the generating models comprises:
generating the illuminating and imaging system model based on a combination of predetermined illuminating and imaging system models in the predetermined models for the region and predetermined illuminating and imaging system models in the predetermined models for the one or more neighboring regions, the combination comprising changing weight values for kernels.