IP Library Granted Patent US 9,029,204
Granted Patent B2
US 9,029,204 · App. 14/000,780 · Granted May 12, 2015

Method for manufacturing semiconductor device and method for manufacturing microphone

Inventors: Yasuhiro Horimoto (Kusatsu, JP); Yusuke Nakagawa (Kyoto, JP); Tadashi Inoue (Yasu, JP); Toshiyuki Takahashi (Otsu, JP)
Assignee: OMRON Corporation
B81C1/00261H01L21/58H01L21/304H04R19/005H04R31/00H01L21/50H04R2201/003
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Quick Facts
Patent No.
US 9,029,204
App. No.
14/000,780
Granted
May 12, 2015
Kind
B2
Abstract

A method for manufacturing a semiconductor device is provided, the method comprising: fabricating a semiconductor element on a semiconductor substrate; joining a surface of the semiconductor substrate to a support member, the surface being on a side where the semiconductor element is fabricated; and polishing a surface on an opposite side of the surface of the semiconductor substrate where the semiconductor element is fabricated and reducing a thickness of the semiconductor substrate, in a state where the semiconductor substrate and the support member are joined.

Claims (24)

1. A method for manufacturing a semiconductor device, the method comprising:

fabricating a semiconductor element on a semiconductor substrate;

joining a surface of the semiconductor substrate to a support member, the surface being on a side where the semiconductor element is fabricated; and

polishing a surface on an opposite side of the surface of the semiconductor substrate where the semiconductor element is fabricated and reducing a thickness of the semiconductor substrate, in a state where the semiconductor substrate and the support member are joined,

wherein the support member is mounted on a circuit board, and

a conductor for electrically connecting the semiconductor element and the circuit board vertically penetrates the support member.

2. The method for manufacturing a semiconductor device according to claim 1 , wherein

the semiconductor substrate is a wafer on which a plurality of the semiconductor elements are fabricated, and a plurality of the support members are formed by another wafer.

3. A method for manufacturing a microphone, the method comprising:

fabricating an acoustic sensor on a semiconductor substrate;

fabricating a support member by forming a cavity in a plate;

joining a surface of the semiconductor substrate to the support member, the surface being on a side where the acoustic sensor is fabricated;

polishing a surface on an opposite side of the surface of the semiconductor substrate where the acoustic sensor is fabricated and reducing a thickness of the semiconductor substrate, in a state where the semiconductor substrate and the support member are joined; and

mounting the acoustic sensor formed on the semiconductor substrate after a polishing process, the support member, and a signal processing circuit inside a package.

4. The method for manufacturing a microphone according to claim 3 , wherein

the cavity is a space for accommodating the signal processing circuit.

5. The method for manufacturing a microphone according to claim 3 , wherein

the cavity is a space that communicates with a back chamber of the acoustic sensor.

6. The method for manufacturing a microphone according to claim 3 , wherein

a conductor for electrically connecting the acoustic sensor and an electrode pad provided to the package vertically penetrates the support member.

7. The method for manufacturing a microphone according to claim 3 , wherein

the plate is another semiconductor substrate.

8. The method for manufacturing a microphone according to claim 3 , wherein

the semiconductor substrate is a wafer on which a plurality of the acoustic sensors are fabricated, and the plate is a wafer on which a plurality of the support members are fabricated.

Assignments (3)
DE-MERGER Recorded May 20, 2022
From: OMRON CORPORATION
To: SHIGA SEMICONDUCTOR CO., LTD.
Reel/Frame 060132/0451 →
CHANGE OF NAME AND ADDRESS Recorded May 20, 2022
From: SHIGA SEMICONDUCTOR CO., LTD.
To: MMI SEMICONDUCTOR CO., LTD.
Reel/Frame 060132/0466 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 30, 2013
From: HORIMOTO, YASUHIRO; NAKAGAWA, YUSUKE; INOUE, TADASHI; TAKAHASHI, TOSHIYUKI
To: OMRON CORPORATION
Reel/Frame 031506/0774 →
Priority Claims (1)
JP 2011-035915 · Feb 22, 2011 · national
Continuity (1)
Related Publication 20140045290A1 · Feb 13, 2014